Haarstrich; Jakob

Patent Applications and Registrations

Patent applications and USPTO patent grants for Haarstrich; Jakob.The latest application filed is for "method for determining the thickness and refractive index of a layer".

Company Profile

2.4.4

Haarstrich; Jakob - Jena DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method for determining the thickness and refractive index of a layer using a shape feature during analysis Grant 11,371,831 - Langholz , et al. June 28, 2	2022-06-28
Method for generating an overview image using a large aperture objective Grant 11,327,288 - Haarstrich , et al. May 10, 2	2022-05-10
Illumination apparatus for a microscope, method for operating it, and microscope having an illumination apparatus Grant 11,314,068 - Kalkbrenner , et al. April 26, 2	2022-04-26
Method for Determining the Thickness and Refractive Index of a Layer App 20210293530 - LANGHOLZ; Nils ; et al.	2021-09-23
Method for generating an overview image using a large aperture objective App 20210239961 - Haarstrich; Jakob ; et al.	2021-08-05
Method and arrangement for acquiring image data Grant 10,841,506 - Liedtke , et al. November 17, 2	2020-11-17
Illumination apparatus for a microscope, method for operating it, and microscope having an illumination apparatus App 20200096752 - Kalkbrenner; Thomas ; et al.	2020-03-26
Method and Arrangement for Acquiring Image Data App 20190208105 - LIEDTKE; Mirko ; et al.	2019-07-04

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