| Patent | Date |
|---|
Tec-embedded Dummy Die To Cool The Bottom Die Edge Hotspot
App 20220199482 - CHIU; Chia-Pin ; et al. | 2022-06-23 |
Method, device and system for non-destructive detection of defects in a semiconductor die
Grant 11,346,818 - Pacheco , et al. May 31, 2 | 2022-05-31 |
Event-driven identity graph conflation
Grant 11,281,657 - Goyal , et al. March 22, 2 | 2022-03-22 |
Integrated cable probe design for high bandwidth RF testing
Grant 11,226,353 - Hu , et al. January 18, 2 | 2022-01-18 |
Method And Device For Failure Analysis Using Rf-based Thermometry
App 20210407833 - Kaira; Chandrashekara Shashank ; et al. | 2021-12-30 |
Method, Device And System For Non-destructive Detection Of Defects In A Semiconductor Die
App 20210364474 - Pacheco; Mario ; et al. | 2021-11-25 |
System and method for bootstrapping replicas from active partitions
Grant 11,138,077 - Brar , et al. October 5, 2 | 2021-10-05 |
Event-driven Identity Graph Conflation
App 20210240693 - Goyal; Deepak ; et al. | 2021-08-05 |
Thermally Conductive Slugs/active Dies To Improve Cooling Of Stacked Bottom Dies
App 20210193552 - WAN; Zhimin ; et al. | 2021-06-24 |
Integrated Cable Probe Design For High Bandwidth Rf Testing
App 20210132113 - Hu; Chengqing ; et al. | 2021-05-06 |
Methods and apparatus for data repartitioning
Grant 10,936,232 - Surana , et al. March 2, 2 | 2021-03-02 |
Method of resonance analysis for electrical fault isolation
Grant 10,935,593 - Goyal , et al. March 2, 2 | 2021-03-02 |
Methods And Apparatus For Data Repartitioning
App 20210055876 - SURANA; Ashish ; et al. | 2021-02-25 |
Characterization of transmission media
Grant 10,908,206 - Xie , et al. February 2, 2 | 2021-02-02 |
Integrated Heat Spreader (ihs) With Heating Element
App 20210013117 - Li; Peng ; et al. | 2021-01-14 |
Techniques for providing customized user interface components in a push notification
Grant 10,754,518 - Bell , et al. A | 2020-08-25 |
High power terahertz impulse for fault isolation
Grant 10,746,780 - Xie , et al. A | 2020-08-18 |
System And Method For Bootstrapping Replicas From Active Partitions
App 20200241974 - Brar; Navinder Pal Singh ; et al. | 2020-07-30 |
X-ray Filter
App 20200166569 - Pacheco; Mario ; et al. | 2020-05-28 |
Method Of Sample Preparation Using Dual Ion Beam Trenching
App 20200098554 - MUTHUR SRINATH; Purushotham Kaushik ; et al. | 2020-03-26 |
Microelectronic Assemblies Including A Thermal Interface Material
App 20200006192 - Li; Peng ; et al. | 2020-01-02 |
Characterization Of Transmission Media
App 20190293708 - Xie; Mayue ; et al. | 2019-09-26 |
Electronic assembly using bismuth-rich solder
Grant 10,361,167 - Liu , et al. | 2019-07-23 |
Method Of Resonance Analysis For Electrical Fault Isolation
App 20190204376 - Goyal; Deepak ; et al. | 2019-07-04 |
High Power Terahertz Impulse For Fault Isolation
App 20180335465 - Xie; Mayue ; et al. | 2018-11-22 |
Wavelength Modulatable Interferometer
App 20180283845 - Pacheco; Mario ; et al. | 2018-10-04 |
Non-destructive 3-dimensional chemical imaging of photo-resist material
Grant 10,078,204 - Ghosh , et al. September 18, 2 | 2018-09-18 |
Electronic Assembly Using Bismuth-rich Solder
App 20180254256 - Liu; Pilin ; et al. | 2018-09-06 |
Terahertz transmission contactless probing and scanning for signal analysis and fault isolation
Grant 9,817,028 - Xie , et al. November 14, 2 | 2017-11-14 |
Detecting Voids And Delamination In Photoresist Layer
