GRUNZWEIG; Tzahi

Patent Applications and Registrations

Patent applications and USPTO patent grants for GRUNZWEIG; Tzahi.The latest application filed is for "fab management with dynamic sampling plans, optimized wafer measurement paths and optimized wafer transport, using quantum computing".

Company Profile

8.9.8

GRUNZWEIG; Tzahi - Hillsboro OR
Grunzweig; Tzahi - Timrat IL
Grunzweig; Tzahi - Yokneam IL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Fab Management With Dynamic Sampling Plans, Optimized Wafer Measurement Paths And Optimized Wafer Transport, Using Quantum Computing App 20210335638 - MANASSEN; Amnon ; et al.	2021-10-28
Rotated boundaries of stops and targets Grant 10,761,022 - Grunzweig , et al. Sep	2020-09-01
Utilizing overlay misregistration error estimations in imaging overlay metrology Grant 10,565,697 - Grunzweig , et al. Feb	2020-02-18
Fault discrimination and calibration of scatterometry overlay targets Grant 10,527,952 - Grunzweig , et al. J	2020-01-07
Identifying process variations during product manufacture Grant 10,379,449 - Grunzweig , et al. A	2019-08-13
Scatterometry overlay based on reflection peak locations Grant 10,365,230 - Amit , et al. July 30, 2	2019-07-30
Utilizing Overlay Misregistration Error Estimations In Imaging Overlay Metrology App 20190122357 - Grunzweig; Tzahi ; et al.	2019-04-25
Scatterometry system and method for generating non-overlapping and non-truncated diffraction images Grant 10,209,183 - Grunzweig , et al. Feb	2019-02-19
Identifying Process Variations During Product Manufacture App 20190033730 - GRUNZWEIG; Tzahi ; et al.	2019-01-31
Fault Discrimination and Calibration of Scatterometry Overlay Targets App 20180373167 - Grunzweig; Tzahi ; et al.	2018-12-27
Feed forward of metrology data in a metrology system Grant 9,903,711 - Levy , et al. February 27, 2	2018-02-27
Scatterometry System and Method for Generating Non-Overlapping and Non-Truncated Diffraction Images App 20180003630 - Grunzweig; Tzahi ; et al.	2018-01-04
Decreasing inaccuracy due to non-periodic effects on scatterometric signals Grant 9,851,300 - Bringoltz , et al. December 26, 2	2017-12-26
Scatterometry system and method for generating non-overlapping and non-truncated diffraction images Grant 9,719,920 - Grunzweig , et al. August 1, 2	2017-08-01
Feed Forward of Metrology Data in a Metrology System App 20160290796 - Levy; Ady ; et al.	2016-10-06
Rotated Boundaries Of Stops And Targets App 20160209327 - Grunzweig; Tzahi ; et al.	2016-07-21
Illumination Configurations For Scatterometry Measurements App 20150022822 - Grunzweig; Tzahi ; et al.	2015-01-22

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