Han; Liqun

Patent Applications and Registrations

Patent applications and USPTO patent grants for Han; Liqun.The latest application filed is for "systems for incorporating lidar sensors in a headlamp module of a vehicle".

Company Profile

1.23.14

Han; Liqun - Pleasanton CA
Han; Liqun - Fremont CA
Han; Liqun - Santa Clara CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Systems for vibration cancellation in a lidar system Grant 10,955,530 - Pei , et al. March 23, 2	2021-03-23
Scanning illuminated three-dimensional imaging systems Grant 10,754,036 - Pei , et al. A	2020-08-25
Scanning apparatuses and methods for a lidar system Grant 10,690,754 - Pei , et al.	2020-06-23
Systems For Incorporating Lidar Sensors In A Headlamp Module Of A Vehicle App 20190257922 - McCord; Mark A. ; et al.	2019-08-22
Scanning Apparatuses And Methods For A Lidar System App 20180180720 - PEI; Jun ; et al.	2018-06-28
Systems For Vibration Cancellation In A Lidar System App 20180180721 - PEI; Jun ; et al.	2018-06-28
Scanning Illuminated Three-Dimensional Imaging Systems App 20170310948 - Pei; Jun ; et al.	2017-10-26
Electron beam imaging with dual Wien-filter monochromator Grant 9,443,696 - Jiang , et al. September 13, 2	2016-09-13
Electron Beam Imaging With Dual Wien-filter Monochromator App 20150340200 - JIANG; Xinrong ; et al.	2015-11-26
Apparatus and methods for high-resolution electron beam imaging Grant 9,053,900 - Jiang , et al. June 9, 2	2015-06-09
Tilt-imaging scanning electron microscope Grant 8,921,782 - Jiang , et al. December 30, 2	2014-12-30
Dual-lens-gun electron beam apparatus and methods for high-resolution imaging with both high and low beam currents Grant 8,859,982 - Jiang , et al. October 14, 2	2014-10-14
Tilt-imaging Scanning Electron Microscope App 20140151552 - JIANG; Xinrong ; et al.	2014-06-05
Dual-lens-gun Electron Beam Apparatus And Methods For High-resolution Imaging With Both High And Low Beam Currents App 20140077077 - JIANG; Xinrong ; et al.	2014-03-20
Electron-optical system for high-speed and high-sensitivity inspections Grant 8,664,594 - Jiang , et al. March 4, 2	2014-03-04
Suspended membrane calibration sample Grant 8,614,427 - McCord , et al. December 24, 2	2013-12-24
Apparatus And Methods For High-resolution Electron Beam Imaging App 20130256530 - JIANG; Xinrong ; et al.	2013-10-03
Electron beam column and methods of using same Grant 8,461,526 - Mankos , et al. June 11, 2	2013-06-11
Multiple-beam system for high-speed electron-beam inspection Grant 8,362,425 - Han , et al. January 29, 2	2013-01-29
High-sensitivity and high-throughput electron beam inspection column enabled by adjustable beam-limiting aperture Grant 8,294,125 - Han , et al. October 23, 2	2012-10-23
Multiple-beam System For High-speed Electron-beam Inspection App 20120241606 - Han; Liqun ; et al.	2012-09-27
Electron Beam Column And Methods Of Using Same App 20120138791 - MANKOS; Marian ; et al.	2012-06-07
Shielding, particulate reducing high vacuum components Grant 8,092,927 - Tahmassebpur , et al. January 10, 2	2012-01-10
Shielding, Particulate Reducing High Vacuum Components App 20110142382 - Tahmassebpur; Mohammed ; et al.	2011-06-16
High-Sensitivity and High-Throughput Electron Beam Inspection Column Enabled by Adjustable Beam-Limiting Aperture App 20110114838 - HAN; Liqun ; et al.	2011-05-19
Shielding, particulate reducing high vacuum components Grant 7,919,193 - Tahmassebpur , et al. April 5, 2	2011-04-05
Immersion gun equipped electron beam column Grant 7,821,187 - Jiang , et al. October 26, 2	2010-10-26
High-speed electron beam inspection Grant 7,315,022 - Adler , et al. January 1, 2	2008-01-01
Electron beam inspection system using multiple electron beams and uniform focus and deflection mechanisms Grant 6,774,646 - Han , et al. August 10, 2	2004-08-10

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