| Patent | Date |
|---|
Ic Chip Package With Dummy Solder Structure Under Corner, And Related Method
App 20220059488 - NAYINI; Manish ; et al. | 2022-02-24 |
Heat Sink Configuration for Multi-Chip Module
App 20210407879 - PATEL; Janak ; et al. | 2021-12-30 |
IC chip package with dummy solder structure under corner, and related method
Grant 11,171,104 - Nayini , et al. November 9, 2 | 2021-11-09 |
Optimization of integrated circuit reliability
Grant 11,054,459 - Graas , et al. July 6, 2 | 2021-07-06 |
Optimization of integrated circuit reliability
Grant 10,996,259 - Graas , et al. May 4, 2 | 2021-05-04 |
Ic Chip Package With Dummy Solder Structure Under Corner, And Related Method
App 20210125952 - Nayini; Manish ; et al. | 2021-04-29 |
Optimization of integrated circuit reliability
Grant 10,989,754 - Graas , et al. April 27, 2 | 2021-04-27 |
Product performance test binning
Grant 10,794,952 - Bickford , et al. October 6, 2 | 2020-10-06 |
IC wafer for identification of circuit dies after dicing
Grant 10,700,013 - Liu , et al. | 2020-06-30 |
Optimization Of Integrated Circuit Reliability
App 20200141996 - Graas; Carole D. ; et al. | 2020-05-07 |
Optimization Of Integrated Circuit Reliability
App 20200072897 - Graas; Carole D. ; et al. | 2020-03-05 |
Optimization of integrated circuit reliability
Grant 10,564,214 - Graas , et al. Feb | 2020-02-18 |
Integrated circuit chip reliability qualification using a sample-specific expected fail rate
Grant 10,539,611 - Bickford , et al. Ja | 2020-01-21 |
Ic Wafer For Identification Of Circuit Dies After Dicing
App 20190214348 - Liu; Wen ; et al. | 2019-07-11 |
Methodology to prevent metal lines from current pulse damage
Grant 10,216,870 - Bickford , et al. Feb | 2019-02-26 |
Application of stress conditions for homogenization of stress samples in semiconductor product acceleration studies
Grant 10,168,685 - Burns , et al. J | 2019-01-01 |
Application of stress conditions for homogenization of stress samples in semiconductor product acceleration studies
Grant 10,162,325 - Burns , et al. Dec | 2018-12-25 |
Product Performance Test Binning
App 20180292456 - Bickford; Jeanne ; et al. | 2018-10-11 |
System and method for managing semiconductor manufacturing defects
Grant 10,089,161 - Bickford , et al. October 2, 2 | 2018-10-02 |
Product performance test binning
Grant 10,067,184 - Anemikos , et al. September 4, 2 | 2018-09-04 |
Burn-in power performance optimization
Grant 9,940,430 - Bickford , et al. April 10, 2 | 2018-04-10 |
Optimization Of Integrated Circuit Reliability
App 20180074114 - Graas; Carole D. ; et al. | 2018-03-15 |
System And Method For Managing Semiconductor Manufacturing Defects
App 20180074874 - Bickford; Jeanne P. S. ; et al. | 2018-03-15 |
Integrated Circuit Chip Reliability Qualification Using A Sample-specific Expected Fail Rate
App 20180052201 - Bickford; Jeanne P. ; et al. | 2018-02-22 |
Integrated circuit chip reliability qualification using a sample-specific expected fail rate
Grant 9,891,275 - Bickford , et al. February 13, 2 | 2018-02-13 |
System and method for managing semiconductor manufacturing defects
Grant 9,880,892 - Bickford , et al. January 30, 2 | 2018-01-30 |
On-chip usable life depletion meter and associated method
Grant 9,791,502 - Bickford , et al. October 17, 2 | 2017-10-17 |
Optimization Of Integrated Circuit Reliability
App 20170285094 - Graas; Carole D. ; et al. | 2017-10-05 |
Optimization of integrated circuit reliability
Grant 9,739,824 - Graas , et al. August 22, 2 | 2017-08-22 |
Resistance Measurement-dependent Integrated Circuit Chip Reliability Estimation
App 20170212165 - Bickford; Jeanne P. ; et al. | 2017-07-27 |
Methodology To Prevent Metal Lines From Current Pulse Damage
App 20170199949 - BICKFORD; JEANNE P. S. ; et al. | 2017-07-13 |
Burn-in Power Performance Optimization
