loadpatents
name:-0.0014898777008057
name:-0.0091638565063477
name:-0.0011739730834961
Hammerl, Erwin Patent Filings

Hammerl, Erwin

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hammerl, Erwin.The latest application filed is for "method for checking the functioning of memory cells of an integrated semiconductor memory".

Company Profile
0.14.1
  • Hammerl, Erwin - Zangberg DE
  • Hammerl; Erwin - Stormville NY
  • Hammerl; Erwin - Emmerting DE
  • Hammerl; Erwin - Emerting DE
  • Hammerl; Erwin - Stromville NY
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method for checking the functioning of memory cells of an integrated semiconductor memory
App 20020026608 - Daehn, Wilfried ;   et al.
2002-02-28
Method of controllably forming a LOCOS oxide layer over a portion of a vertically extending sidewall of a trench extending into a semiconductor substrate
Grant 6,153,474 - Ho , et al. November 28, 2
2000-11-28
Shallow trench isolation (STI) with bilayer of oxide-nitride for VLSI applications
Grant 6,140,208 - Agahi , et al. October 31, 2
2000-10-31
Nitride cap formation in a DRAM trench capacitor
Grant 5,937,292 - Hammerl , et al. August 10, 1
1999-08-10
Three-dimensional device layout with sub-groundrule features
Grant 5,893,735 - Stengl , et al. April 13, 1
1999-04-13
Buried strap formation in a DRAM trench capacitor
Grant 5,844,266 - Stengl , et al. December 1, 1
1998-12-01
Microelectronic component and process for its production
Grant 5,828,076 - Gossner , et al. October 27, 1
1998-10-27
Buried-strap formation in a dram trench capacitor
Grant 5,827,765 - Stengl , et al. October 27, 1
1998-10-27
Three-dimensional device layout having a trench capacitor
Grant 5,792,685 - Hammerl , et al. August 11, 1
1998-08-11
Application of thin crystalline Si.sub.3 N.sub.4 liners in shallow trench isolation (STI) structures
Grant 5,747,866 - Ho , et al. May 5, 1
1998-05-05
Nitride cap formation in a DRAM trench capacitor
Grant 5,717,628 - Hammerl , et al. February 10, 1
1998-02-10
Process for forming deep trench DRAMs with sub-groundrule gates
Grant 5,674,769 - Alsmeier , et al. October 7, 1
1997-10-07
Controlled recrystallization of buried strap in a semiconductor memory device
Grant 5,670,805 - Hammerl , et al. September 23, 1
1997-09-23
Storage node process for deep trench-based DRAM
Grant 5,656,535 - Ho , et al. August 12, 1
1997-08-12
Shallow trench isolation with thin nitride liner
Grant 5,447,884 - Fahey , et al. September 5, 1
1995-09-05

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