| Patent | Date |
|---|
Semiconductor Device And Method Of Manufacturing Same
App 20140252441 - HACHISUKA; Atsushi ; et al. | 2014-09-11 |
Semiconductor Device And Method Of Manufacturing Same
App 20120056302 - HACHISUKA; Atsushi ; et al. | 2012-03-08 |
Semiconductor device and method of manufacturing same
Grant 8,072,074 - Hachisuka , et al. December 6, 2 | 2011-12-06 |
Semiconductor Device And Method Of Manufacturing Same
App 20110095349 - HACHISUKA; Atsushi ; et al. | 2011-04-28 |
Semiconductor device and method of manufacturing same
Grant 7,884,480 - Hachisuka , et al. February 8, 2 | 2011-02-08 |
Semiconductor device and method of manufacturing same
Grant 7,563,668 - Hachisuka , et al. July 21, 2 | 2009-07-21 |
Semiconductor Device And Method Of Manufacturing Same
App 20090008693 - HACHISUKA; Atsushi ; et al. | 2009-01-08 |
Semiconductor Device And Method Of Manufacturing Same
App 20070059885 - Hachisuka; Atsushi ; et al. | 2007-03-15 |
Semiconductor device having a capacitor and method of manufacturing the same
Grant 7,145,240 - Hachisuka , et al. December 5, 2 | 2006-12-05 |
Semiconductor device and method of manufacturing semiconductor device
App 20050009269 - Shinkawata, Hiroki ; et al. | 2005-01-13 |
Semiconductor device and manufacturing method thereof
App 20040232512 - Hasunuma, Eiji ; et al. | 2004-11-25 |
Semiconductor device and manufacturing method thereof
Grant 6,798,006 - Amo , et al. September 28, 2 | 2004-09-28 |
Method for manufacturing semiconductor device and semiconductor device manufactured thereby
Grant 6,784,066 - Hachisuka August 31, 2 | 2004-08-31 |
Semiconductor device having interconnection structure
Grant 6,765,251 - Hasunuma , et al. July 20, 2 | 2004-07-20 |
Semiconductor Device And Manufacturing Method Thereof
App 20040129963 - Amo, Atsushi ; et al. | 2004-07-08 |
Semiconductor device and method of manufacturing same
App 20040065958 - Hachisuka, Atsushi ; et al. | 2004-04-08 |
Method of manufacturing semiconductor device
App 20040067616 - Hachisuka, Atsushi ; et al. | 2004-04-08 |
Semiconductor Device And Manufacturing Method Thereof
App 20040046215 - HASUNUMA, EIJI ; et al. | 2004-03-11 |
Method of exposing semiconductor device
App 20040009431 - Amo, Atsushi ; et al. | 2004-01-15 |
Method of manufacturing semiconductor device
App 20030215997 - Hachisuka, Atsushi ; et al. | 2003-11-20 |
Method for manufacturing semiconductor device and semiconductor device manufactured thereby
App 20020123181 - Hachisuka, Atsushi | 2002-09-05 |
Registration accuracy measurement mark, method of repairing defect of the mark, photomask having the mark, method of manufacturing the photo mask and method of exposure thereof
Grant 6,323,560 - Narimatsu , et al. November 27, 2 | 2001-11-27 |
Semiconductor device having a metallic fuse member and cutting method thereof with laser light
Grant 6,163,062 - Shiratake , et al. December 19, 2 | 2000-12-19 |
Semiconductor device with sidewall insulating layers in the capacitor contact hole
Grant 6,160,284 - Hachisuka , et al. December 12, 2 | 2000-12-12 |
Registration accuracy measurement mark, method of repairing defect of the mark, photomask having the mark, method of manufacturing the photomask and method of exposure thereof
Grant 6,068,952 - Narimatsu , et al. May 30, 2 | 2000-05-30 |
Method of manufacturing stacked capacitors in a DRAM with reduced isolation region between adjacent capacitors
Grant 5,798,289 - Ajika , et al. August 25, 1 | 1998-08-25 |
Field effect transistor having impurity regions of different depths and manufacturing method thereof
Grant 5,672,533 - Arima , et al. September 30, 1 | 1997-09-30 |
Method of manufacturing a wiring layer for use in a semiconductor device having a plurality of conductive layers
Grant 5,627,093 - Hachisuka , et al. May 6, 1 | 1997-05-06 |
Composite wiring layer
Grant 5,502,324 - Hachisuka , et al. March 26, 1 | 1996-03-26 |
Field effect transistor having impurity regions of different depths and manufacturing method thereof
Grant 5,489,791 - Arima , et al. February 6, 1 | 1996-02-06 |
Semiconductor memory device with contact region intermediate memory cell and peripheral circuit
Grant 5,448,512 - Hachisuka , et al. September 5, 1 | 1995-09-05 |
Dynamic random access memory having stacked type capacitor and manufacturing method therefor
Grant 5,434,439 - Ajika , et al. July 18, 1 | 1995-07-18 |
Semiconductor memory device having cylindrical capacitor and manufacturing method thereof
Grant 5,408,114 - Kinoshita , et al. April 18, 1 | 1995-04-18 |
Dynamic random access memory having stacked type capacitor and manufacturing method therefor
Grant 5,381,365 - Ajika , et al. January 10, 1 | 1995-01-10 |
Method of manufacturing a semiconductor memory device with multiple device forming regions
Grant 5,364,811 - Ajika , et al. November 15, 1 | 1994-11-15 |
Semiconductor device having contact between wiring layer and impurity region
Grant 5,281,838 - Okumura , et al. January 25, 1 | 1994-01-25 |
Method of manufacturing semiconductor device having interconnection layer contacting source/drain regions
Grant 5,240,872 - Motonami , et al. August 31, 1 | 1993-08-31 |
Semiconductor device having gate electrode spacing dependent upon gate side wall insulating dimension
Grant 5,233,212 - Ohi , et al. August 3, 1 | 1993-08-03 |
Semiconductor device having interconnection layer contacting source/drain regions
Grant 5,173,752 - Motonami , et al. December 22, 1 | 1992-12-22 |
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