Golan; Avi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Golan; Avi.The latest application filed is for "systems and methods for test time outlier detection and correction in integrated circuit testing".

Company Profile

0.10.8

Golan; Avi - Tel Aviv IL
Golan; Avi - Midreshet Ben Guirion IL
Golan; Avi - Midreshet Ben Gurion IL
Golan; Avi - Petach-Tikva IL
Golan; Avi - Tel Aviiv IL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Systems and methods for test time outlier detection and correction in integrated circuit testing Grant 9,529,036 - Balog , et al. December 27, 2	2016-12-27
Methods and compositions for inhibiting the nuclear factor .kappa.B pathway Grant 8,945,632 - Golan , et al. February 3, 2	2015-02-03
Systems And Methods For Test Time Outlier Detection And Correction In Integrated Circuit Testing App 20150012237 - Balog; Gil ; et al.	2015-01-08
Systems and methods for test time outlier detection and correction in integrated circuit testing Grant 8,872,538 - Balog , et al. October 28, 2	2014-10-28
Systems And Methods For Test Time Outlier Detection And Correction In Integrated Circuit Testing App 20130193994 - Balog; Gil ; et al.	2013-08-01
Methods And Compositions For Inhibiting The Nuclear Factor Kappab Pathway App 20130122114 - Golan; Avi ; et al.	2013-05-16
Systems and methods for test time outlier detection and correction in integrated circuit testing Grant 8,421,494 - Balog , et al. April 16, 2	2013-04-16
System and method for maintaining a plurality of summary levels in a single table Grant 8,285,752 - Golan , et al. October 9, 2	2012-10-09
Systems And Methods For Test Time Outlier Detection And Correction In Integrated Circuit Testing App 20110224938 - Balog; Gil ; et al.	2011-09-15
Systems and methods for test time outlier detection and correction in integrated circuit testing Grant 7,969,174 - Balog , et al. June 28, 2	2011-06-28
Systems And Methods For Test Time Outlier Detection And Correction In Integrated Circuit Testing App 20090192754 - Balog; Gil ; et al.	2009-07-30
Methods for slow test time detection of an integrated circuit during parallel testing Grant 7,528,622 - Balog , et al. May 5, 2	2009-05-05
System and methods for test time outlier detection and correction in integrated circuit testing App 20070132477 - Balog; Gil ; et al.	2007-06-14
Optimize parallel testing Grant 7,208,969 - Golan April 24, 2	2007-04-24
Optimize parallel testing App 20070007981 - Golan; Avi	2007-01-11

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.