Haitjema; Han

Patent Applications and Registrations

Patent applications and USPTO patent grants for Haitjema; Han.The latest application filed is for "method and apparatus for inner diameter measurement of transparent tube".

Company Profile

2.4.6

Haitjema; Han - Eindhoven NL
Haitjema; Han - KP Eindhoven NL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and apparatus for inner diameter measurement of transparent tube Grant 10,458,779 - Haitjema , et al. Oc	2019-10-29
Method And Apparatus For Inner Diameter Measurement Of Transparent Tube App 20190271535 - HAITJEMA; Han ; et al.	2019-09-05
Interference measuring device and method of measurement using the same device Grant 10,024,648 - Nagahama , et al. July 17, 2	2018-07-17
Interferometer System Having A Continuously Variable Broadband Reflector And Method To Generate An Interference Signal Of A Surface Of A Sample App 20180031415 - HAITJEMA; Han ; et al.	2018-02-01
Interference Measuring Device And Method Of Measurement Using The Same Device App 20170363411 - Nagahama; Tatsuya ; et al.	2017-12-21
Image sequence and evaluation method and system for structured illumination microscopy Grant 9,568,304 - Haitjema , et al. February 14, 2	2017-02-14
Method and apparatus for determining a property of a surface Grant 9,103,651 - Haitjema , et al. August 11, 2	2015-08-11
Image Sequence And Evaluation Method And System For Structured Illumination Microscopy App 20150219441 - HAITJEMA; Han ; et al.	2015-08-06
Interferometer System And Method To Generate An Interference Signal Of A Surface Of A Sample App 20140362383 - HAITJEMA; Han ; et al.	2014-12-11
Method And Apparatus For Determining A Property Of A Surface App 20130335747 - HAITJEMA; Han ; et al.	2013-12-19

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