Gotthard; Doug
Patent Applications and Registrations
Patent applications and USPTO patent grants for Gotthard; Doug.The latest application filed is for "devices, systems, and methods for reducing microbial load during product coating".
- Gotthard; Doug - Goleta CA
- Gotthard; Doug - Santa Barbara CA
- Gotthard; Doug - Carpinteria CA
| Patent | Date |
|---|---|
| Devices, Systems, And Methods For Reducing Microbial Load During Product Coating App 20220297153 - Bakus; Ronald C. ; et al. | 2022-09-22 |
| Nanoscale infrared spectroscopy with multi-frequency atomic force microscopy Grant 10,557,789 - Prater , et al. Feb | 2020-02-11 |
| Nanoscale infrared spectroscopy with multi-frequency atomic force microscopy App 20150034826 - Prater; Craig ; et al. | 2015-02-05 |
| Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopy Grant 8,914,911 - King , et al. December 16, 2 | 2014-12-16 |
| Dynamic power control, beam alignment and focus for nanoscale spectroscopy Grant 8,242,448 - Prater , et al. August 14, 2 | 2012-08-14 |
| Transition temperature microscopy Grant 8,177,422 - Kjoller , et al. May 15, 2 | 2012-05-15 |
| Dynamic power control, beam alignment and focus for nanoscale spectroscopy App 20110205527 - Prater; Craig ; et al. | 2011-08-25 |
| Transition temperature microscopy App 20100042356 - Kjoller; Kevin ; et al. | 2010-02-18 |
| Optical detection alignment/tracking method and apparatus Grant 7,478,552 - Gotthard , et al. January 20, 2 | 2009-01-20 |
| Method of making a force curve measurement on a sample Grant 7,387,035 - Struckmeier , et al. June 17, 2 | 2008-06-17 |
| Optical detection alignment/tracking method and apparatus App 20070220958 - Gotthard; Doug ; et al. | 2007-09-27 |
| Force Scanning Probe Microscope App 20060283240 - Struckmeier; Jens ; et al. | 2006-12-21 |
| Force scanning probe microscope Grant 7,044,007 - Struckmeier , et al. May 16, 2 | 2006-05-16 |
| Manual control with force-feedback for probe microscopy-based force spectroscopy Grant 7,013,717 - Struckmeier , et al. March 21, 2 | 2006-03-21 |
| Force scanning probe microscope App 20050081610 - Struckmeier, Jens ; et al. | 2005-04-21 |
| Force scanning probe microscope Grant 6,677,697 - Struckmeier , et al. January 13, 2 | 2004-01-13 |
| Force scanning probe microscope App 20030110844 - Struckmeier, Jens ; et al. | 2003-06-19 |
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