Hamaguchi; Takahiro

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hamaguchi; Takahiro.The latest application filed is for "measurement device".

Company Profile

0.9.6

Hamaguchi; Takahiro - Kyoto JP
Hamaguchi; Takahiro - Uji JP
Hamaguchi; Takahiro - Kanagawa JP
Hamaguchi, Takahiro - Kanawaga JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Display screen with icon Grant D954,106 - Hiromura , et al. June 7, 2	2022-06-07
Display screen portion with icon for sphygmomanometer Grant D933,100 - Hamaguchi October 12, 2	2021-10-12
Display screen portion with icon for sphygmomanometer Grant D929,457 - Hamaguchi August 31, 2	2021-08-31
Measurement Device App 20210177274 - DENO; Toru ; et al.	2021-06-17
Measurement Device, Measurement Method, And Non-transitory Recording Medium Recording Measurement Program App 20210161399 - DENO; Toru ; et al.	2021-06-03
Display screen portion with icon for sphygmomanometer Grant D919,657 - Hamaguchi May 18, 2	2021-05-18
Behavior Modification Assistance Device, Terminal, And Server App 20210134435 - DENO; Toru ; et al.	2021-05-06
Information Processing Device, Information Processing Method, And Non-transitory Recording Medium On Which Program For Information Processing Is Recorded App 20210134411 - DENO; Toru ; et al.	2021-05-06
Medical Questionnaire Creation Assist Device, Method, And Non-transitory Computer-readable Storage Medium Storing Program App 20210134403 - DENO; Toru ; et al.	2021-05-06
Display screen portion with icon for sphygmomanometer Grant D871,452 - Hamaguchi Dec	2019-12-31
Display screen portion with icon for sphygmomanometer Grant D871,453 - Hamaguchi Dec	2019-12-31
Display screen portion with icon for sphygmomanometer Grant D864,248 - Hamaguchi Oc	2019-10-22
Display screen with a computer icon Grant D826,983 - Hamaguchi , et al. August 28, 2	2018-08-28
Semiconductor integrated circuit and method for testing same Grant 7,487,418 - Kayukawa , et al. February 3, 2	2009-02-03
Semiconductor integrated circuit and method for testing same App 20040153801 - Kayukawa, Yoshitaka ; et al.	2004-08-05

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