GOTO; Yasunori
Patent Applications and Registrations
Patent applications and USPTO patent grants for GOTO; Yasunori.The latest application filed is for "pattern measurement system and pattern measurement method".
- GOTO; Yasunori - Tokyo JP
- Goto; Yasunori - Takanezawa-machi N/A JP
- Goto; Yasunori - Numazu JP
- Goto; Yasunori - Shioya-gun JP
- Goto; Yasunori - Hitachinaka JP
- GOTO; YASUNORI - SAGAMIHARA-SHI JP
- Goto; Yasunori - Kudamatsu JP
- Goto; Yasunori - Otawara JP
- Goto, Yasunori - Otawara-shi JP
| Patent | Date |
|---|---|
| Pattern Measurement System And Pattern Measurement Method App 20220230842 - SUN; Wei ; et al. | 2022-07-21 |
| Charged Particle Beam Device App 20220130638 - HITOMI; Keiichiro ; et al. | 2022-04-28 |
| Measurement device, method and display device Grant 10,996,569 - Takagi , et al. May 4, 2 | 2021-05-04 |
| Charged Particle Beam System and Overlay Shift Amount Measurement Method App 20210055098 - YAMAKI; Takuma ; et al. | 2021-02-25 |
| Electron microscope device and inclined hole measurement method using same Grant 10,720,307 - Takagi , et al. | 2020-07-21 |
| System and method for measuring patterns Grant 10,692,693 - Sun , et al. | 2020-06-23 |
| Electron Microscope Device And Inclined Hole Measurement Method Using Same App 20190362933 - TAKAGI; Yuji ; et al. | 2019-11-28 |
| System And Method For Measuring Patterns App 20190148108 - SUN; Wei ; et al. | 2019-05-16 |
| Measurement Device, Method And Display Device App 20190033728 - TAKAGI; Yuji ; et al. | 2019-01-31 |
| Overlay measurement method, device, and display device Grant 10,094,658 - Takagi , et al. October 9, 2 | 2018-10-09 |
| Overlay Measurement Method, Device, And Display Device App 20170322021 - TAKAGI; Yuji ; et al. | 2017-11-09 |
| X-ray diagnostic system Grant 9,681,848 - Goto , et al. June 20, 2 | 2017-06-20 |
| Sample observation device Grant 9,536,700 - Goto , et al. January 3, 2 | 2017-01-03 |
| Memory access processing method and information processing device Grant 9,507,724 - Kamezawa , et al. November 29, 2 | 2016-11-29 |
| Superposition measuring apparatus, superposition measuring method, and superposition measuring system Grant 9,390,885 - Yamamoto , et al. July 12, 2 | 2016-07-12 |
| Sample Observation Device App 20160071688 - GOTO; Yasunori ; et al. | 2016-03-10 |
| Memory Access Processing Method And Information Processing Device App 20160062902 - KAMEZAWA; Hiroyuki ; et al. | 2016-03-03 |
| Superposition Measuring Apparatus, Superposition Measuring Method, and Superposition Measuring System App 20160056014 - YAMAMOTO; Takuma ; et al. | 2016-02-25 |
| X-ray diagnostic apparatus Grant 8,905,636 - Matsuzaki , et al. December 9, 2 | 2014-12-09 |
| X-ray Diagnostic System App 20130259209 - Goto; Yasunori ; et al. | 2013-10-03 |
| X-ray Diagnosis Device App 20130188775 - GOTO; Yasunori | 2013-07-25 |
| X-ray Diagnostic Apparatus App 20130121466 - Matsuzaki; Takeo ; et al. | 2013-05-16 |
| X-ray Imaging Apparatus App 20120207282 - GOTO; Yasunori ; et al. | 2012-08-16 |
| Method and apparatus for inspecting patterns Grant 7,394,070 - Nozoe , et al. July 1, 2 | 2008-07-01 |
| Methods Of Manufacturing Printed Circuit Board Assembly App 20080102561 - GOTO; YASUNORI ; et al. | 2008-05-01 |
| Method and apparatus for inspecting patterns App 20060163477 - Nozoe; Mari ; et al. | 2006-07-27 |
| Plasma treatment apparatus and method of producing semiconductor device using the apparatus Grant 6,797,112 - Itabashi , et al. September 28, 2 | 2004-09-28 |
| Plasma treatment apparatus and method of producing semiconductor device using the apparatus App 20030203641 - Itabashi, Naoshi ; et al. | 2003-10-30 |
| X-ray diagnostic apparatus Grant 6,480,574 - Goto November 12, 2 | 2002-11-12 |
| Plasma treatment apparatus and method of producing semiconductor device using the apparatus App 20020129904 - Itabashi, Naoshi ; et al. | 2002-09-19 |
| X-ray Diagnostic Apparatus App 20020131557 - Goto, Yasunori | 2002-09-19 |
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