| Patent | Date |
|---|
Operating pulsed latches on a variable power supply
Grant 11,112,854 - Douskey , et al. September 7, 2 | 2021-09-07 |
Dynamically power noise adaptive automatic test pattern generation
Grant 10,816,599 - Douskey , et al. October 27, 2 | 2020-10-27 |
Logic built in self test circuitry for use in an integrated circuit with scan chains
Grant 10,746,794 - Bhamidipati , et al. A | 2020-08-18 |
Logic built in self test circuitry for use in an integrated circuit with scan chains
Grant 10,739,401 - Bhamidipati , et al. A | 2020-08-11 |
Dynamically Power Noise Adaptive Automatic Test Pattern Generation
App 20200225283 - DOUSKEY; Steven M. ; et al. | 2020-07-16 |
Logic built in self test circuitry for use in an integrated circuit with scan chains
Grant 10,649,028 - Bhamidipati , et al. | 2020-05-12 |
Circuit structures to resolve random testability
Grant 10,545,190 - GopalaKrishnaSetty , et al. Ja | 2020-01-28 |
Circuit structures to resolve random testability
Grant 10,527,674 - GopalaKrishnaSetty , et al. J | 2020-01-07 |
Self-moderating bus arbitration architecture
Grant 10,521,381 - GopalaKrishnaSetty , et al. Dec | 2019-12-31 |
Operating Pulsed Latches On A Variable Power Supply
App 20190286221 - DOUSKEY; STEVEN M. ; et al. | 2019-09-19 |
Self-moderating Bus Arbitration Architecture
App 20190278728 - GopalaKrishnaSetty; Raghu G. ; et al. | 2019-09-12 |
Operating pulsed latches on a variable power supply
Grant 10,386,912 - Douskey , et al. A | 2019-08-20 |
Self-moderating bus arbitration architecture
Grant 10,303,631 - GopalaKrishnaSetty , et al. | 2019-05-28 |
Adjusting scan connections based on scan control locations
Grant 10,216,885 - GopalaKrishnaSetty , et al. Feb | 2019-02-26 |
Circuit Structures To Resolve Random Testability
App 20190056450 - GopalaKrishnaSetty; Raghu G. ; et al. | 2019-02-21 |
Circuit Structures To Resolve Random Testability
App 20190056449 - GopalaKrishnaSetty; Raghu G. ; et al. | 2019-02-21 |
Logic Built In Self Test Circuitry For Use In An Integrated Circuit With Scan Chains
App 20180306858 - Bhamidipati; Satya R.S. ; et al. | 2018-10-25 |
Logic built in self test circuitry for use in an integrated circuit with scan chains
Grant 10,088,524 - Bhamidipati , et al. October 2, 2 | 2018-10-02 |
Adjusting latency in a scan cell
Grant 10,060,971 - Douskey , et al. August 28, 2 | 2018-08-28 |
Operating Pulsed Latches On A Variable Power Supply
App 20180196497 - DOUSKEY; STEVEN M. ; et al. | 2018-07-12 |
Adjusting latency in a scan cell
Grant 10,001,523 - Douskey , et al. June 19, 2 | 2018-06-19 |
Adjusting Scan Connections Based On Scan Control Locations
App 20180096091 - GopalaKrishnaSetty; Raghu G. ; et al. | 2018-04-05 |
Adjusting scan connections based on scan control locations
Grant 9,934,348 - GopalaKrishnaSetty , et al. April 3, 2 | 2018-04-03 |
Adjusting Latency In A Scan Cell
App 20180052198 - DOUSKEY; Steven M. ; et al. | 2018-02-22 |
Adjusting Latency In A Scan Cell
App 20180052199 - DOUSKEY; Steven M. ; et al. | 2018-02-22 |
Self-moderating Bus Arbitration Architecture
App 20170270066 - GopalaKrishnaSetty; Raghu G. ; et al. | 2017-09-21 |
Logic Built In Self Test Circuitry For Use In An Integrated Circuit With Scan Chains
App 20170192054 - Bhamidipati; Satya R.S. ; et al. | 2017-07-06 |
Logic Built In Self Test Circuitry For Use In An Integrated Circuit With Scan Chains
App 20170192057 - BHAMIDIPATI; SATYA R.S. ; et al. | 2017-07-06 |
Logic Built In Self Test Circuitry For Use In An Integrated Circuit With Scan Chains
App 20170192055 - Bhamidipati; Satya R.S. ; et al. | 2017-07-06 |
Adjusting Scan Connections Based On Scan Control Locations
App 20170177777 - GopalaKrishnaSetty; Raghu G. ; et al. | 2017-06-22 |
Control test point for timing stability during scan capture
Grant 9,322,876 - Bheemanna , et al. April 26, 2 | 2016-04-26 |
Control Test Point For Timing Stability During Scan Capture
App 20150346281 - Bheemanna; Purushotam ; et al. | 2015-12-03 |
Control test point for timing stability during scan capture
Grant 9,194,915 - Bheemanna , et al. November 24, 2 | 2015-11-24 |
Q-gating cell architecture to satiate the launch-off-shift (LOS) testing and an algorithm to identify best Q-gating candidates
Grant 9,086,458 - GopalaKrishnaSetty , et al. July 21, 2 | 2015-07-21 |
Control Test Point For Timing Stability During Scan Capture
App 20150074477 - Bheemanna; Purushotam ; et al. | 2015-03-12 |
A Q-gating Cell Architecture To Satiate The Launch-off-shift (los) Testing And An Algorithm To Identify Best Q-gating Candidates
App 20150067423 - GopalaKrishnaSetty; Raghu G. ; et al. | 2015-03-05 |
Algorithm to identify best Q-gating candidates and a Q-gating cell architecture to satiate the launch-off-shift (LOS) testing
Grant 8,898,604 - GopalaKrishnaSetty , et al. November 25, 2 | 2014-11-25 |
Delay defect testing of power drop effects in integrated circuits
Grant 8,776,006 - Gopalakrishnasetty , et al. July 8, 2 | 2014-07-08 |
| 