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Patent applications and USPTO patent grants for GOV; SHAHAR.The latest application filed is for "optical phase measurement system and method".
Patent | Date |
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Optical Phase Measurement System And Method App 20200355622 - BARAK; GILAD ;   et al. | 2020-11-12 |
Optical phase measurement system and method Grant 10,663,408 - Barak , et al. | 2020-05-26 |
Optical Phase Measurement System And Method App 20200025693 - BARAK; GILAD ;   et al. | 2020-01-23 |
Optical System And Method For Measuring Parameters Of Patterned Structures In Micro-electronic Devices App 20190339068 - GROSSMAN; DANNY ;   et al. | 2019-11-07 |
Optical phase measurement method and system Grant 10,365,231 - Barak , et al. July 30, 2 | 2019-07-30 |
Optical Phase Measurement Method And System App 20180128753 - BARAK; Gilad ;   et al. | 2018-05-10 |
Optical phase measurement method and system Grant 9,897,553 - Barak , et al. February 20, 2 | 2018-02-20 |
Optical Phase Measurement Method And System App 20150377799 - BARAK; Gilad ;   et al. | 2015-12-31 |
Optical Measurements Of Patterned Articles App 20080158553 - FINAROV; Moshe ;   et al. | 2008-07-03 |
Optical measurements of patterned articles Grant 7,330,259 - Finarov , et al. February 12, 2 | 2008-02-12 |
Glan-Thompson Type Broadband Polarizer Device for Use in the Deep Ultraviolet Spectral Range and Method of Its Manufacture App 20080018991 - Winik; Michael ;   et al. | 2008-01-24 |
Optical measurments of patterned articles App 20050264801 - Finarov, Moshe ;   et al. | 2005-12-01 |
Method and system for thickness measurements of thin conductive layers Grant 6,815,947 - Scheiner , et al. November 9, 2 | 2004-11-09 |
Method and system for thickness measurements of thin conductive layers App 20040138838 - Scheiner, David ;   et al. | 2004-07-15 |
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