loadpatents
name:-0.0084178447723389
name:-0.009293794631958
name:-0.00075507164001465
Gonzalez; Steve G. Patent Filings

Gonzalez; Steve G.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Gonzalez; Steve G..The latest application filed is for "shaft cone crown measurement system and methodology".

Company Profile
0.9.6
  • Gonzalez; Steve G. - Davenport CA
  • Gonzalez; Steve G. - Santa Cruz CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Automatic projector calibration
Grant 8,662,676 - Chang , et al. March 4, 2
2014-03-04
Automatic camera calibration
Grant 8,619,144 - Chang , et al. December 31, 2
2013-12-31
Shaft cone crown measurement system and methodology
Grant 7,920,254 - Mysore , et al. April 5, 2
2011-04-05
Sleeve cone quality measurement system and method
Grant 7,885,786 - Mysore , et al. February 8, 2
2011-02-08
Shaft Cone Crown Measurement System And Methodology
App 20100094588 - Mysore; Ananda V. ;   et al.
2010-04-15
Sleeve Cone Quality Measurement System And Method
App 20100094587 - Mysore; Ananda V. ;   et al.
2010-04-15
Sapphire alignment fixture
Grant 7,421,795 - Mysore , et al. September 9, 2
2008-09-09
Sleeve cone angle measurement system
Grant 7,350,308 - Mysore , et al. April 1, 2
2008-04-01
Sapphire alignment fixture
App 20080028627 - Mysore; Ananda V. ;   et al.
2008-02-07
Shaft cone metrology system and method
Grant 7,253,889 - Mysore , et al. August 7, 2
2007-08-07
Sleeve cone angle measurement system
App 20070137056 - Mysore; Ananda V. ;   et al.
2007-06-21
Shaft cone metrology system and method
App 20070139641 - Mysore; Ananda V. ;   et al.
2007-06-21
System and method for ECM land erosion metrology
Grant 6,904,790 - Ananda , et al. June 14, 2
2005-06-14
System and method for ECM land erosion metrology
App 20040025577 - Ananda, Mysore Venkatachalan ;   et al.
2004-02-12

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