Hajiahmadi; Mohammadreza

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hajiahmadi; Mohammadreza.The latest application filed is for "metrology method and associated computer product".

Company Profile

11.8.11

Hajiahmadi; Mohammadreza - Rotterdam NL
HAJIAHMADI; Mohammadreza - Den Bosch NL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Metrology parameter determination and metrology recipe selection Grant 11,448,974 - Javaheri , et al. September 20, 2	2022-09-20
Metrology Method And Associated Computer Product App 20220252990 - JAVAHERI; Narjes ; et al.	2022-08-11
Method of determining a value of a parameter of interest of a patterning process, device manufacturing method Grant 11,181,828 - Warnaar , et al. November 23, 2	2021-11-23
Metrology Parameter Determination And Metrology Recipe Selection App 20210208513 - JAVAHERI; Narjes ; et al.	2021-07-08
Metrology method, apparatus, and computer program to determine a representative sensitivity coefficient Grant 11,009,345 - Da Costa Assafrao , et al. May 18, 2	2021-05-18
Metrology parameter determination and metrology recipe selection Grant 10,990,020 - Javaheri , et al. April 27, 2	2021-04-27
Metrology method, apparatus and computer program Grant 10,794,693 - Farhadzadeh , et al. October 6, 2	2020-10-06
Metrology method and apparatus, computer program and lithographic system Grant 10,705,437 - Javaheri , et al.	2020-07-07
Method Of Determining A Value Of A Parameter Of Interest Of A Patterning Process, Device Manufacturing Method App 20200133140 - WARNAAR; Patrick ; et al.	2020-04-30
Method of Measuring a Structure, Inspection Apparatus, Lithographic System and Device Manufacturing Method App 20200050114 - Bozkurt; Murat ; et al.	2020-02-13
Metrology Apparatus and Method for Determining a Characteristic of One or More Structures on a Substrate App 20190378012 - Tripodi; Lorenzo ; et al.	2019-12-12
Metrology Method, Apparatus And Computer Program App 20190368867 - DA COSTA ASSAFRAO; Alberto ; et al.	2019-12-05
Method of measuring a structure, inspection apparatus, lithographic system and device manufacturing method Grant 10,481,506 - Bozkurt , et al. Nov	2019-11-19
Metrology parameter determination and metrology recipe selection Grant 10,451,978 - Bhattacharyya , et al. Oc	2019-10-22
Metrology Method and Apparatus, Computer Program and Lithographic System App 20190107785 - JAVAHERI; Narjes ; et al.	2019-04-11
Metrology Method, Apparatus and Computer Program App 20190056220 - FARHADZADEH; Farzad ; et al.	2019-02-21
Metrology Parameter Determination And Metrology Recipe Selection App 20190004437 - Bhattacharyya; Kaustuve ; et al.	2019-01-03
Method of Measuring a Structure, Inspection Apparatus, Lithographic System and Device Manufacturing Method App 20180321599 - BOZKURT; Murat ; et al.	2018-11-08
Metrology Parameter Determination And Metrology Recipe Selection App 20180321597 - JAVAHERI; Narjes ; et al.	2018-11-08

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