Scott, Halle
USPTO Trademark & Patent Filings
Trademark applications and grants for Scott, Halle. Scott, Halle has 1 trademark applications. The latest application filed is for "AREN'T WE LUCKY"
- Company Aliases
- Scott, Halle
- scott halle
- Halle; Scott - Slingerlands NY
| Entity Type | INDIVIDUAL |
| Address | 2810 W. Kirkwood Ave., Unit A Nashville, TENNESSEE UNITED STATES 37204 |
Trademarks Patents
| Patent Application | Date |
|---|---|
| Process Optimization by Clamped Monte Carlo Distribution 20210049242 - 16/539809 Halle; Scott ; et al. | 2021-02-18 |
| Predictive Multi-Stage Modelling for Complex Process Control 20210049241 - 16/539382 Halle; Scott ; et al. | 2021-02-18 |
| Care Area Generation By Detection Optimized Methodology 20190065634 - 15/684006 Bonam; Ravi K. ; et al. | 2019-02-28 |
| Resist Having Tuned Interface Hardmask Layer For EUV Exposure 20180166278 - 15/825301 Belyansky; Michael P. ; et al. | 2018-06-14 |
| Resist Having Tuned Interface Hardmask Layer For EUV Exposure 20180166277 - 15/825250 Belyansky; Michael P. ; et al. | 2018-06-14 |
| Secure wafer inspection and identification 11,079,337 - 16/821,107 Lie , et al. August 3, 2 | 2021-08-03 |
| Care area generation by detection optimized methodology 10,437,951 - 15/684,006 Bonam , et al. O | 2019-10-08 |
| Resist having tuned interface hardmask layer for EUV exposure 10,141,188 - 15/825,250 Belyansky , et al. Nov | 2018-11-27 |
| Resist having tuned interface hardmask layer for EUV exposure 10,134,592 - 15/825,301 Belyansky , et al. November 20, 2 | 2018-11-20 |
| Resist having tuned interface hardmask layer for EUV exposure 9,929,012 - 15/378,655 Belyansky , et al. March 27, 2 | 2018-03-27 |
Mark Image Registration | Serial | Trademark Application Date |
|---|---|
"AREN'T WE LUCKY" 97336604 |
AREN'T WE LUCKY 2022-03-29 |
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