App 20170161426 - Bickford; Jeanne P. ; et al. | 2017-06-08 |
Integrated circuit chip reliability using reliability-optimized failure mechanism targeting
Grant 9,639,645 - Bickford , et al. May 2, 2 | 2017-05-02 |
System and method for identifying operating temperatures and modifying of integrated circuits
Grant 9,625,325 - Bickford , et al. April 18, 2 | 2017-04-18 |
Scaling voltages in relation to die location
Grant 9,594,868 - Foreman , et al. March 14, 2 | 2017-03-14 |
Application Of Stress Conditions For Homogenization Of Stress Samples In Semiconductor Product Acceleration Studies
App 20170023924 - Burns; Mark A. ; et al. | 2017-01-26 |
Application Of Stress Conditions For Homogenization Of Stress Samples In Semiconductor Product Acceleration Studies
App 20170023640 - Burns; Mark A. ; et al. | 2017-01-26 |
Integrated Circuit Chip Reliability Qualification Using A Sample-specific Expected Fail Rate
App 20160377674 - Bickford; Jeanne P. ; et al. | 2016-12-29 |
Integrated Circuit Chip Reliability Using Reliability-optimized Failure Mechanism Targeting
App 20160371413 - Bickford; Jeanne P. ; et al. | 2016-12-22 |
Application of stress conditions for homogenization of stress samples in semiconductor product acceleration studies
Grant 9,506,977 - Burns , et al. November 29, 2 | 2016-11-29 |
Reliability-optimized selective voltage binning
Grant 9,489,482 - Bickford , et al. November 8, 2 | 2016-11-08 |
On-chip Usable Life Depletion Meter And Associated Method
App 20160320214 - Bickford; Jeanne P. ; et al. | 2016-11-03 |
Optimization Of Integrated Circuit Reliability
App 20160258994 - Graas; Carole D. ; et al. | 2016-09-08 |
Scaling voltages in relation to die location
Grant 9,430,603 - Foreman , et al. August 30, 2 | 2016-08-30 |
System And Method For Identifying Operating Temperatures And Modifying Of Integrated Circuits
App 20160240479 - Bickford; Jeanne P. ; et al. | 2016-08-18 |
Systems And Methods To Prevent Incorporation Of A Used Integrated Circuit Chip Into A Product
App 20160238653 - Bickford; Jeanne P. ; et al. | 2016-08-18 |
Optimization of integrated circuit reliability
Grant 9,395,403 - Graas , et al. July 19, 2 | 2016-07-19 |
System integrator and system integration method with reliability optimized integrated circuit chip selection
Grant 9,354,953 - Bickford , et al. May 31, 2 | 2016-05-31 |
System Integrator And System Integration Method With Reliability Optimized Integrated Circuit Chip Selection
App 20160026517 - Bickford; Jeanne P. ; et al. | 2016-01-28 |
Updating Reliability Predictions Using Manufacturing Assessment Data
App 20160019328 - Bickford; Jeanne P. ; et al. | 2016-01-21 |
Methods and circuits for generating physically unclonable function
Grant 9,202,554 - Chu , et al. December 1, 2 | 2015-12-01 |
Methods And Circuits For Generating Physically Unclonable Function
App 20150262653 - Chu; Albert M. ; et al. | 2015-09-17 |
Application Of Stress Conditions For Homogenization Of Stress Samples In Semiconductor Product Acceleration Studies
App 20150253376 - Burns; Mark A. ; et al. | 2015-09-10 |
System And Method For Managing Semiconductor Manufacturing Defects
App 20150241511 - Bickford; Jeanne P. S. ; et al. | 2015-08-27 |
System and method to predict chip IDDQ and control leakage components
Grant 9,117,045 - Spence Bickford , et al. August 25, 2 | 2015-08-25 |
Methods for normalizing strain in semicondcutor devices and strain normalized semiconductor devices
Grant 9,082,875 - Balch , et al. July 14, 2 | 2015-07-14 |
Semiconductor device reliability model and methodologies for use thereof
Grant 9,064,087 - Bickford , et al. June 23, 2 | 2015-06-23 |
In-situ computing system failure avoidance
Grant 9,058,250 - Bickford , et al. June 16, 2 | 2015-06-16 |
Optimization Of Integrated Circuit Reliability
App 20150115994 - Graas; Carole D. ; et al. | 2015-04-30 |
