loadpatents
name:-0.019134998321533
name:-0.023946762084961
name:-0.00051617622375488
Grant; David L. Patent Filings

Grant; David L.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Grant; David L..The latest application filed is for "system for directly measuring the depth of a high aspect ratio etched feature on a wafer".

Company Profile
0.17.10
  • Grant; David L. - Newbury Park CA US
  • Grant; David L. - Thousand Oaks CA
  • GRANT; David L - Houston TX
  • Grant; David L. - Houston TX
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Wafer shape thickness and trench measurement
Grant 9,714,825 - Marx , et al. July 25, 2
2017-07-25
System for directly measuring the depth of a high aspect ratio etched feature on a wafer
Grant 9,587,932 - Marx , et al. March 7, 2
2017-03-07
Methods and systems for use in grind shape control adaptation
Grant 9,457,446 - Brake , et al. October 4, 2
2016-10-04
System For Directly Measuring The Depth Of A High Aspect Ratio Etched Feature On A Wafer
App 20160238378 - Marx; David S. ;   et al.
2016-08-18
Powering Nodes
App 20160147271 - BROWN; Andrew ;   et al.
2016-05-26
Methods And Systems For Use In Grind Shape Control Adaptation
App 20140134923 - Brake; Thomas E. ;   et al.
2014-05-15
System For Directly Measuring The Depth Of A High Aspect Ratio Etched Feature On A Wafer
App 20140110582 - Marx; David S. ;   et al.
2014-04-24
System for directly measuring the depth of a high aspect ratio etched feature on a wafer
Grant 8,649,016 - Marx , et al. February 11, 2
2014-02-11
Wafer shape thickness and trench measurement
App 20120257207 - Marx; David S. ;   et al.
2012-10-11
System for directly measuring the depth of a high aspect ratio etched feature on a wafer
App 20110292375 - Marx; David S. ;   et al.
2011-12-01
System for directly measuring the depth of a high aspect ratio etched feature on a wafer
App 20100321671 - Marx; David S. ;   et al.
2010-12-23
Wafer measurement system and apparatus
Grant 7,738,113 - Marx , et al. June 15, 2
2010-06-15
Trench measurement system employing a chromatic confocal height sensor and a microscope
Grant 7,477,401 - Marx , et al. January 13, 2
2009-01-13
Wafer measurement system and apparatus
App 20070148792 - Marx; David S. ;   et al.
2007-06-28
Trench measurement system employing a chromatic confocal height sensor and a microscope
App 20060109483 - Marx; David S. ;   et al.
2006-05-25
Computer system and method for transferring data between multiple peer-level storage units
Grant 6,842,833 - Phillips , et al. January 11, 2
2005-01-11
Concentricity measuring instrument for a fiberoptic cable end
Grant 6,710,864 - Grant , et al. March 23, 2
2004-03-23
Data distribution in a disk array
Grant 6,505,268 - Schultz , et al. January 7, 2
2003-01-07
Cascaded removable media data storage system
App 20010047462 - Dimitroff, John E. ;   et al.
2001-11-29
Supporting a SCSI device on a non-SCSI transport medium of a network
Grant 6,209,023 - Dimitroff , et al. March 27, 2
2001-03-27
Method for developing physical disk drive specific commands from logical disk access commands for use in a disk array
Grant 5,909,691 - Schultz , et al. June 1, 1
1999-06-01
Method for developing physical disk drive specific commands from logical disk access commands for use in a disk array
Grant 5,592,648 - Schultz , et al. January 7, 1
1997-01-07
Method for developing physical disk drive specific commands from logical disk access commands for use in a disk array
Grant 5,440,716 - Schultz , et al. August 8, 1
1995-08-08
Method for controlling disk array operations by receiving logical disk requests and translating the requests to multiple physical disk specific commands
Grant 5,249,279 - Schmenk , et al. September 28, 1
1993-09-28
Method for restoring computer files, including improved steps for location of head clusters of files
Grant 4,941,059 - Grant July 10, 1
1990-07-10

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