Hafed; Mohamed M.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hafed; Mohamed M..The latest application filed is for "methods of parametric testing in digital circuits".

Company Profile

0.7.9

Hafed; Mohamed M. - Montreal CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
High-speed transceiver tester incorporating jitter injection Grant 8,327,204 - Hafed , et al. December 4, 2	2012-12-04
Methods of parametric testing in digital circuits Grant 8,244,492 - Hafed August 14, 2	2012-08-14
Methods of Parametric Testing in Digital Circuits App 20110161755 - Hafed; Mohamed M.	2011-06-30
Systems and methods for testing and diagnosing delay faults and for parametric testing in digital circuits Grant 7,917,319 - Hafed March 29, 2	2011-03-29
High-speed signal testing system having oscilloscope functionality Grant 7,813,297 - Hafed October 12, 2	2010-10-12
Signal Integrity Measurement Systems and Methods Using a Predominantly Digital Time-Base Generator App 20100138695 - Hafed; Mohamed M.	2010-06-03
Signal integrity measurement systems and methods using a predominantly digital time-base generator Grant 7,681,091 - Hafed March 16, 2	2010-03-16
Systems and Methods for Testing and Diagnosing Delay Faults and For Parametric Testing in Digital Circuits App 20090198461 - Hafed; Mohamed M.	2009-08-06
System and Method for Physical-Layer Testing of High-Speed Serial Links in their Mission Environments App 20080192814 - Hafed; Mohamed M. ; et al.	2008-08-14
Signal Integrity Measurement Systems and Methods Using a Predominantly Digital Time-Base Generator App 20080048726 - Hafed; Mohamed M.	2008-02-28
High-Speed Signal Testing System Having Oscilloscope Functionality App 20080013456 - Hafed; Mohamed M.	2008-01-17
System and method for generating a jittered test signal Grant 7,315,574 - Hafed , et al. January 1, 2	2008-01-01
System and method for testing integrated circuits Grant 7,242,209 - Roberts , et al. July 10, 2	2007-07-10
High-Speed Transceiver Tester Incorporating Jitter Injection App 20070113119 - Hafed; Mohamed M. ; et al.	2007-05-17
System and method for generating a jittered test signal App 20050271131 - Hafed, Mohamed M. ; et al.	2005-12-08
System and method for testing integrated circuits App 20050253617 - Roberts, Gordon W. ; et al.	2005-11-17

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