loadpatents
name:-0.010126113891602
name:-0.012524127960205
name:-0.007627010345459
Gruber; Arndt Patent Filings

Gruber; Arndt

Patent Applications and Registrations

Patent applications and USPTO patent grants for Gruber; Arndt.The latest application filed is for "integrated dynamic random access memory chip".

Company Profile
0.4.8
  • Gruber; Arndt - Munich DE
  • Gruber; Arndt - Munchen DE
  • Gruber; Arndt - Muenchen DE
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Integrated semiconductor memory and method for operating an integrated semiconductor memory
Grant 7,248,536 - Schroeder , et al. July 24, 2
2007-07-24
Integrated semiconductor memory with redundant memory cells replaceable for either true or complementary defective memory cells
Grant 7,236,412 - Proll , et al. June 26, 2
2007-06-26
Integrated dynamic random access memory chip
App 20070140023 - Helfer; Wolfgang ;   et al.
2007-06-21
Integrated memory and method of repairing an integrated memory
Grant 7,058,851 - Schroder , et al. June 6, 2
2006-06-06
Integrated semiconductor memory and method for operating an integrated semiconductor memory
App 20060083100 - Schroeder; Stephan ;   et al.
2006-04-20
MRAM with improved storage and read out characteristics
App 20060067115 - Gruber; Arndt ;   et al.
2006-03-30
Semiconductor product having a first and at least one further semiconductor circuit and method
App 20050280036 - Schroeder, Stephan ;   et al.
2005-12-22
Integrated semiconductor memory having redundant memory cells
App 20050174863 - Proll, Manfred ;   et al.
2005-08-11
Integrated circuit, test structure and method for testing integrated circuits
Grant 6,618,303 - Gruber , et al. September 9, 2
2003-09-09
Integrated memory and method of repairing an integrated memory
App 20030101370 - Schroder, Stephan ;   et al.
2003-05-29
Integrated memory circuit and method for reading a data item from a memory cell
App 20030002351 - Beer, Peter ;   et al.
2003-01-02
Integrated circuit, test structure and method for testing integrated circuits
App 20020020854 - Gruber, Arndt ;   et al.
2002-02-21

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