Han; You Keun

Patent Applications and Registrations

Patent applications and USPTO patent grants for Han; You Keun.The latest application filed is for "memory module and memory system comprising same".

Company Profile

0.22.21

Han; You Keun - Johns creek GA
Han; You-Keun - Yongin-si N/A KR
Han; You-Keun - Gyeonggi-do KR
Han; You-Keun - Yongsin-si KR
Han; You-Keun - Yonin-si KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Memory device and memory system including the same Grant 9,164,139 - Shin , et al. October 20, 2	2015-10-20
Address transforming circuit and semiconductor memory device including the same Grant 9,128,817 - Kim , et al. September 8, 2	2015-09-08
Memory module and memory system comprising same Grant 9,099,166 - Shin , et al. August 4, 2	2015-08-04
Memory Module And Memory System Comprising Same App 20140219044 - SHIN; JUN HEE ; et al.	2014-08-07
Semiconductor devices including design for test capabilities and semiconductor modules and test systems including such devices Grant 8,742,780 - Kim , et al. June 3, 2	2014-06-03
Memory Device And Memory System Including The Same App 20140043920 - SHIN; Jun Hee ; et al.	2014-02-13
Memory module including memory buffer and memory system having the same Grant 8,576,637 - Jang , et al. November 5, 2	2013-11-05
Server System And Method Of Performing Memory Hierarchy Control In Server System App 20130279916 - CHO; Jeong-hyeon ; et al.	2013-10-24
Memory module and memory system comprising memory module Grant 8,547,761 - Kim , et al. October 1, 2	2013-10-01
Memory module cutting off DM pad leakage current Grant 8,462,534 - Kim , et al. June 11, 2	2013-06-11
Address Transforming Circuit And Semiconductor Memory Device Including The Same App 20120239903 - Kim; Seok-Il ; et al.	2012-09-20
Memory Module Cutting Off Dm Pad Leakage Current App 20120182777 - KIM; Seok-Il ; et al.	2012-07-19
Memory module cutting off DM pad leakage current Grant 8,159,853 - Kim , et al. April 17, 2	2012-04-17
Method of testing a memory module and hub of the memory module Grant 8,051,343 - Shin , et al. November 1, 2	2011-11-01
Memory Module Including Memory Buffer And Memory System Having The Same App 20110176371 - Jang; Soon-Deok ; et al.	2011-07-21
Memory Module And Memory System Comprising Memory Module App 20110161576 - KIM; Seok-Il ; et al.	2011-06-30
Memory modules and memory systems having the same Grant 7,965,530 - Han , et al. June 21, 2	2011-06-21
Semiconductor Devices Including Design for Test Capabilities and Semiconductor Modules and Test Systems Including Such Devices App 20110115509 - Kim; Seok-Il ; et al.	2011-05-19
Method of testing a memory module and hub of the memory module App 20110113296 - Shin; Seung-Man ; et al.	2011-05-12
Method of testing a memory module and hub of the memory module Grant 7,849,373 - Shin , et al. December 7, 2	2010-12-07
Memory module packaging test system Grant 7,814,379 - Lee , et al. October 12, 2	2010-10-12
Memory Module Cutting Off Dm Pad Leakage Current App 20100202180 - KIM; Seok-Il ; et al.	2010-08-12
Memory module, memory unit, and hub with non-periodic clock and methods of using the same Grant 7,606,110 - Han , et al. October 20, 2	2009-10-20
Memory Modules And Memory Systems Having The Same App 20090103374 - HAN; You-Keun ; et al.	2009-04-23
Methods and apparatus for interfacing between test system and memory Grant 7,519,873 - Shin , et al. April 14, 2	2009-04-14
Method of testing a memory module and hub of the memory module App 20090044062 - Shin; Seung-Man ; et al.	2009-02-12
Memory module testing apparatus and method of testing memory modules Grant 7,487,413 - Lee , et al. February 3, 2	2009-02-03
Method of testing a memory module and hub of the memory module Grant 7,447,954 - Shin , et al. November 4, 2	2008-11-04
Semiconductor memory module and semiconductor memory device Grant 7,426,149 - Kim , et al. September 16, 2	2008-09-16
Memory module packaging test system App 20080016400 - Lee; Jung-kuk ; et al.	2008-01-17
Semiconductor memory module and semiconductor memory device App 20070171740 - Kim; Seok-Il ; et al.	2007-07-26
Methods and apparatus for interfacing between test system and memory App 20070022335 - Shin; Seung-Man ; et al.	2007-01-25
Memory module testing apparatus and related method App 20060230249 - Lee; Jung-kuk ; et al.	2006-10-12
Memory module with memory devices of different capacity App 20060059298 - Cho; Jeong-Hyeon ; et al.	2006-03-16
Memory module, memory unit, and hub with non-periodic clock and methods of using the same App 20060044927 - Han; You-Keun ; et al.	2006-03-02
Method of testing a memory module and hub of the memory module App 20060006419 - Shin; Seung-Man ; et al.	2006-01-12
Method and apparatus for interfacing between test system and embedded memory on test mode setting operation App 20050289287 - Shin, Seung-Man ; et al.	2005-12-29
Multi-layer circuit board with thermal diffusion and method of fabricating the same App 20050183882 - Yun, Young ; et al.	2005-08-25

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