loadpatents
name:-0.026501893997192
name:-0.02895188331604
name:-0.002269983291626
Hama; Nobuyuki Patent Filings

Hama; Nobuyuki

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hama; Nobuyuki.The latest application filed is for "surface texture measuring apparatus".

Company Profile
2.21.12
  • Hama; Nobuyuki - Kure JP
  • Hama; Nobuyuki - Higashihiroshima JP
  • Hama; Nobuyuki - Higashihiroshima-shi JP
  • Hama; Nobuyuki - Hiroshima JP
  • HAMA; Nobuyuki - Kure-shi JP
  • Hama; Nobuyuki - Shiga JP
  • Hama; Nobuyuki - Higashi Hiroshima JP
  • Hama; Nobuyuki - Higashi Hiroshima-shi JP
  • Hama; Nobuyuki - Ichikawa JP
  • Hama, Nobuyuki - Ichikawa-shi JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Rotation transmitter
Grant 10,704,605 - Yasuno , et al.
2020-07-07
Surface texture measuring apparatus
Grant 10,584,981 - Kajihara , et al.
2020-03-10
Surface Texture Measuring Apparatus
App 20180340798 - Kajihara; Toshihiko ;   et al.
2018-11-29
Measuring probe and measuring probe system
Grant 10,001,358 - Hidaka , et al. June 19, 2
2018-06-19
Rotation Transmitter
App 20180135704 - YASUNO; Junsuke ;   et al.
2018-05-17
Tilt angle adjuster for form measuring device
Grant 9,891,033 - Onodera , et al. February 13, 2
2018-02-13
Measuring Probe And Measuring Probe System
App 20170097221 - HIDAKA; Kazuhiko ;   et al.
2017-04-06
Tilt Angle Adjuster For Form Measuring Device
App 20160290778 - ONODERA; Youhei ;   et al.
2016-10-06
Surface roughness measuring unit and coordinate measuring apparatus
Grant 9,250,053 - Hirano , et al. February 2, 2
2016-02-02
Method for cleaning skid of surface roughness tester
Grant 9,103,656 - Matsumiya , et al. August 11, 2
2015-08-11
Surface Roughness Measuring Unit And Coordinate Measuring Apparatus
App 20140109422 - HIRANO; Kotaro ;   et al.
2014-04-24
Digital display device for surface-roughness measuring instruments
Grant D686,096 - Matsumiya , et al. July 16, 2
2013-07-16
Digital display device for surface-roughness measuring instruments
Grant D686,095 - Matsumiya , et al. July 16, 2
2013-07-16
Surface texture measuring instrument and measuring method
Grant 8,276,435 - Kanematsu , et al. October 2, 2
2012-10-02
Method For Cleaning Skid Of Surface Roughness Tester
App 20120017940 - MATSUMIYA; Sadayuki ;   et al.
2012-01-26
Conductive paste as well as conductive coating and conductive film prepared from same
Grant 7,998,370 - Hama , et al. August 16, 2
2011-08-16
Conductive Paste As Well As Conductive Coating And Conductive Film Prepared From Same
App 20100193748 - Hama; Nobuyuki ;   et al.
2010-08-05
Surface-roughness measurement instrument
Grant D614,053 - Matsumiya , et al. April 20, 2
2010-04-20
Surface Texture Measuring Instrument And Measuring Method
App 20100018298 - Kanematsu; Toshihiro ;   et al.
2010-01-28
Drive unit
Grant 7,373,807 - Hama May 20, 2
2008-05-20
Drive unit
App 20060196255 - Hama; Nobuyuki
2006-09-07
Measuring instrument
Grant 6,874,243 - Hama , et al. April 5, 2
2005-04-05
Measuring instrument
App 20040168332 - Hama, Nobuyuki ;   et al.
2004-09-02
Method for accessing information
Grant 6,728,888 - Ooki , et al. April 27, 2
2004-04-27
Height gauge
Grant 6,357,134 - Hama , et al. March 19, 2
2002-03-19
Surface texture measuring machine and method of correcting a measured value for the machine
App 20010051857 - Katayama, Minoru ;   et al.
2001-12-13
Method for accessing information
App 20010014948 - Ooki, Masayoshi ;   et al.
2001-08-16
Method for accessing information
Grant 6,240,518 - Ooki , et al. May 29, 2
2001-05-29
Method for accessing information
Grant 6,092,203 - Ooki , et al. July 18, 2
2000-07-18
Method for accessing information
Grant 5,822,518 - Ooki , et al. October 13, 1
1998-10-13

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