GUNJI; Yasuhiro

Patent Applications and Registrations

Patent applications and USPTO patent grants for GUNJI; Yasuhiro.The latest application filed is for "composition for a sealing member, and sealing member".

Company Profile

2.30.34

GUNJI; Yasuhiro - Tokyo JP
Gunji; Yasuhiro - Chiyoda-ku JP
Gunji; Yasuhiro - Hitachiota N/A JP
Gunji; Yasuhiro - Hitachiohta JP
GUNJI; Yasuhiro - Ibaraki JP
Gunji; Yasuhiro - Hitachioota JP
Gunji; Yasuhiro - Funabashi JP
Gunji, Yasuhiro - Hitachioota-shi JP
Gunji; Yasuhiro - Chiba JP
Gunji, Yasuhiro - Funabashi-shi JP
Gunji; Yasuhiro - Hitachi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Composition For A Sealing Member, And Sealing Member App 20200056029 - IRIE; Shiori ; et al.	2020-02-20
Sealing Member App 20200040175 - OWADA; Akihiro ; et al.	2020-02-06
Modified epoxy resin composition Grant 9,598,528 - Gunji , et al. March 21, 2	2017-03-21
Heat-resistant water-soluble flux composition for soldering Grant 8,900,376 - Gunji , et al. December 2, 2	2014-12-02
Circuit pattern inspecting apparatus, management system including circuit pattern inspecting apparatus, and method for inspecting circuit pattern Grant 8,565,509 - Takahashi , et al. October 22, 2	2013-10-22
Charged particle beam device for scanning a sample using a charged particle beam to inspect the sample Grant 8,421,010 - Hiroi , et al. April 16, 2	2013-04-16
Semiconductor device inspection apparatus Grant 8,242,443 - Ominami , et al. August 14, 2	2012-08-14
Charged particle beam apparatus Grant 8,207,513 - Sasaki , et al. June 26, 2	2012-06-26
Charged particle beam apparatus, and image generation method with charged particle beam apparatus Grant 8,168,950 - Furuhashi , et al. May 1, 2	2012-05-01
Charged-particle Microscope Device, And Method Of Controlling Charged-particle Beams App 20120091339 - Ominami; Yusuke ; et al.	2012-04-19
Appearance inspection apparatus with scanning electron microscope and image data processing method using scanning electron microscope Grant 8,086,021 - Ominami , et al. December 27, 2	2011-12-27
Electron beam inspection system and an image generation method for an electron beam inspection system Grant 8,086,022 - Miyai , et al. December 27, 2	2011-12-27
Circuit Pattern Inspecting Apparatus, Management System Including Circuit Pattern Inspecting Apparatus, And Method For Inspecting Circuit Pattern App 20110255773 - Takahashi; Hiroyuki ; et al.	2011-10-20
Inspection apparatus and inspection method using electron beam Grant 7,999,565 - Gunji , et al. August 16, 2	2011-08-16
Charged Particle Beam Device App 20110163230 - Hiroi; Takashi ; et al.	2011-07-07
Semiconductor Device Inspection Apparatus App 20100314542 - OMINAMI; Yusuke ; et al.	2010-12-16
Semiconductor device inspection apparatus Grant 7,838,828 - Ominami , et al. November 23, 2	2010-11-23
Charged Particle Beam Apparatus App 20100051806 - Sasaki; Yuko ; et al.	2010-03-04
Apparatus For Inspecting A Substrate, A Method Of Inspecting A Substrate, A Scanning Electron Microscope, And A Method Of Producing An Image Using A Scanning Electron Microscope App 20090309022 - GUNJI; Yasuhiro ; et al.	2009-12-17
Pattern Inspection Method And Inspection Apparatus App 20090206257 - GUNJI; Yasuhiro ; et al.	2009-08-20
Apperance Inspection Apparatus With Scanning Electron Microscope And Image Data Processing Method Using Scanning Electron Microscope App 20090208092 - Ominami; Yusuke ; et al.	2009-08-20
Charged Particle Beam Apparatus, And Image Generation Method With Charged Particle Beam Apparatus App 20090134340 - FURUHASHI; Kanji ; et al.	2009-05-28
Inspection Apparatus And Inspection Method Using Electron Beam App 20090123059 - GUNJI; Yasuhiro ; et al.	2009-05-14
Inspection apparatus and inspection method using electron beam Grant 7,518,383 - Gunji , et al. April 14, 2	2009-04-14
Electron Beam Inspection System and an Image Generation Method for an Electron Beam Inspection System App 20090026369 - MIYAI; Hiroshi ; et al.	2009-01-29
Semiconductor Device Inspection Apparatus App 20080308725 - Ominami; Yusuke ; et al.	2008-12-18
Pattern inspection method and apparatus using electron beam Grant 7,439,504 - Hiroi , et al. October 21, 2	2008-10-21
Charged particle beam apparatus and automatic astigmatism adjustment method Grant 7,348,558 - Watanabe , et al. March 25, 2	2008-03-25
