Gunda; Arun

Patent Applications and Registrations

Patent applications and USPTO patent grants for Gunda; Arun.The latest application filed is for "dft technique to apply a variable scan clock including a scan clock modifier on an ic".

Company Profile

0.6.7

Gunda; Arun - San Jose CA US

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Test technique to apply a variable scan clock including a scan clock modifier on an integrated circuit Grant 8,418,008 - Chakravarty , et al. April 9, 2	2013-04-09
Dft Technique To Apply A Variable Scan Clock Including A Scan Clock Modifier On An Ic App 20100162060 - Chakravarty; Sreejit ; et al.	2010-06-24
Method for implementing test generation for systematic scan reconfiguration in an integrated circuit Grant 7,555,688 - Alvamani , et al. June 30, 2	2009-06-30
Method and system for improving quality of a circuit through non-functional test pattern identification Grant 7,461,315 - Gunda , et al. December 2, 2	2008-12-02
System and method for improving transition delay fault coverage in delay fault tests through use of an enhanced scan flip-flop Grant 7,461,307 - Gunda , et al. December 2, 2	2008-12-02
System and method for improving transition delay fault coverage in delay fault tests through use of transition launch flip-flop Grant 7,293,210 - Gunda , et al. November 6, 2	2007-11-06
Method and system for improving quality of a circuit through non-functional test pattern identification App 20060253751 - Gunda; Arun ; et al.	2006-11-09
System and method for improving transition delay fault coverage in delay fault tests through use of transition launch flip-flop App 20060253754 - Gunda; Arun ; et al.	2006-11-09
System and method for improving transition delay fault coverage in delay fault tests through use of an enhanced scan flip-flop App 20060253753 - Gunda; Arun ; et al.	2006-11-09
Systematic scan reconfiguration App 20060242515 - Alvamani; Ahmad A. ; et al.	2006-10-26
Method of testing scan chain integrity and tester setup for scan block testing App 20060136795 - Gunda; Arun ; et al.	2006-06-22
Method of grouping scan flops based on clock domains for scan testing App 20050091622 - Pappu, Krishna K. ; et al.	2005-04-28

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