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name:-0.0042879581451416
name:-0.00494384765625
name:-0.00055408477783203
Hanai; Hisayoshi Patent Filings

Hanai; Hisayoshi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hanai; Hisayoshi.The latest application filed is for "apparatus for testing semiconductor integrated circuit".

Company Profile
0.4.3
  • Hanai; Hisayoshi - Tokyo JP
  • Hanai; Hisayoshi - Hyogo JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Apparatus for testing semiconductor integrated circuit
Grant 7,058,865 - Mori , et al. June 6, 2
2006-06-06
Jitter measurement circuit for measuring jitter of measurement target signal on the basis of sampling data string obtained by using ideal cyclic signal
Grant 6,934,648 - Hanai , et al. August 23, 2
2005-08-23
Apparatus for testing semiconductor integrated circuit
App 20040177302 - Mori, Hisaya ;   et al.
2004-09-09
Jitter measurement circuit for measuring jitter of measurement target signal on the basis of sampling data string obtained by using ideal cyclic signal
App 20040044488 - Hanai, Hisayoshi ;   et al.
2004-03-04
Tester for semiconductor integrated circuits
Grant 6,661,248 - Mori , et al. December 9, 2
2003-12-09
Tester for semiconductor integrated circuits
App 20030048112 - Mori, Hisaya ;   et al.
2003-03-13
Test system and testing method using memory tester
Grant 6,492,923 - Inoue , et al. December 10, 2
2002-12-10

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