Semiconductor Device Reliability Model And Methodologies For Use Thereof
App 20150106780 - BICKFORD; Jeanne P. ; et al. | 2015-04-16 |
Reliability evaluation and system fail warning methods using on chip parametric monitors
Grant 8,949,767 - Bickford , et al. February 3, 2 | 2015-02-03 |
In-situ Computing System Failure Avoidance
App 20150033081 - Bickford; Jeanne P.S. ; et al. | 2015-01-29 |
Semiconductor device reliability model and methodologies for use thereof
Grant 8,943,444 - Bickford , et al. January 27, 2 | 2015-01-27 |
Semiconductor Device Reliability Model And Methodologies For Use Thereof
App 20140380261 - BICKFORD; Jeanne P. ; et al. | 2014-12-25 |
Reliability Evaluation And System Fail Warning Methods Using On Chip Parametric Monitors
App 20130326442 - Bickford; Jeanne P. ; et al. | 2013-12-05 |
Method and device for measuring integrated circuit power supply noise and calibration of power supply noise analysis models
Grant 8,521,500 - Arsovski , et al. August 27, 2 | 2013-08-27 |
Reliability evaluation and system fail warning methods using on chip parametric monitors
Grant 8,504,975 - Bickford , et al. August 6, 2 | 2013-08-06 |
Product Performance Test Binning
App 20130124133 - Anemikos; Theodoros ; et al. | 2013-05-16 |
Speed Binning For Dynamic And Adaptive Power Control
App 20130113514 - Anemikos; Theodoros E. ; et al. | 2013-05-09 |
Speed binning for dynamic and adaptive power control
Grant 8,421,495 - Anemikos , et al. April 16, 2 | 2013-04-16 |
Methods For Normalizing Strain In Semicondcutor Devices And Strain Normalized Semiconductor Devices
App 20130032894 - Balch; Bruce ; et al. | 2013-02-07 |
Methods for normalizing strain in semiconductor devices and strain normalized semiconductor devices
Grant 8,298,876 - Balch , et al. October 30, 2 | 2012-10-30 |
Reliability Evaluation And System Fail Warning Methods Using On Chip Parametric Monitors
App 20120105240 - Bickford; Jeanne P. ; et al. | 2012-05-03 |
Method And Device For Measuring Integrated Circuit Power Supply Noise And Calibration Of Power Supply Noise Analysis Models
App 20120049947 - Arsovski; Igor ; et al. | 2012-03-01 |
Measurement methodology and array structure for statistical stress and test of reliabilty structures
Grant 8,120,356 - Agarwal , et al. February 21, 2 | 2012-02-21 |
Phase change material based temperature sensor
Grant 8,114,686 - Habib , et al. February 14, 2 | 2012-02-14 |
Reliability evaluation and system fail warning methods using on chip parametric monitors
Grant 8,095,907 - Bickford , et al. January 10, 2 | 2012-01-10 |
Multicore processor having storage for core-specific operational data
Grant 8,055,822 - Bernstein , et al. November 8, 2 | 2011-11-08 |
Voltage island performance/leakage screen monitor for IP characterization
Grant 8,020,138 - Balch , et al. September 13, 2 | 2011-09-13 |
Design System And Method That, During Timing Analysis, Compensates For Regional Timing Variations
App 20110107291 - Barwin; John E. ; et al. | 2011-05-05 |
Methods, apparatus, and program products to optimize semiconductor product yield prediction for performance and leakage screens
Grant 7,917,451 - Barnett , et al. March 29, 2 | 2011-03-29 |
HDL design structure for integrating test structures into an integrated circuit design
Grant 7,884,599 - Habib , et al. February 8, 2 | 2011-02-08 |
Circuit and method using distributed phase change elements for across-chip temperature profiling
Grant 7,882,455 - Habib , et al. February 1, 2 | 2011-02-01 |
Array-based early threshold voltage recovery characterization measurement
Grant 7,868,640 - Agarwal , et al. January 11, 2 | 2011-01-11 |
Measurement Methodology And Array Structure For Statistical Stress And Test Of Reliabilty Structures
App 20100318313 - Agarwal; Kanak B. ; et al. | 2010-12-16 |
Phase Change Material Based Temperature Sensor
App 20100254425 - Habib; Nazmul ; et al. | 2010-10-07 |
