| Patent | Date |
|---|
Integrated Circuit Design Method, System And Computer Program Product
App 20220300689 - PATIDAR; Ankita ; et al. | 2022-09-22 |
Function Safety And Fault Management Modeling At Electrical System Level (esl)
App 20220292237 - TING; Kai-Yuan ; et al. | 2022-09-15 |
Phase-locked loop monitor circuit
Grant 11,411,571 - Goel , et al. August 9, 2 | 2022-08-09 |
Fault Detection Of Circuit Based On Virtual Defects
App 20220237353 - Tian; Yue ; et al. | 2022-07-28 |
Systems And Methods To Detect Cell-internal Defects
App 20220230699 - Patidar; Ankita ; et al. | 2022-07-21 |
Power-aware scan partitioning
Grant 11,386,253 - Patidar , et al. July 12, 2 | 2022-07-12 |
Integrated circuit design method, system and computer program product
Grant 11,379,643 - Patidar , et al. July 5, 2 | 2022-07-05 |
Function safety and fault management modeling at electrical system level (ESL)
Grant 11,354,465 - Ting , et al. June 7, 2 | 2022-06-07 |
Image processing apparatus having overlapping sub-regions
Grant 11,343,433 - Goel , et al. May 24, 2 | 2022-05-24 |
Integrated Circuit Design Method, System And Computer Program Product
App 20220138385 - PATIDAR; Ankita ; et al. | 2022-05-05 |
Systems and methods to detect cell-internal defects
Grant 11,295,831 - Patidar , et al. April 5, 2 | 2022-04-05 |
Dynamic frequency scaling
Grant 11,231,767 - Ting , et al. January 25, 2 | 2022-01-25 |
Systems And Methods To Detect Cell-internal Defects
App 20210407614 - Patidar; Ankita ; et al. | 2021-12-30 |
Fault Diagnostics
App 20210350055 - Goel; Sandeep Kumar ; et al. | 2021-11-11 |
Power estimation
Grant 11,163,351 - Ting , et al. November 2, 2 | 2021-11-02 |
Method And System For Reducing Migration Errors
App 20210326502 - GOEL; Sandeep Kumar ; et al. | 2021-10-21 |
Phase-locked Loop Monitor Circuit
App 20210281268 - GOEL; Sandeep Kumar ; et al. | 2021-09-09 |
Machine-learning based scan design enablement platform
Grant 11,113,444 - Goel , et al. September 7, 2 | 2021-09-07 |
Fault diagnostics
Grant 11,068,633 - Goel , et al. July 20, 2 | 2021-07-20 |
Device With Self-authentication
App 20210218577 - ZHOU; Haohua ; et al. | 2021-07-15 |
Method and system for reducing migration errors
Grant 11,055,455 - Goel , et al. July 6, 2 | 2021-07-06 |
Method And System For Reducing Migration Errors
App 20210192112 - GOEL; Sandeep Kumar ; et al. | 2021-06-24 |
Phase-locked loop monitor circuit
Grant 11,025,261 - Goel , et al. June 1, 2 | 2021-06-01 |
Device with self-authentication
Grant 10,985,922 - Zhou , et al. April 20, 2 | 2021-04-20 |
System And Method For Esl Modeling Of Machine Learning
App 20210089696 - TING; Kai-Yuan ; et al. | 2021-03-25 |
Function Safety And Fault Management Modeling At Electrical System Level (esl)
App 20200410144 - TING; Kai-Yuan ; et al. | 2020-12-31 |
Systems and methods for determining systematic defects
Grant 10,871,518 - Goel , et al. December 22, 2 | 2020-12-22 |
Electrical system level (ESL) battery discharge simulation
Grant 10,867,089 - Zhou , et al. December 15, 2 | 2020-12-15 |
System and method for ESL modeling of machine learning
Grant 10,867,098 - Ting , et al. December 15, 2 | 2020-12-15 |
Test Probing Structure
App 20200379013 - Wang; Mill-Jer ; et al. | 2020-12-03 |
System And Method For Esl Modeling Of Machine Learning
App 20200372124 - TING; Kai-Yuan ; et al. | 2020-11-26 |
Power-aware Scan Partitioning
App 20200311329 - Patidar; Ankita ; et al. | 2020-10-01 |
Phase-locked Loop Monitor Circuit
App 20200304133 - GOEL; Sandeep Kumar ; et al. | 2020-09-24 |
Test probing structure
Grant 10,782,318 - Wang , et al. Sept | 2020-09-22 |
Function safety and fault management modeling at electrical system level (ESL)
