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Patent applications and USPTO patent grants for Guarin; Fernando J..The latest application filed is for "method of operating transistors and structures thereof for improved reliability and lifetime".
Patent | Date |
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Method of operating transistors and structures thereof for improved reliability and lifetime Grant 8,159,814 - Wang , et al. April 17, 2 | 2012-04-17 |
Method Of Operating Transistors And Structures Thereof For Improved Reliability And Lifetime App 20100182729 - Wang; Ping-Chuan ;   et al. | 2010-07-22 |
Method and circuit for element wearout recovery Grant 6,958,621 - La Rosa , et al. October 25, 2 | 2005-10-25 |
Method and circuit for element wearout recovery App 20050116739 - Rosa, Giuseppe La ;   et al. | 2005-06-02 |
Line monitoring of negative bias temperature instabilities by hole injection methods Grant 6,521,469 - La Rosa , et al. February 18, 2 | 2003-02-18 |
Method and structure for in-line monitoring of negative bias temperature instability in field effect transistors Grant 6,456,104 - Guarin , et al. September 24, 2 | 2002-09-24 |
Layered structure of a substrate, a dielectric layer and a single crystal layer Grant 5,563,428 - Ek , et al. October 8, 1 | 1996-10-08 |
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