App 20170284943 - Ghosh; Nilanjan ; et al. | 2017-10-05 |
Inline inspection of the contact between conductive traces and substrate for hidden defects using white light interferometer with tilted objective lens
Grant 9,746,428 - Liu , et al. August 29, 2 | 2017-08-29 |
Measuring Surface Layer Thickness
App 20170176173 - Song; Yanmei ; et al. | 2017-06-22 |
Material Thickness Device And Method
App 20170170080 - Grujicic; Darko ; et al. | 2017-06-15 |
Device, system and method for alignment of an integrated circuit assembly
Grant 9,625,256 - Muthur Srinath , et al. April 18, 2 | 2017-04-18 |
Terahertz Transmission Contactless Probing And Scanning For Signal Analysis And Fault Isolation
App 20170089951 - Xie; Mayue ; et al. | 2017-03-30 |
Inline measurement of molding material thickness using terahertz reflectance
Grant 9,508,610 - Liu , et al. November 29, 2 | 2016-11-29 |
Circuit Device Inspection Systems Using Temperature Gradients
App 20160274044 - Xie; Mayue ; et al. | 2016-09-22 |
Inline Inspection Of The Contact Between Conductive Traces And Substrate For Hidden Defects Using White Light Interferometer With Tilted Objective Lens
App 20160245758 - Liu; Shuhong ; et al. | 2016-08-25 |
Inline inspection of the contact between conductive traces and substrate for hidden defects using white light interferometer with tilted objective lens
Grant 9,389,064 - Liu , et al. July 12, 2 | 2016-07-12 |
Inline Measurement Of Molding Material Thickness Using Terahertz Reflectance
App 20160093540 - LIU; Shuhong ; et al. | 2016-03-31 |
Detection of defect in die
Grant 9,291,576 - Pacheco , et al. March 22, 2 | 2016-03-22 |
Detection Of Defect In Die
App 20160011122 - Pacheco; Mario ; et al. | 2016-01-14 |
Inline Inspection Of The Contact Between Conductive Traces And Substrate For Hidden Defects Using White Light Interferometer With Tilted Objective Lens
App 20150276375 - Liu; Shuhong ; et al. | 2015-10-01 |
Non-Destructive 3-Dimensional Chemical Imaging Of Photo-Resist Material
App 20150276480 - GHOSH; Nilanjan ; et al. | 2015-10-01 |
Solder Alloy To Enhance Reliability Of Solder Interconnects With Nipdau Or Niau Surface Finishes During High Temperature Exposure
App 20150255414 - Liu; Pilin ; et al. | 2015-09-10 |
System, method, and computer program product for determining equivalence of netlists utilizing at least one transformation
Grant 8,122,401 - Chauhan , et al. February 21, 2 | 2012-02-21 |
System, method, and computer program product for determining equivalence of netlists utilizing abstractions and transformations
Grant 8,117,571 - Chauhan , et al. February 14, 2 | 2012-02-14 |
System, method and computer program product for equivalence checking between designs with sequential differences
Grant 7,350,168 - Mathur , et al. March 25, 2 | 2008-03-25 |
Method of simplifying a circuit for equivalence checking
Grant 7,287,235 - Hasteer , et al. October 23, 2 | 2007-10-23 |
Electro-optic time domain reflectometry
Grant 7,280,190 - Wang , et al. October 9, 2 | 2007-10-09 |
Circuit comparison by information loss matching
Grant 7,222,317 - Mathur , et al. May 22, 2 | 2007-05-22 |
Method for streaming XPath processing with forward and backward axes
Grant 7,171,407 - Barton , et al. January 30, 2 | 2007-01-30 |
Method for streaming XPath processing with forward and backward axes
App 20040068487 - Barton, Charles ; et al. | 2004-04-08 |
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