Hamashima; Muneki

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hamashima; Muneki.The latest application filed is for "image sensor, image-capturing apparatus and image-capturing system".

Company Profile

2.45.40

Hamashima; Muneki - Fukaya JP
HAMASHIMA; Muneki - Fukaya-shi JP
Hamashima; Muneki - Kanagawa JP
Hamashima; Muneki - Urayasu JP
Hamashima; Muneki - Saitama JP
Hamashima; Muneki - Chiba JP
Hamashima; Muneki - Urayasu-shi JP
Hamashima; Muneki - Tokyo JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Washing/drying apparatus, screening apparatus, washing/drying method, and screening method Grant 10,429,402 - Isami , et al. October 1, 2	2019-10-01
Image sensor, image-capturing apparatus and image-capturing system Grant 10,412,358 - Ishiga , et al. Sept	2019-09-10
Imaging processing apparatus, image-capturing apparatus, and storage medium having image processing program stored thereon Grant 10,027,942 - Ishiga , et al. July 17, 2	2018-07-17
Image Sensor, Image-capturing Apparatus And Image-capturing System App 20180139435 - ISHIGA; Kenichi ; et al.	2018-05-17
Image sensor, image-capturing apparatus and image capturing system Grant 9,906,770 - Ishiga , et al. February 27, 2	2018-02-27
Image capturing device and program to control image capturing device Grant 9,888,226 - Shibazaki , et al. February 6, 2	2018-02-06
Image processing apparatus, image processing method and recording medium Grant 9,860,516 - Shibazaki , et al. January 2, 2	2018-01-02
Image processing apparatus, image capturing apparatus, and image processing program Grant 9,854,224 - Mori , et al. December 26, 2	2017-12-26
Image processing device, imaging device, and image processing program Grant 9,838,665 - Shibazaki , et al. December 5, 2	2017-12-05
Image processing apparatus, image-capturing apparatus, and storage medium having image processing program stored thereon Grant 9,727,985 - Ishiga , et al. August 8, 2	2017-08-08
Imaging apparatus for generating parallax image data Grant 9,706,186 - Shibazaki , et al. July 11, 2	2017-07-11
Image processing apparatus and image processing program Grant 9,706,190 - Shibazaki , et al. July 11, 2	2017-07-11
Imaging apparatus, image processing device, computer-readable medium having stored thereon an imaging apparatus controlling program, and computer-readable medium having stored thereon an image processing program Grant 9,693,036 - Shibazaki , et al. June 27, 2	2017-06-27
Washing/drying Apparatus, Screening Apparatus, Washing/drying Method, And Screening Method App 20170045543 - ISAMI; Tadao ; et al.	2017-02-16
Image sensor and imaging device Grant 9,532,033 - Shibazaki , et al. December 27, 2	2016-12-27
Image sensor, imaging device and image processing device Grant 9,414,046 - Hamashima , et al. August 9, 2	2016-08-09
Plate, Method For Manufacturing Plate, Method For Observing Biochip, And Method For Screening App 20160144368 - ISAMI; Tadao ; et al.	2016-05-26
Image capturing device Grant 9,341,935 - Hamashima May 17, 2	2016-05-17
Imaging Apparatus App 20160119608 - SHIBAZAKI; Kiyoshige ; et al.	2016-04-28
Biochip Fixing Method, Biochip Fixing Device, And Screening Method For Biomolecule Array App 20160059201 - UEDA; Takehiko ; et al.	2016-03-03
Imaging Apparatus, Image Processing Device, Computer-readable Medium Having Stored Thereon An Imaging Apparatus Controlling Program, And Computer-readable Medium Having Stored Thereon An Image Processing Program App 20150245011 - SHIBAZAKI; Kiyoshige ; et al.	2015-08-27
Image Processing Device, Imaging Device, And Image Processing Program App 20150103144 - SHIBAZAKI; Kiyoshige ; et al.	2015-04-16
Image Processing Apparatus, Image-capturing Apparatus, And Storage Medium Having Image Processing Program Stored Thereon App 20150062307 - ISHIGA; Kenichi ; et al.	2015-03-05
