GOV; SHAHAR

Patent Applications and Registrations

Patent applications and USPTO patent grants for GOV; SHAHAR.The latest application filed is for "optical phase measurement system and method".

Company Profile

4.5.9

GOV; SHAHAR - REHOVOT IL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Optical Phase Measurement System And Method App 20200355622 - BARAK; GILAD ; et al.	2020-11-12
Optical phase measurement system and method Grant 10,663,408 - Barak , et al.	2020-05-26
Optical Phase Measurement System And Method App 20200025693 - BARAK; GILAD ; et al.	2020-01-23
Optical System And Method For Measuring Parameters Of Patterned Structures In Micro-electronic Devices App 20190339068 - GROSSMAN; DANNY ; et al.	2019-11-07
Optical phase measurement method and system Grant 10,365,231 - Barak , et al. July 30, 2	2019-07-30
Optical Phase Measurement Method And System App 20180128753 - BARAK; Gilad ; et al.	2018-05-10
Optical phase measurement method and system Grant 9,897,553 - Barak , et al. February 20, 2	2018-02-20
Optical Phase Measurement Method And System App 20150377799 - BARAK; Gilad ; et al.	2015-12-31
Optical Measurements Of Patterned Articles App 20080158553 - FINAROV; Moshe ; et al.	2008-07-03
Optical measurements of patterned articles Grant 7,330,259 - Finarov , et al. February 12, 2	2008-02-12
Glan-Thompson Type Broadband Polarizer Device for Use in the Deep Ultraviolet Spectral Range and Method of Its Manufacture App 20080018991 - Winik; Michael ; et al.	2008-01-24
Optical measurments of patterned articles App 20050264801 - Finarov, Moshe ; et al.	2005-12-01
Method and system for thickness measurements of thin conductive layers Grant 6,815,947 - Scheiner , et al. November 9, 2	2004-11-09
Method and system for thickness measurements of thin conductive layers App 20040138838 - Scheiner, David ; et al.	2004-07-15

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