GOSHIMA; Yoshikuni

Patent Applications and Registrations

Patent applications and USPTO patent grants for GOSHIMA; Yoshikuni.The latest application filed is for "semiconductor device, multi-charged-particle beam writing apparatus, and multi-charged-particle beam exposure apparatus".

Company Profile

3.8.8

GOSHIMA; Yoshikuni - Yokohama-shi JP
Goshima; Yoshikuni - Yokohama JP
Goshima; Yoshikuni - Shizuoka JP
Goshima; Yoshikuni - Numazu JP
GOSHIMA; Yoshikuni - Numazu-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Semiconductor Device, Multi-charged-particle Beam Writing Apparatus, And Multi-charged-particle Beam Exposure Apparatus App 20220270850 - OBARA; Kei ; et al.	2022-08-25
Multi-beam blanking device and multi-charged-particle-beam writing apparatus Grant 11,355,302 - Yamashita , et al. June 7, 2	2022-06-07
Multi-beam Blanking Device And Multi-charged-particle-beam Writing Apparatus App 20210296074 - YAMASHITA; Hiroshi ; et al.	2021-09-23
Individual beam detector for multiple beams, multi-beam irradiation apparatus, and individual beam detection method for multiple beams Grant 10,714,311 - Goshima , et al.	2020-07-14
Semiconductor device Grant 10,607,908 - Chiba , et al.	2020-03-31
Individual Beam Detector For Multiple Beams, Multi-beam Irradiation Apparatus, And Individual Beam Detection Method For Multiple Beams App 20190139739 - GOSHIMA; Yoshikuni ; et al.	2019-05-09
Semiconductor Device App 20180374768 - CHIBA; Kazuhiro ; et al.	2018-12-27
Pattern writing system and method and abnormality diagnosing method Grant 8,427,919 - Goshima , et al. April 23, 2	2013-04-23
Pattern writing system and parameters monitoring method for pattern writing apparatus Grant 8,258,491 - Goshima September 4, 2	2012-09-04
Pattern Writing System And Method And Abnormality Diagnosing Method App 20110255388 - GOSHIMA; Yoshikuni ; et al.	2011-10-20
Method for inspecting settling time of deflection amplifier, and method for judging failure of deflection amplifier Grant 7,989,777 - Goshima August 2, 2	2011-08-02
Methods and systems for testing digital-to-analog converter/amplifier circuits Grant 7,898,447 - Goshima , et al. March 1, 2	2011-03-01
Methods And Systems For Testing Digital-to-analog Converter/amplifier Circuits App 20110012617 - GOSHIMA; Yoshikuni ; et al.	2011-01-20
Method For Inspecting Settling Time Of Deflection Amplifier, And Method For Judging Failure Of Deflection Amplifier App 20090272911 - GOSHIMA; Yoshikuni	2009-11-05
Pattern Writing System And Parameters Monitoring Method For Pattern Writing Apparatus App 20090237824 - GOSHIMA; Yoshikuni	2009-09-24

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