loadpatents
Patent applications and USPTO patent grants for Ham; Chul Ho.The latest application filed is for "handler for testing semiconductor devices".
Patent | Date |
---|---|
Transfer device of handler for testing semiconductor device Grant 7,464,807 - Ham , et al. December 16, 2 | 2008-12-16 |
Socket assembly for testing semiconductor device Grant 7,429,868 - Park , et al. September 30, 2 | 2008-09-30 |
Handler for testing semiconductor devices Grant 7,408,338 - Ham , et al. August 5, 2 | 2008-08-05 |
Test tray for handler for testing semiconductor devices Grant 7,253,653 - Ham , et al. August 7, 2 | 2007-08-07 |
Handler for testing semiconductor devices App 20070152655 - Ham; Chul Ho ;   et al. | 2007-07-05 |
Handler for testing semiconductor devices Grant 7,196,508 - Ham , et al. March 27, 2 | 2007-03-27 |
Test tray with carrier modules for a semiconductor device handler Grant 7,135,703 - Ham , et al. November 14, 2 | 2006-11-14 |
Handler for testing semiconductor devices App 20060214655 - Ham; Chul Ho ;   et al. | 2006-09-28 |
Test tray for handler for testing semiconductor devices App 20060192583 - Ham; Chul Ho ;   et al. | 2006-08-31 |
Sokcet assembly for testing semiconductor device App 20060170412 - Park; Chan Ho ;   et al. | 2006-08-03 |
Carrier module Grant 7,061,101 - Ham , et al. June 13, 2 | 2006-06-13 |
Transfer device of handler for testing semiconductor device App 20060119345 - Ham; Chul Ho ;   et al. | 2006-06-08 |
Methods for compensating for a test temperature deviation Grant 7,008,804 - Song , et al. March 7, 2 | 2006-03-07 |
Carrier module App 20050200000 - Ham, Chul Ho ;   et al. | 2005-09-15 |
Carrier module for semiconductor device test handler Grant 6,873,169 - Ham , et al. March 29, 2 | 2005-03-29 |
Device for compensating for a test temperature deviation in a semiconductor device handler Grant 6,861,861 - Song , et al. March 1, 2 | 2005-03-01 |
Test tray with carrier modules for a semiconductor device handler App 20040016993 - Ham, Chul Ho ;   et al. | 2004-01-29 |
Device for compensating for a test temperature deviation in a semiconductor device handler App 20040017185 - Song, Jae Myeong ;   et al. | 2004-01-29 |
Methods for compensating for a test temperature deviation App 20040019452 - Song, Jae Myeong ;   et al. | 2004-01-29 |
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