Grant 10,776,538 - Ting , et al. Sept | 2020-09-15 |
Network-on-chip System And A Method Of Generating The Same
App 20200280527 - VENUGOPALAN; RAVI ; et al. | 2020-09-03 |
System and method for system-level parameter estimation
Grant 10,719,648 - Huang , et al. | 2020-07-21 |
Power-aware scan partitioning
Grant 10,685,157 - Patidar , et al. | 2020-06-16 |
Phase-locked loop monitor circuit
Grant 10,680,627 - Goel , et al. | 2020-06-09 |
Network-on-chip system and a method of generating the same
Grant 10,666,578 - Venugopalan , et al. | 2020-05-26 |
Scan Architecture For Interconnect Testing In 3d Integrated Circuits
App 20200124668 - GOEL; Sandeep Kumar ; et al. | 2020-04-23 |
Fault Diagnostics
App 20200072901 - Goel; Sandeep Kumar ; et al. | 2020-03-05 |
Image Processing Apparatus And Method
App 20200036879 - GOEL; Sandeep Kumar ; et al. | 2020-01-30 |
Scan architecture for interconnect testing in 3D integrated circuits
Grant 10,539,617 - Goel , et al. Ja | 2020-01-21 |
Machine-learning Based Scan Design Enablement Platform
App 20200004913 - GOEL; Sandeep Kumar ; et al. | 2020-01-02 |
Power Estimation
App 20190332161 - TING; Kai-Yuan ; et al. | 2019-10-31 |
Image processing apparatus on integrated circuit and method thereof
Grant 10,440,281 - Goel , et al. O | 2019-10-08 |
Circuit and method for diagnosing scan chain failures
Grant 10,371,751 - Goel | 2019-08-06 |
Phase-locked Loop Monitor Circuit
App 20190229737 - GOEL; Sandeep Kumar ; et al. | 2019-07-25 |
Power estimation
Grant 10,345,883 - Ting , et al. July 9, 2 | 2019-07-09 |
Method and system for functional safety verification
Grant 10,267,857 - Goel , et al. | 2019-04-23 |
Systems And Methods For Determining Systematic Defects
App 20190113573 - GOEL; SANDEEP KUMAR ; et al. | 2019-04-18 |
Phase-locked loop monitor circuit
Grant 10,256,828 - Goel , et al. | 2019-04-09 |
Device With Self-authentication
App 20190103974 - Zhou; Haohua ; et al. | 2019-04-04 |
Power-aware Scan Partitioning
App 20190094303 - Patidar; Ankita ; et al. | 2019-03-28 |
Function Safety and Fault Management Modeling at Electrical System Level (ESL)
App 20190034566 - TING; Kai-Yuan ; et al. | 2019-01-31 |
Dynamic Frequency Scaling
App 20180364783 - Ting; Kai-Yuan ; et al. | 2018-12-20 |
Device and method for robustness verification
Grant 10,156,609 - Goel , et al. Dec | 2018-12-18 |
Bidirectional scan chain structure and method
Grant 10,156,607 - Goel , et al. Dec | 2018-12-18 |
Electrical System Level (ESL) Battery Discharge Simulation
App 20180314772 - ZHOU; Charlie ; et al. | 2018-11-01 |
Circuit and method for monolithic stacked integrated circuit testing
Grant 10,115,643 - Goel October 30, 2 | 2018-10-30 |
Power consumption estimation method for system on chip (SOC), system for implementing the method
Grant 10,108,764 - Shehata , et al. October 23, 2 | 2018-10-23 |
Processor power estimation
Grant 10,101,796 - Ting , et al. October 16, 2 | 2018-10-16 |
Methods and systems for circuit fault diagnosis
Grant 10,078,720 - Goel , et al. September 18, 2 | 2018-09-18 |
Dynamic frequency scaling
Grant 10,061,374 - Ting , et al. August 28, 2 | 2018-08-28 |
Device And Method For Robustness Verification
App 20180164369 - GOEL; Sandeep Kumar ; et al. | 2018-06-14 |
Method And System For Functional Safety Verification
App 20180149698 - GOEL; Sandeep Kumar ; et al. | 2018-05-31 |
Phase-locked Loop Monitor Circuit
App 20180152193 - GOEL; Sandeep Kumar ; et al. | 2018-05-31 |
Network-on-chip System And A Method Of Generating The Same
App 20180069807 - VENUGOPALAN; RAVI ; et al. | 2018-03-08 |
Test Probing Structure
App 20180038894 - Wang; Mill-Jer ; et al. | 2018-02-08 |
