GRZELA; Grzegorz

Patent Applications and Registrations

Patent applications and USPTO patent grants for GRZELA; Grzegorz.The latest application filed is for "metrology method".

Company Profile

10.6.11

GRZELA; Grzegorz - Eindhoven NL
Grzela; Grzegorz - Utrecht NL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Metrology Method App 20220075276 - MATHIJSSEN; Simon Gijsbert Josephus ; et al.	2022-03-10
Computational Metrology App 20210349395 - WARNAAR; Patrick ; et al.	2021-11-11
Metrology Apparatus And Method For Determining A Characteristic Of One Or More Structures On A Substrate App 20210325174 - TINNEMANS; Patricius Aloysius Jacobus ; et al.	2021-10-21
Computational metrology Grant 11,067,902 - Warnaar , et al. July 20, 2	2021-07-20
Metrology apparatus and method for determining a characteristic of one or more structures on a substrate Grant 11,009,343 - Tinnemans , et al. May 18, 2	2021-05-18
Computational Metrology App 20200249576 - Kind Code	2020-08-06
Method of Measuring a Structure, Inspection Apparatus, Lithographic System and Device Manufacturing Method App 20200050114 - Bozkurt; Murat ; et al.	2020-02-13
Metrology method and apparatus and associated computer product Grant 10,551,750 - Urbanczyk , et al. Fe	2020-02-04
Metrology Apparatus and Method for Determining a Characteristic of One or More Structures on a Substrate App 20190378012 - Tripodi; Lorenzo ; et al.	2019-12-12
Method of measuring a structure, inspection apparatus, lithographic system and device manufacturing method Grant 10,481,506 - Bozkurt , et al. Nov	2019-11-19
Method of measuring a property of a substrate, inspection apparatus, lithographic system and device manufacturing method Grant 10,474,043 - Warnaar , et al. Nov	2019-11-12
Metrology Apparatus and Method for Determining a Characteristic of One or More Structures on a Substrate App 20190265028 - TINNEMANS; Patricius Aloysius Jacobus ; et al.	2019-08-29
Metrology Method and Apparatus and Associated Computer Product App 20190250520 - URBANCZYK; Adam Jan ; et al.	2019-08-15
Metrology method and apparatus and associated computer product Grant 10,310,388 - Urbanczyk , et al.	2019-06-04
Method of Measuring a Structure, Inspection Apparatus, Lithographic System and Device Manufacturing Method App 20180321599 - BOZKURT; Murat ; et al.	2018-11-08
Metrology Method and Apparatus and Associated Computer Product App 20180217508 - URBANCZYK; Adam ; et al.	2018-08-02
Method of Measuring a Property of a Substrate, Inspection Apparatus, Lithographic System and Device Manufacturing Method App 20180173105 - Warnaar; Patrick ; et al.	2018-06-21

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