Image Sensor, Image-capturing Apparatus And Image-capturing System App 20150002634 - ISHIGA; Kenichi ; et al.	2015-01-01
Image Processing Apparatus, Image-capturing Apparatus, And Storage Medium Having Image Processing Program Stored Thereon App 20140375673 - ISHIGA; Kenichi ; et al.	2014-12-25
Image Capturing Apparatus App 20140340488 - SHIBAZAKI; Kiyoshige ; et al.	2014-11-20
Image Sensor, Imaging Device And Image Processing Device App 20140333732 - HAMASHIMA; Muneki ; et al.	2014-11-13
Image Sensor App 20140307060 - SHIBAZAKI; Kiyoshige ; et al.	2014-10-16
Image Processing Apparatus, Image Processing Method And Recording Medium App 20140184755 - SHIBAZAKI; Kiyoshige ; et al.	2014-07-03
Image Processing Apparatus, Image Capturing Apparatus, And Image Processing Program App 20140055571 - Mori; Susumu ; et al.	2014-02-27
Image Capturing Device And Program To Control Image Capturing Device App 20140055576 - SHIBAZAKI; Kiyoshige ; et al.	2014-02-27
Image Processing Apparatus And Image Processing Program App 20140036043 - SHIBAZAKI; Kiyoshige ; et al.	2014-02-06
Optical Element, Optical Device, Measurement Device, And Screening Apparatus App 20140027653 - MORI; Susumu ; et al.	2014-01-30
Image Capturing Device App 20120300041 - Hamashima; Muneki	2012-11-29
Image Sensor And Imaging Device App 20120140100 - SHIBAZAKI; Kiyoshige ; et al.	2012-06-07
Electron beam apparatus and method of manufacturing semiconductor device using the apparatus Grant 7,888,642 - Nakasuji , et al. February 15, 2	2011-02-15
Object observation apparatus and object observation Grant RE41,665 - Hamashima , et al. September 14, 2	2010-09-14
Electron beam apparatus and method of manufacturing semiconductor device using the apparatus Grant 7,745,784 - Nakasuji , et al. June 29, 2	2010-06-29
Inspection system by charged particle beam and method of manufacturing devices using the system Grant 7,601,972 - Nakasuji , et al. October 13, 2	2009-10-13
Method of electric discharge machining a cathode for an electron gun Grant 7,598,471 - Hamashima , et al. October 6, 2	2009-10-06
Electron beam apparatus and method of manufacturing semiconductor device using the apparatus App 20090050822 - Nakasuji; Mamoru ; et al.	2009-02-26
Electron Beam Apparatus And Method Of Manufacturing Semiconductor Device Using The Apparatus App 20090039262 - NAKASUJI; Mamoru ; et al.	2009-02-12
Electron beam apparatus and device production method using the electron beam apparatus Grant 7,439,502 - Nakasuji , et al. October 21, 2	2008-10-21
Electron beam apparatus and method of manufacturing semiconductor device using the apparatus Grant 7,423,267 - Nakasuji , et al. September 9, 2	2008-09-09
Electron beam apparatus and device production method using the electron beam apparatus App 20080173815 - Nakasuji; Mamoru ; et al.	2008-07-24
Method for inspecting substrate, substrate inspecting system and electron App 20080121804 - Nakasuji; Mamoru ; et al.	2008-05-29
Object observation apparatus and object observation Grant RE40,221 - Hamashima , et al. April 8, 2	2008-04-08
Inspection system by charged particle beam and method of manufacturing devices using the system App 20080042060 - Nakasuji; Mamoru ; et al.	2008-02-21
Electron beam apparatus and device production method using the electron beam apparatus App 20070272859 - Nakasuji; Mamoru ; et al.	2007-11-29
Inspection system by charged particle beam and method of manufacturing devices using the system Grant 7,297,949 - Nakasuji , et al. November 20, 2	2007-11-20
Electron beam apparatus and method of manufacturing semiconductor device using the apparatus Grant 7,247,848 - Nakasuji , et al. July 24, 2	2007-07-24
Electron beam apparatus and device manufacturing method using the same App 20070164226 - Hamashima; Muneki ; et al.	2007-07-19
Electron beam apparatus and device fabrication method using the electron beam apparatus Grant 7,244,932 - Nakasuji , et al. July 17, 2	2007-07-17
