GOTO; Yoshiro

Patent Applications and Registrations

Patent applications and USPTO patent grants for GOTO; Yoshiro.The latest application filed is for "illumination light source and lighting apparatus".

Company Profile

0.8.5

GOTO; Yoshiro - Osaka JP
Goto; Yoshiro - Katano JP
Goto; Yoshiro - Katano-shi JP
Goto; Yoshiro - Tokyo JP
Goto, Yoshiro - Kanagawa JP
Goto; Yoshiro - Kawasaki JP
Goto; Yoshiro - Yokohama JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Illumination Light Source And Lighting Apparatus App 20140268832 - GOTO; Yoshiro ; et al.	2014-09-18
Lighting apparatus with LEDs Grant 8,070,316 - Urano , et al. December 6, 2	2011-12-06
Lighting Apparatus With Leds App 20090046456 - Urano; Youji ; et al.	2009-02-19
Integrated circuit device with switching between active mode and standby mode controlled by digital circuit Grant 6,664,148 - Goto , et al. December 16, 2	2003-12-16
Semiconductor device covering transistor and resistance with capacitor material App 20030183880 - Goto, Yoshiro ; et al.	2003-10-02
Integrated circuit device with switching between active mode and standby mode controlled by digital circuit App 20020105041 - Goto, Yoshiro ; et al.	2002-08-08
Manufacturing method of semiconductor device App 20010053579 - Toda, Takeshi ; et al.	2001-12-20
Production of optical module assembly Grant 5,916,458 - Komoriya , et al. June 29, 1	1999-06-29
Method for fabricating semiconductor device with planarization step using CMP Grant 5,733,818 - Goto March 31, 1	1998-03-31
Buried-channel MOS transistor and process of producing same Grant 5,719,430 - Goto February 17, 1	1998-02-17
Signal measuring apparatus and signal measuring method Grant 5,550,479 - Wakana , et al. August 27, 1	1996-08-27
Probing device and system for testing an integrated circuit Grant 5,331,275 - Ozaki , et al. July 19, 1	1994-07-19
Back-scattered electron detector for use in an electron microscope or electron beam exposure system to detect back-scattered electrons Grant 4,177,379 - Furukawa , et al. December 4, 1	1979-12-04

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