Greenberg; Ofir
Patent Applications and Registrations
Patent applications and USPTO patent grants for Greenberg; Ofir.The latest application filed is for "determining locations of suspected defects".
- Greenberg; Ofir - Haniel IL
| Patent | Date |
|---|---|
| Determining locations of suspected defects Grant 11,301,987 - Greenberg , et al. April 12, 2 | 2022-04-12 |
| Determining Locations Of Suspected Defects App 20210279848 - Greenberg; Ofir ; et al. | 2021-09-09 |
| Review of suspected defects using one or more reference dies Grant 9,673,022 - Greenberg , et al. June 6, 2 | 2017-06-06 |
| Review Of Suspected Defects Using One Or More Reference Dies App 20170018398 - Greenberg; Ofir ; et al. | 2017-01-19 |
| System and method for scanning an object Grant 9,490,101 - Gronau , et al. November 8, 2 | 2016-11-08 |
| System And Method For Scanning An Object App 20160276127 - Gronau; Yuval ; et al. | 2016-09-22 |
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