Electron beam apparatus and device manufacturing method using same Grant 7,205,559 - Hamashima , et al. April 17, 2	2007-04-17
Inspection system by charged particle beam and method of manufacturing devices using the system App 20070057186 - Nakasuji; Mamoru ; et al.	2007-03-15
Method for inspecting substrate, substrate inspecting system and electron beam apparatus App 20070045536 - Nakasuji; Mamoru ; et al.	2007-03-01
Electron beam apparatus and method of manufacturing semiconductor device using the apparatus App 20070018101 - Nakasuji; Mamoru ; et al.	2007-01-25
Inspection system by charged particle beam and method of manufacturing devices using the system Grant 7,135,676 - Nakasuji , et al. November 14, 2	2006-11-14
Electron beam apparatus and method of manufacturing semiconductor device using the apparatus Grant 7,129,485 - Nakasuji , et al. October 31, 2	2006-10-31
Method for inspecting substrate, substrate inspecting system and electron beam apparatus Grant 7,109,483 - Nakasuji , et al. September 19, 2	2006-09-19
Electron beam apparatus and method of manufacturing semiconductor device using the apparatus Grant 7,095,022 - Nakasuji , et al. August 22, 2	2006-08-22
Scanning device and method including electric charge movement Grant 6,953,944 - Kohama , et al. October 11, 2	2005-10-11
Scanning device and method including electric charge movement App 20040238740 - Kohama, Yoshiaki ; et al.	2004-12-02
Electron beam apparatus and method of manufacturing semiconductor device using the apparatus App 20040183013 - Nakasuji, Mamoru ; et al.	2004-09-23
Electron beam apparatus and device manufacturing method using same App 20040135515 - Hamashima, Muneki ; et al.	2004-07-15
Scanning device and scanning method Grant 6,670,602 - Kohama , et al. December 30, 2	2003-12-30
Electron beam apparatus and method of manufacturing semiconductor device using the apparatus App 20030207475 - Nakasuji, Mamoru ; et al.	2003-11-06
Electron beam apparatus and method of manufacturing semiconductor device using the apparatus Grant 6,593,152 - Nakasuji , et al. July 15, 2	2003-07-15
Object observation apparatus and object observation Grant 6,479,819 - Hamashima , et al. November 12, 2	2002-11-12
Electron beam apparatus and device production method using the electron beam apparatus App 20020148961 - Nakasuji, Mamoru ; et al.	2002-10-17
Electron beam apparatus and method of manufacturing semiconductor device using the apparatus App 20020142496 - Nakasuji, Mamoru ; et al.	2002-10-03
Method for inspecting substrate, substrate inspecting system and electron beam apparatus App 20020130262 - Nakasuji, Mamoru ; et al.	2002-09-19
Electron beam apparatus and method of manufacturing semiconductor device using the apparatus App 20020109090 - Nakasuji, Mamoru ; et al.	2002-08-15
Electron beam type inspection device and method of making same Grant 6,365,897 - Hamashima , et al. April 2, 2	2002-04-02
Inspection system by charged particle beam and method of manufacturing devices using the system App 20020033449 - Nakasuji, Mamoru ; et al.	2002-03-21
Apparatus and method for inspecting predetermined region on surface of specimen using electron beam Grant 6,184,526 - Kohama , et al. February 6, 2	2001-02-06
Object observing apparatus and method for adjusting the same Grant 6,011,262 - Hamashima , et al. January 4, 2	2000-01-04
Image processing method and apparatus Grant 5,479,537 - Hamashima , et al. December 26, 1	1995-12-26
Method and apparatus for pattern matching Grant 5,373,567 - Takahashi , et al. December 13, 1	1994-12-13
Pattern detecting apparatus utilizing energy beam Grant 4,769,551 - Hamashima , et al. September 6, 1	1988-09-06
Pattern position detection apparatus using laser beam Grant 4,744,663 - Hamashima , et al. May 17, 1	1988-05-17

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