Hall; Max
Patent Applications and Registrations
Patent applications and USPTO patent grants for Hall; Max.The latest application filed is for "real-time detection of artifacts in ophthalmic images".
- Hall; Max - Bradenton FL
- Hall; Max - Irvine CA
- Hall; Max - Corona CA US
| Patent | Date |
|---|---|
| Real-time Detection Of Artifacts In Ophthalmic Images App 20220218197 - Sarver; Edwin Jay ; et al. | 2022-07-14 |
| Ocular Aberrometer Systems And Methods App 20210093190 - Hall; Max ; et al. | 2021-04-01 |
| Ocular Aberrometer Characterization Systems And Methods App 20210093180 - Hall; Max ; et al. | 2021-04-01 |
| Dry Eye Mitigation For Ocular Aberrometry Systems And Methods App 20210093184 - Hall; Max ; et al. | 2021-04-01 |
| Ocular Aberrometry Recovery Systems And Methods App 20210093181 - Hall; Max ; et al. | 2021-04-01 |
| Optical instrument alignment system Grant 9,713,420 - Michaels , et al. July 25, 2 | 2017-07-25 |
| Objective quality metric for ocular wavefront measurements Grant 9,603,516 - Sarver , et al. March 28, 2 | 2017-03-28 |
| Objective Quality Metric For Ocular Wavefront Measurements App 20150157200 - Sarver; Edwin Jay ; et al. | 2015-06-11 |
| Objective quality metric for ocular wavefront measurements Grant 8,876,290 - Sarver , et al. November 4, 2 | 2014-11-04 |
| Optical Instrument Alignment System App 20130070203 - Michaels; Richard J. ; et al. | 2013-03-21 |
| Optical instrument alignment system Grant 8,333,474 - Michaels , et al. December 18, 2 | 2012-12-18 |
| Objective Quality Metric For Ocular Wavefront Measurements App 20110007270 - Sarver; Edwin Jay ; et al. | 2011-01-13 |
| Optical Instrument Alignment System App 20090103050 - Michaels; Richard J. ; et al. | 2009-04-23 |
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