Heat-Resistant Water-Soluble Flux Composition for Soldering App 20080066830 - Gunji; Yasuhiro ; et al.	2008-03-20
Modified Epoxy Resin Composition App 20070249760 - Gunji; Yasuhiro ; et al.	2007-10-25
Inspection method and inspection apparatus using electron beam Grant 7,271,385 - Gunji , et al. September 18, 2	2007-09-18
Charged particle beam apparatus and automatic astigmatism adjustment method App 20060289751 - Watanabe; Masahiro ; et al.	2006-12-28
Inspection Apparatus And Inspection Method Using Electron Beam App 20060251318 - GUNJI; Yasuhiro ; et al.	2006-11-09
Charged particle beam apparatus App 20060151698 - Sasaki; Yuko ; et al.	2006-07-13
Charged particle beam apparatus and automatic astigmatism adjustment method Grant 7,030,394 - Watanabe , et al. April 18, 2	2006-04-18
Inspection method and inspection apparatus using electron beam App 20060076490 - Gunji; Yasuhiro ; et al.	2006-04-13
Charged-particle beam apparatus and method for automatically correcting astigmatism and for height detection App 20060060781 - Watanabe; Masahiro ; et al.	2006-03-23
Pattern inspection method and apparatus using electron beam App 20050263703 - Hiroi, Takashi ; et al.	2005-12-01
Pattern inspection method and apparatus using electron beam Grant 6,940,069 - Hiroi , et al. September 6, 2	2005-09-06
Method for reducing an organic solvent remaining in .beta.-form tris- (2,3,-epoxypropyl)--isocyanurate crystals Grant 6,903,212 - Ikeda , et al. June 7, 2	2005-06-07
Charged particle beam apparatus and automatic astigmatism adjustment method App 20050092930 - Watanabe, Masahiro ; et al.	2005-05-05
Inspection method and inspection apparatus using electron beam App 20050040331 - Gunji, Yasuhiro ; et al.	2005-02-24
Charged particle beam apparatus and automatic astigmatism adjustment method Grant 6,825,480 - Watanabe , et al. November 30, 2	2004-11-30
Map displaying method and apparatus, and navigation system having the map displaying apparatus Grant 6,714,861 - Okude , et al. March 30, 2	2004-03-30
Inspection method and inspection apparatus using electron beam App 20040026633 - Gunji, Yasuhiro ; et al.	2004-02-12
Pattern inspection method and apparatus using electron beam App 20040028272 - Hiroi, Takashi ; et al.	2004-02-12
Information display system for displaying specified location with map therearound on display equipment App 20040012506 - Fujiwara, Toshio ; et al.	2004-01-22
Information display system for displaying specified location with map therearound on display equipment App 20030201914 - Fujiwara, Toshio ; et al.	2003-10-30
Pattern inspection method and apparatus using electron beam Grant 6,614,022 - Hiroi , et al. September 2, 2	2003-09-02
Method for reducing organic solvents remaining in tris-(2,3-epoxypropyl)-isocyanurate crystals Grant 6,605,718 - Ikeda , et al. August 12, 2	2003-08-12
Charged-particle beam apparatus and method for automatically correcting astigmatism of charged-particle beam apparatus App 20030006371 - Watanabe, Masahiro ; et al.	2003-01-09
Inspecting System Using Electron Beam And Inspecting Method Using Same App 20020117619 - Gunji, Yasuhiro ; et al.	2002-08-29
Method for reducing an organic solvent remaining in beta-form tris- (2,3,-epoxypropyl) - isocyanurate crystals App 20020045752 - Ikeda, Hisao ; et al.	2002-04-18
Map displaying method and apparatus, and navigation system having the map displaying apparatus App 20020038181 - Okude, Mariko ; et al.	2002-03-28
Pattern inspection method and apparatus using electron beam App 20020030166 - Hiroi, Takashi ; et al.	2002-03-14
Method for reducing organic solvents remaining in tris-(2,3-epoxypropyl)-i- socyanurate crystals App 20010018517 - Ikeda, Hisao ; et al.	2001-08-30
Map displaying method and apparatus, and navigation system having the map displaying apparatus Grant 6,175,802 - Okude , et al. January 16, 2	2001-01-16
Navigation system furnished with means for estimating error of mounted sensor Grant 6,081,230 - Hoshino , et al. June 27, 2	2000-06-27
Vehicle control system, vehicle mounting apparatus, base station apparatus and vehicle control method Grant 5,926,117 - Gunji , et al. July 20, 1	1999-07-20
Optical change-over switch utilizing ferroelectric liquid crystal material Grant 4,836,657 - Gunji , et al. June 6, 1	1989-06-06

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