| Patent | Date |
|---|
Clock edge grouping for at-speed test
Grant 8,538,718 - Grise , et al. September 17, 2 | 2013-09-17 |
Microcontroller for logic built-in self test (LBIST)
Grant 8,423,847 - Grise , et al. April 16, 2 | 2013-04-16 |
Microcontroller For Logic Built-in Self Test (lbist)
App 20120221910 - GRISE; Gary D. ; et al. | 2012-08-30 |
Microcontroller for logic built-in self test (LBIST)
Grant 8,205,124 - Grise , et al. June 19, 2 | 2012-06-19 |
Clock Edge Grouping For At-speed Test
App 20120150473 - Grise; Gary D. ; et al. | 2012-06-14 |
Integrated test waveform generator (TWG) and customer waveform generator (CWG), design structure and method
Grant 7,996,807 - Grise , et al. August 9, 2 | 2011-08-09 |
System and method for generating at-speed structural tests to improve process and environmental parameter space coverage
Grant 7,856,607 - Grise , et al. December 21, 2 | 2010-12-21 |
Functional frequency testing of integrated circuits
Grant 7,840,863 - Grise , et al. November 23, 2 | 2010-11-23 |
Functional frequency testing of integrated circuits
Grant 7,840,864 - Grise , et al. November 23, 2 | 2010-11-23 |
Method of increasing path coverage in transition test generation
Grant 7,793,176 - Grise , et al. September 7, 2 | 2010-09-07 |
Identifying sequential functional paths for IC testing methods and system
Grant 7,784,000 - Grise , et al. August 24, 2 | 2010-08-24 |
Design structure for shutting off data capture across asynchronous clock domains during at-speed testing
Grant 7,779,375 - Grise , et al. August 17, 2 | 2010-08-17 |
Apparatus and method for selectively implementing launch off scan capability in at speed testing
Grant 7,721,170 - Grise , et al. May 18, 2 | 2010-05-18 |
Functional Frequency Testing Of Integrated Circuits
App 20100088561 - Grise; Gary D. ; et al. | 2010-04-08 |
Functional Frequency Testing Of Integrated Circuits
App 20100088562 - Grise; Gary D. ; et al. | 2010-04-08 |
Method and apparatus for shutting off data capture across asynchronous clock domains during at-speed testing
Grant 7,685,542 - Grise , et al. March 23, 2 | 2010-03-23 |
IC chip at-functional-speed testing with process coverage evaluation
Grant 7,620,921 - Foreman , et al. November 17, 2 | 2009-11-17 |
Integrated Test Waveform Generator (twg) And Customer Waveform Generator (cwg), Design Structure And Method
App 20090265677 - Grise; Gary D. ; et al. | 2009-10-22 |
Indentifying Sequential Functional Paths For Ic Testing Methods And System
App 20090240459 - Grise; Gary D. ; et al. | 2009-09-24 |
System And Method For Generating At-speed Structural Tests To Improve Process And Environmental Parameter Space Coverage
App 20090119629 - Grise; Gary D. ; et al. | 2009-05-07 |
Design Structure For Shutting Off Data Capture Across Asynchronous Clock Domains During At-speed Testing
App 20090102507 - Grise; Gary D. ; et al. | 2009-04-23 |
Apparatus And Method For Selectively Implementing Launch Off Scan Capability In At Speed Testing
App 20090106608 - Grise; Gary D. ; et al. | 2009-04-23 |
Microcontroller For Logic Built-in Self Test (lbist)
App 20090055696 - Grise; Gary D. ; et al. | 2009-02-26 |
Microcontroller for logic built-in self test (LBIST)
Grant 7,490,280 - Grise , et al. February 10, 2 | 2009-02-10 |
Ic Chip At-functional-speed Testing With Process Coverage Evaluation
App 20080270953 - Foreman; Eric A. ; et al. | 2008-10-30 |
Method of Increasing Path Coverage in Transition Test Generation
App 20080250279 - Grise; Gary D. ; et al. | 2008-10-09 |
Method For Automatic Test Pattern Generation For One Test Constraint At A Time
App 20080222472 - Grise; Gary D. ; et al. | 2008-09-11 |
Method And Apparatus For Shutting Off Data Capture Across Asynchronous Clock Domains During At-speed Testing
App 20080195905 - Grise; Gary D. ; et al. | 2008-08-14 |
Scan Chain Circuitry That Enables Scan Testing At Functional Clock Speed
App 20080005634 - Grise; Gary D. ; et al. | 2008-01-03 |
Functional Frequency Testing Of Integrated Circuits
App 20070283201 - Grise; Gary D. ; et al. | 2007-12-06 |
Functional frequency testing of integrated circuits
Grant 7,290,191 - Grise , et al. October 30, 2 | 2007-10-30 |
Microcontroller For Logic Built-in Self Test (lbist)
App 20070204193 - Grise; Gary D. ; et al. | 2007-08-30 |
Clock control circuit for test that facilitates an at speed structural test
Grant 7,240,266 - Farmer , et al. July 3, 2 | 2007-07-03 |
Clock Control Circuit For Test That Facilitates An At Speed Structural Test
App 20060248417 - Farmer; Henry R. ; et al. | 2006-11-02 |
Clock Control Circuit For Test That Facilitates An At Speed Structural Test
App 20060190781 - Farmer; Henry R. ; et al. | 2006-08-24 |
Functional Frequency Testing Of Integrated Circuits
App 20060041802 - Grise; Gary D. ; et al. | 2006-02-23 |
Integrated heat exchanger for memory module
Grant 6,025,992 - Dodge , et al. February 15, 2 | 2000-02-15 |
Non-volatile memory cell having Si rich silicon nitride charge trapping layer
Grant 4,870,470 - Bass, Jr. , et al. September 26, 1 | 1989-09-26 |
Non-inverting non-volatile dynamic RAM cell
Grant 4,446,535 - Gaffney , et al. May 1, 1 | 1984-05-01 |
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