Methods for Normalizing Strain in Semiconductor Devices and Strain Normalized Semiconductor Devices
App 20100244132 - Balch; Bruce ; et al. | 2010-09-30 |
Across reticle variation modeling and related reticle
Grant 7,803,644 - Balch , et al. September 28, 2 | 2010-09-28 |
Phase change material based temperature sensor
Grant 7,795,605 - Habib , et al. September 14, 2 | 2010-09-14 |
Testing method using a scalable parametric measurement macro
Grant 7,656,182 - Bickford , et al. February 2, 2 | 2010-02-02 |
System for and method of integrating test structures into an integrated circuit
Grant 7,653,888 - Habib , et al. January 26, 2 | 2010-01-26 |
Voltage Island Performance/leakage Screen Monitor For Ip Characterization
App 20090295402 - Balch; Bruce ; et al. | 2009-12-03 |
Circuit And Method Using Distributed Phase Change Elements For Across-Chip Temperature Profiling
App 20090282375 - Habib; Nazmul ; et al. | 2009-11-12 |
Array-Based Early Threshold Voltage Recovery Characterization Measurement
App 20090251167 - Agarwal; Kanak B. ; et al. | 2009-10-08 |
Methods, Apparatus, And Program Products To Optimize Semiconductor Product Yield Prediction For Performance And Leakage Screens
App 20090234777 - Barnett; Thomas S. ; et al. | 2009-09-17 |
Method To Reduce Test Probe Damage From Excessive Device Leakage Currents
App 20090224792 - Bickford; Jeanne Paulette Spence ; et al. | 2009-09-10 |
System And Method To Predict Chip Iddq And Control Leakage Components
App 20090210201 - Bickford; Jeanne P. Spence ; et al. | 2009-08-20 |
Method of acceptance for semiconductor devices
Grant 7,560,946 - Bickford , et al. July 14, 2 | 2009-07-14 |
Reliability Evaluation And System Fail Warning Methods Using On Chip Parametric Monitors
App 20090106712 - Bickford; Jeanne P. ; et al. | 2009-04-23 |
Embedded test circuit for testing integrated circuits at the die level
Grant 7,512,915 - Anand , et al. March 31, 2 | 2009-03-31 |
System For And Method Of Integrating Test Structures Into An Integrated Circuit
App 20090083690 - Habib; Nazmul ; et al. | 2009-03-26 |
Across Reticle Variation Modeling And Related Reticle
App 20090068772 - Balch; Bruce W. ; et al. | 2009-03-12 |
Method For Generating Device Model Overrides Through The Use Of On-chip Parametric Measurement Macros
App 20090070722 - Bickford; Jeanne ; et al. | 2009-03-12 |
Multicore Processor Having Storage for Core-Specific Operational Data
App 20090055826 - Bernstein; Kerry ; et al. | 2009-02-26 |
Method of Acceptance for Semiconductor Devices
App 20090039912 - Bickford; Jeanne Paulette Spence ; et al. | 2009-02-12 |
Parametric-based semiconductor design
Grant 7,487,477 - Bickford , et al. February 3, 2 | 2009-02-03 |
Phase Change Material Based Temperature Sensor
App 20090001336 - Habib; Nazmul ; et al. | 2009-01-01 |
System for and Method of Integrating Test Structures into an Integrated Circuit
App 20080270954 - Habib; Nazmul ; et al. | 2008-10-30 |
Embedded Test Circuit For Testing Integrated Circuits At The Die Level
App 20080270951 - Anand; Darren ; et al. | 2008-10-30 |
Testing Method Using A Scalable Parametric Measurement Macro
App 20080231307 - Bickford; Jeanne P. ; et al. | 2008-09-25 |
Method in a Computer-aided Design System for Generating a Functional Design Model of a Test Structure
App 20080222584 - Habib; Nazmul ; et al. | 2008-09-11 |
HDL Design Structure for Integrating Test Structures into an Integrated Circuit Design
App 20080189671 - Habib; Nazmul ; et al. | 2008-08-07 |
Parametric-based Semiconductor Design
App 20080148197 - Bickford; Jeanne Paulette Spence ; et al. | 2008-06-19 |
System for acquiring device parameters
Grant 7,382,149 - Anand , et al. June 3, 2 | 2008-06-03 |
A System For Acquiring Device Parameters
App 20080018356 - Anand; Darren L ; et al. | 2008-01-24 |
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