loadpatents
Patent applications and USPTO patent grants for Hahn-Meitner-Institut fur Kernforschung Berlin GmbH.The latest application filed is for "microwave measuring and apparatus for contactless non-destructive testing of photosensitive materials".
Patent | Date |
---|---|
Microwave measuring and apparatus for contactless non-destructive testing of photosensitive materials Grant 4,704,576 - Tributsch , et al. November 3, 1 | 1987-11-03 |
System for optimizing process parameters in photoactive semiconductor manufacturing in-situ Grant 4,700,311 - Tributsch , et al. October 13, 1 | 1987-10-13 |
Photoelectrochemical solar cell and method of fabricating a substrate for such a cell Grant 4,601,960 - Menezes , et al. July 22, 1 | 1986-07-22 |
Generator for producing high-voltage rectangular pulses Grant 4,547,679 - Hansen , et al. October 15, 1 | 1985-10-15 |
Method of enhancing the electron yield during photoionization of a sensibilizer Grant 4,032,477 - Gratzel June 28, 1 | 1977-06-28 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.