loadpatents
name:-0.015139818191528
name:-0.014587163925171
name:-0.00051999092102051
Hamamoto; Nariaki Patent Filings

Hamamoto; Nariaki

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hamamoto; Nariaki.The latest application filed is for "magnetic field sources for an ion source".

Company Profile
0.11.12
  • Hamamoto; Nariaki - Kyoto JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Magnetic field sources for an ion source
Grant 9,275,819 - Hahto , et al. March 1, 2
2016-03-01
Ion beam line
Grant 9,142,386 - Hahto , et al. September 22, 2
2015-09-22
Ion Beam Line
App 20140261171 - Hahto; Sami K. ;   et al.
2014-09-18
Magnetic Field Sources For An Ion Source
App 20140265856 - Hahto; Sami K. ;   et al.
2014-09-18
Ion beam apparatus and method employing magnetic scanning
Grant 8,436,326 - Glavish , et al. May 7, 2
2013-05-07
Ion Beam Apparatus And Method Employing Magnetic Scanning
App 20110089321 - Glavish; Hilton F. ;   et al.
2011-04-21
Ion beam apparatus and method employing magnetic scanning
Grant 7,851,773 - Glavish , et al. December 14, 2
2010-12-14
Ion source
Grant 7,750,313 - Fujita , et al. July 6, 2
2010-07-06
Ion beam measuring method and ion implanting apparatus
Grant 7,655,929 - Umisedo , et al. February 2, 2
2010-02-02
Ion Beam Apparatus And Method Employing Magnetic Scanning
App 20090261248 - Glavish; Hilton F. ;   et al.
2009-10-22
Ion source
App 20080277593 - Fujita; Hideki ;   et al.
2008-11-13
Ion beam measuring method and ion implanting apparatus
Grant 7,368,734 - Umisedo , et al. May 6, 2
2008-05-06
Ion source
Grant 7,365,339 - Fujita , et al. April 29, 2
2008-04-29
Ion beam measuring method and ion implanting apparatus
App 20080073579 - Umisedo; Sei ;   et al.
2008-03-27
Ion beam measuring method and ion implanting apparatus
App 20070023674 - Umisedo; Sei ;   et al.
2007-02-01
Ion source
App 20060284104 - Fujita; Hideki ;   et al.
2006-12-21
Ion beam irradiation apparatus for suppressing charge up of substrate and method for the same
Grant 7,087,912 - Hamamoto August 8, 2
2006-08-08
Ion production device for ion beam irradiation apparatus
Grant 6,686,599 - Hamamoto , et al. February 3, 2
2004-02-03
Ion beam irradiation apparatus for suppressing charge up of substrate and method for the same
App 20030209430 - Hamamoto, Nariaki
2003-11-13
Ion beam irradiation apparatus and method of igniting a plasma for the same
App 20020164845 - Hamamoto, Nariaki
2002-11-07
Ion production device for ion beam irradiation apparatus
App 20020088950 - Hamamoto, Nariaki ;   et al.
2002-07-11
Ion-implanting method and ion-implanting apparatus
App 20010027015 - Hamamoto, Nariaki ;   et al.
2001-10-04

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