Grady; Matthew S.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Grady; Matthew S..The latest application filed is for "real-time rule engine for adaptive testing of integrated circuits".

Company Profile

0.13.15

Grady; Matthew S. - Burlington VT

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Real-time rule engine for adaptive testing of integrated circuits Grant 9,336,109 - Atkinson , et al. May 10, 2	2016-05-10
Real-time rule engine for adaptive testing of integrated circuits Grant 9,311,201 - Atkinson , et al. April 12, 2	2016-04-12
Integrated circuit test optimization using adaptive test pattern sampling algorithm Grant 8,689,066 - Grady , et al. April 1, 2	2014-04-01
Real-time Rule Engine For Adaptive Testing Of Integrated Circuits App 20140059386 - Atkinson; David E. ; et al.	2014-02-27
Real-time Rule Engine For Adaptive Testing Of Integrated Circuits App 20140059382 - Atkinson; David E. ; et al.	2014-02-27
Integrated Circuit Test Optimization Using Adaptive Test Pattern Sampling Algorithm App 20130007546 - Grady; Matthew S. ; et al.	2013-01-03
Method for monitoring thermal control Grant 8,087,823 - Aube , et al. January 3, 2	2012-01-03
Method For Monitoring Thermal Control App 20100042355 - Aube; Francois ; et al.	2010-02-18
Method of adding fabrication monitors to integrated circuit chips Grant 7,620,931 - Adkisson , et al. November 17, 2	2009-11-17
Method of adding fabrication monitors to integrated circuit chips Grant 7,323,278 - Adkisson , et al. January 29, 2	2008-01-29
Method Of Adding Fabrication Monitors To Integrated Circuit Chips App 20080017857 - Adkisson; James W. ; et al.	2008-01-24
Method Of Adding Fabrication Monitors To Integrated Circuit Chips App 20070160920 - Adkisson; James W. ; et al.	2007-07-12
Method of adding fabrication monitors to integrated circuit chips Grant 7,240,322 - Adkisson , et al. July 3, 2	2007-07-03
Designing scan chains with specific parameter sensitivities to identify process defects Grant 7,194,706 - Adkisson , et al. March 20, 2	2007-03-20
Method Of Adding Fabrication Monitors To Integrated Circuit Chips App 20060225023 - Adkisson; James W. ; et al.	2006-10-05
Circuit and method for monitoring defects Grant 6,998,866 - Bazan , et al. February 14, 2	2006-02-14
Circuit And Method For Monitoring Defects App 20060022693 - Bazan; Greg ; et al.	2006-02-02
Designing Scan Chains With Specific Parameter Sensitivities to Identify Process Defects App 20060026472 - Adkisson; James W. ; et al.	2006-02-02
Signal pin tester for AC defects in integrated circuits App 20050172187 - Angelotti, Frank W. ; et al.	2005-08-04
Signal pin tester for AC defects in integrated circuits Grant 6,909,274 - Angelotti , et al. June 21, 2	2005-06-21
Method of statistical binning for reliability selection Grant 6,789,032 - Barbour , et al. September 7, 2	2004-09-07
Signal pin tester for AC defects in integrated circuits App 20040153919 - Angelotti, Frank W. ; et al.	2004-08-05
Method for burn-in testing App 20030151422 - Barnett, Thomas S. ; et al.	2003-08-14
Method of statistical binning for reliability selection App 20030120445 - Barbour, Tange N. ; et al.	2003-06-26
Signal pin tester for AC defects in integrated circuits App 20020079880 - Angelotti, Frank W. ; et al.	2002-06-27

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