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Patent applications and USPTO patent grants for Hanai; Hisayoshi.The latest application filed is for "apparatus for testing semiconductor integrated circuit".
Patent | Date |
---|---|
Apparatus for testing semiconductor integrated circuit Grant 7,058,865 - Mori , et al. June 6, 2 | 2006-06-06 |
Jitter measurement circuit for measuring jitter of measurement target signal on the basis of sampling data string obtained by using ideal cyclic signal Grant 6,934,648 - Hanai , et al. August 23, 2 | 2005-08-23 |
Apparatus for testing semiconductor integrated circuit App 20040177302 - Mori, Hisaya ;   et al. | 2004-09-09 |
Jitter measurement circuit for measuring jitter of measurement target signal on the basis of sampling data string obtained by using ideal cyclic signal App 20040044488 - Hanai, Hisayoshi ;   et al. | 2004-03-04 |
Tester for semiconductor integrated circuits Grant 6,661,248 - Mori , et al. December 9, 2 | 2003-12-09 |
Tester for semiconductor integrated circuits App 20030048112 - Mori, Hisaya ;   et al. | 2003-03-13 |
Test system and testing method using memory tester Grant 6,492,923 - Inoue , et al. December 10, 2 | 2002-12-10 |
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