loadpatents
name:-0.019108057022095
name:-0.011399030685425
name:-0.0019791126251221
Hamanaka; Nobuaki Patent Filings

Hamanaka; Nobuaki

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hamanaka; Nobuaki.The latest application filed is for "positive electrode for lithium ion secondary battery and lithium ion secondary battery using same".

Company Profile
1.9.12
  • Hamanaka; Nobuaki - Kanagawa JP
  • Hamanaka; Nobuaki - Tokyo JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Negative electrode, method for producing the same, and battery
Grant 10,038,194 - Hamanaka July 31, 2
2018-07-31
Positive Electrode For Lithium Ion Secondary Battery And Lithium Ion Secondary Battery Using Same
App 20160351902 - HAMANAKA; Nobuaki
2016-12-01
Negative Electrode, Method For Producing The Same, And Battery
App 20160211525 - Hamanaka; Nobuaki
2016-07-21
Semiconductor Device And Process For Producing The Same
App 20100330799 - HAMANAKA; Nobuaki ;   et al.
2010-12-30
Semiconductor device, designing method for semiconductor device, computer-readable medium, and manufacturing method for semiconductor device
App 20100289150 - Hamanaka; Nobuaki
2010-11-18
Semiconductor device and method of manufacturing the same
Grant 7,217,654 - Nagahara , et al. May 15, 2
2007-05-15
Semiconductor device and method of manufacturing the same
App 20070096331 - Nagahara; Seiji ;   et al.
2007-05-03
Method of manufacturing a semiconductor device and apparatus for manufacturing a semiconductor device
Grant 7,199,058 - Maruyama , et al. April 3, 2
2007-04-03
Semiconductor device and method of manufacturing the same
App 20050124168 - Nagahara, Seiji ;   et al.
2005-06-09
Method of manufacturing a semiconductor device and apparatus for manufacturing a semiconductor device
App 20040241928 - Maruyama, Takuya ;   et al.
2004-12-02
Photo mask for fabricating semiconductor device having dual damascene structure
Grant 6,821,687 - Hamanaka , et al. November 23, 2
2004-11-23
Semiconductor device and method of manufacturing the same
App 20030170993 - Nagahara, Seiji ;   et al.
2003-09-11
Method for forming a silicide of metal with a high melting point in a semiconductor device
Grant 6,569,766 - Hamanaka , et al. May 27, 2
2003-05-27
Method For Forming A Refractory-metal-silicide Layer In A Semiconductor Device
App 20030077901 - HAMANAKA, NOBUAKI ;   et al.
2003-04-24
Method for forming a refractory-metal-silicide layer in a semiconductor device
Grant 6,548,421 - Hamanaka , et al. April 15, 2
2003-04-15
Process for fabricating semiconductor device having silicide layer with low resistance and uniform profile and sputtering system used therein
Grant 6,544,890 - Hamanaka April 8, 2
2003-04-08
Fabrication Method Of Implanting Siliconions Into The Silicon Substrate
App 20020155701 - Hamanaka, Nobuaki
2002-10-24
Photo mask for fabricating semiconductor device having dual damascene structure
App 20020142235 - Hamanaka, Nobuaki ;   et al.
2002-10-03
Method of forming MOS transistor
Grant 6,436,783 - Ono , et al. August 20, 2
2002-08-20
Process for fabricating semiconductor device having silicide layer with low resistance and uniform profile and sputtering system used therein
App 20020081827 - Hamanaka, Nobuaki
2002-06-27
Method of manufacturing a semiconductor device
Grant 6,337,272 - Hamanaka January 8, 2
2002-01-08

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed