Halvorson; Brian

Patent Applications and Registrations

Patent applications and USPTO patent grants for Halvorson; Brian.The latest application filed is for "wafer level integrated circuit probe array and method of construction".

Company Profile

3.7.7

Halvorson; Brian - St. Paul MN

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings Grant 10,928,423 - DeBauche , et al. February 23, 2	2021-02-23
Wafer level integrated circuit probe array and method of construction Grant 10,330,702 - Edwards , et al.	2019-06-25
Wafer Level Integrated Circuit Probe Array and Method of Construction App 20190041429 - Edwards; Jathan ; et al.	2019-02-07
Testing Apparatus And Method For Microcircuit Testing With Conical Bias Pad And Conductive Test Pin Rings App 20190004093 - DeBauche; John ; et al.	2019-01-03
Wafer level integrated circuit probe array and method of construction Grant 10,078,101 - Edwards , et al. September 18, 2	2018-09-18
Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings Grant 10,067,164 - DeBauche , et al. September 4, 2	2018-09-04
Wafer level integrated circuit contactor and method of construction Grant 9,817,026 - Edwards , et al. November 14, 2	2017-11-14
Testing apparatus and method for microcircuit and wafer level IC testing Grant 9,696,347 - DeBauche , et al. July 4, 2	2017-07-04
Wafer Level Integrated Circuit Probe Array and Method of Construction App 20170074926 - Edwards; Jathan ; et al.	2017-03-16
Testing Apparatus And Method For Microcircuit Testing With Conical Bias Pad And Conductive Test Pin Rings App 20170059616 - DeBauche; John ; et al.	2017-03-02
Wafer Level Integrated Circuit Contactor and Method of Construction App 20160161528 - Edwards; Jathan ; et al.	2016-06-09
Wafer level integrated circuit contactor and method of construction Grant 9,261,537 - Edwards , et al. February 16, 2	2016-02-16
Testing Apparatus And Method For Microcircuit And Wafer Level Ic Testing App 20150015287 - DeBauche; John ; et al.	2015-01-15
Wafer Level Integrated Circuit Contactor and Method of Construction App 20130342233 - Edwards; Jathan ; et al.	2013-12-26

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