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name:-0.0034120082855225
name:-0.0075459480285645
name:-0.00041604042053223
Greene; John D. Patent Filings

Greene; John D.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Greene; John D..The latest application filed is for "methods and apparatus for optimization of inspection speed by generation of stage speed profile and selection of care areas for automated wafer inspection".

Company Profile
0.11.3
  • Greene; John D. - Santa Cruz CA US
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Methods and apparatus for optimization of inspection speed by generation of stage speed profile and selection of care areas for automated wafer inspection
Grant 9,780,004 - Greene October 3, 2
2017-10-03
Electron-optical system for high-speed and high-sensitivity inspections
Grant 8,664,594 - Jiang , et al. March 4, 2
2014-03-04
Multiple-beam system for high-speed electron-beam inspection
Grant 8,362,425 - Han , et al. January 29, 2
2013-01-29
Multiple-beam System For High-speed Electron-beam Inspection
App 20120241606 - Han; Liqun ;   et al.
2012-09-27
Methods And Apparatus For Optimization Of Inspection Speed By Generation Of Stage Speed Profile And Selection Of Care Areas For Automated Wafer Inspection
App 20120245861 - GREENE; John D.
2012-09-27
Apparatus and methods for optically inspecting a sample for anomalies
Grant 7,012,683 - Wolf , et al. March 14, 2
2006-03-14
Apparatus and methods for optically inspecting a sample for anomalies
App 20050092899 - Wolf, Ralph C. ;   et al.
2005-05-05
Apparatus and methods for optically inspecting a sample for anomalies
Grant 6,833,913 - Wolf , et al. December 21, 2
2004-12-21
Automatic high speed optical inspection system
Grant 5,131,755 - Chadwick , et al. * July 21, 1
1992-07-21
Automatic high speed optical inspection system
Grant 5,085,517 - Chadwick , et al. * February 4, 1
1992-02-04
Method and apparatus for optical inspection of substrates
Grant 4,877,326 - Chadwick , et al. October 31, 1
1989-10-31
Company Registrations

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