Grant; Ralph M.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Grant; Ralph M..The latest application filed is for "double exposure interferometric analysis of structures and employing ambient pressure stressing".
- Grant; Ralph M. - Rochester MI
- Grant; Ralph M. - Ann Arbor MI
| Patent | Date |
|---|---|
| Double exposure interferometric analysis of structures and employing ambient pressure stressing Grant 4,702,594 - Grant October 27, 1 | 1987-10-27 |
| Optical method and apparatus for strain analysis Grant 4,690,552 - Grant , et al. September 1, 1 | 1987-09-01 |
| Apparatus for the practice of double exposure interferometric non-destructive testing Grant 4,425,039 - Grant January 10, 1 | 1984-01-10 |
| Method and apparatus for interferometric deformation analysis Grant 4,139,302 - Hung , et al. February 13, 1 | 1979-02-13 |
| Beam ratio control for holography Grant 4,125,314 - Haskell , et al. November 14, 1 | 1978-11-14 |
| Holographic Method For Interferometric Measurement Of Material Corrosion And Erosion On Arbitrary Surfaces Grant 3,744,911 - Stetson , et al. July 10, 1 | 1973-07-10 |
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