Hamanaka; Shinsuke
Patent Applications and Registrations
Patent applications and USPTO patent grants for Hamanaka; Shinsuke.The latest application filed is for "test system and test method of semiconductor integrated circuit".
- Hamanaka; Shinsuke - Kanagawa JP
- Hamanaka; Shinsuke - Shingu JP
- Hamanaka, Shinsuke - Shingu-shi JP
| Patent | Date |
|---|---|
| Test system and test method of semiconductor integrated circuit Grant 8,390,310 - Hamanaka March 5, 2 | 2013-03-05 |
| Test system and test method of semiconductor integrated circuit App 20100301895 - Hamanaka; Shinsuke | 2010-12-02 |
| I/O interface circuit of intergrated circuit Grant 7,589,554 - Hamanaka September 15, 2 | 2009-09-15 |
| I/O interface circuit of intergrated circuit App 20080164905 - Hamanaka; Shinsuke | 2008-07-10 |
| I/O interface circuit of integrated circuit Grant 7,382,152 - Hamanaka June 3, 2 | 2008-06-03 |
| Flicker correction apparatus and flicker correction method, and recording medium storing flicker correction program Grant 7,164,439 - Yoshida , et al. January 16, 2 | 2007-01-16 |
| I/O interface circuit of integrated circuit App 20050088150 - Hamanaka, Shinsuke | 2005-04-28 |
| Flicker correction apparatus and flicker correction method, and recording medium storing flicker correction program App 20030142239 - Yoshida, Takuji ; et al. | 2003-07-31 |
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