Halperin; Arnold

Patent Applications and Registrations

Patent applications and USPTO patent grants for Halperin; Arnold.The latest application filed is for "ionization test for electrical verification".

Company Profile

0.16.2

Halperin; Arnold - Peekskill NY
Halperin; Arnold - Cortlandt Manor NY

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Ionization test for electrical verification Grant 7,808,257 - Cline , et al. October 5, 2	2010-10-05
Ionization test for electrical verification App 20070108984 - Cline; Christopher W. ; et al.	2007-05-17
Thermal modulation system and method for locating a circuit defect Grant 6,400,128 - Guidotti , et al. June 4, 2	2002-06-04
Thermal modulation system and method for locating a circuit defect App 20010035748 - Guidotti, Daniel ; et al.	2001-11-01
Method for detecting power plane-to-power plane shorts and I/O net-to power plane shorts in modules and printed circuit boards Grant 6,242,923 - Scaman , et al. June 5, 2	2001-06-05
Method and apparatus for locating power plane shorts using polarized light microscopy Grant 6,141,093 - Argyle , et al. October 31, 2	2000-10-31
Hand held telephone set with separable keyboard Grant 6,115,616 - Halperin , et al. September 5, 2	2000-09-05
In-situ monitoring and control of conductive films by detecting changes in induced eddy currents Grant 6,072,313 - Li , et al. June 6, 2	2000-06-06
Rotary signal coupling for chemical mechanical polishing endpoint detection with a strasbaugh tool Grant 5,770,948 - Li , et al. June 23, 1	1998-06-23
In-situ monitoring of the change in thickness of films Grant 5,731,697 - Li , et al. March 24, 1	1998-03-24
Rotary signal coupling for chemical mechanical polishing endpoint detection with a westech tool Grant 5,663,637 - Li , et al. September 2, 1	1997-09-02
In-situ monitoring of conductive films on semiconductor wafers Grant 5,660,672 - Li , et al. August 26, 1	1997-08-26
Chemical mechanical polishing endpoint process control Grant 5,659,492 - Li , et al. August 19, 1	1997-08-19
Endpoint detection for chemical mechanical polishing using frequency or amplitude mode Grant 5,644,221 - Li , et al. July 1, 1	1997-07-01
System and method for testing and fault isolation of high density passive boards and substrates Grant 5,621,327 - Chiang , et al. April 15, 1	1997-04-15
In-situ monitoring of the change in thickness of films Grant 5,559,428 - Li , et al. September 24, 1	1996-09-24
Defect detection using intermodulation signals Grant 4,868,506 - DiStefano , et al. September 19, 1	1989-09-19
Nonlinearity detection using fault-generated second harmonic Grant 4,496,900 - Di Stefano , et al. January 29, 1	1985-01-29

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