Circuit And Method For Diagnosing Scan Chain Failures
App 20180031634 - GOEL; Sandeep Kumar | 2018-02-01 |
Scan Architecture For Interconnect Testing In 3d Integrated Circuits
App 20170350939 - GOEL; Sandeep Kumar ; et al. | 2017-12-07 |
Method, device and computer program product for circuit testing
Grant 9,835,680 - Goel , et al. December 5, 2 | 2017-12-05 |
Processor Power Estimation
App 20170344091 - TING; Kai-Yuan ; et al. | 2017-11-30 |
Power Estimation
App 20170344093 - TING; Kai-Yuan ; et al. | 2017-11-30 |
System and method for estimating performance, power, area and cost (PPAC)
Grant 9,830,413 - Goel , et al. November 28, 2 | 2017-11-28 |
Test probing structure
Grant 9,817,029 - Wang , et al. November 14, 2 | 2017-11-14 |
Method of component partitions on system on chip and device thereof
Grant 9,811,627 - Hou , et al. November 7, 2 | 2017-11-07 |
Bidirectional Scan Chain Structure And Method
App 20170307683 - Goel; Sandeep Kumar ; et al. | 2017-10-26 |
Power Consumption Estimation Method For System On Chip (soc), System For Implementing The Method
App 20170300604 - SHEHATA; Shereef ; et al. | 2017-10-19 |
Circuit and method for diagnosing scan chain failures
Grant 9,791,510 - Goel October 17, 2 | 2017-10-17 |
Interposers of 3-dimensional integrated circuit package systems and methods of designing the same
Grant 9,704,766 - Goel , et al. July 11, 2 | 2017-07-11 |
Multi-dimensional integrated circuit structures and methods of forming the same
Grant 9,686,852 - Semmelmeyer , et al. June 20, 2 | 2017-06-20 |
Method Of Component Partitions On System On Chip And Device Thereof
App 20170161420 - HOU; Yung-Chin ; et al. | 2017-06-08 |
System for and method of semiconductor fault detection
Grant 9,651,621 - Goel May 16, 2 | 2017-05-16 |
System and method for validating stacked dies by comparing connections
Grant 9,646,128 - Mehta , et al. May 9, 2 | 2017-05-09 |
Wafer on wafer stack method of forming and method of using the same
Grant 9,647,028 - Goel , et al. May 9, 2 | 2017-05-09 |
Power state coverage metric and method for estimating the same
Grant 9,633,147 - John , et al. April 25, 2 | 2017-04-25 |
System and method of adaptive voltage frequency scaling
Grant 9,625,971 - Ting , et al. April 18, 2 | 2017-04-18 |
Method and apparatus for interconnect test
Grant 9,625,523 - Goel , et al. April 18, 2 | 2017-04-18 |
Power State Coverage Metric And Method For Estimating The Same
App 20170098023 - JOHN; STANLEY ; et al. | 2017-04-06 |
System and method for functional verification of multi-die 3D ICs
Grant 9,612,277 - John , et al. April 4, 2 | 2017-04-04 |
Circuit and method for monolithic stacked integrated circuit testing
Grant 9,599,670 - Goel March 21, 2 | 2017-03-21 |
System And Method For Estimating Performance, Power, Area And Cost (ppac)
App 20170076028 - GOEL; Sandeep Kumar ; et al. | 2017-03-16 |
System And Method For System-level Parameter Estimation
App 20170076029 - HUANG; Tze-Chiang ; et al. | 2017-03-16 |
Interposer defect coverage metric and method to maximize the same
Grant 9,514,268 - Goel , et al. December 6, 2 | 2016-12-06 |
Probe card partition scheme
Grant 9,513,332 - Goel , et al. December 6, 2 | 2016-12-06 |
Wafer On Wafer Stack Method Of Forming And Method Of Using The Same
App 20160307958 - GOEL; Sandeep Kumar ; et al. | 2016-10-20 |
Method, Device And Computer Program Product For Circuit Testing
App 20160274178 - GOEL; Sandeep Kumar ; et al. | 2016-09-22 |
Methods And Systems For Circuit Fault Diagnosis
App 20160267216 - GOEL; SANDEEP KUMAR ; et al. | 2016-09-15 |
Method And Apparatus For Interconnect Test
App 20160259006 - GOEL; Sandeep Kumar ; et al. | 2016-09-08 |
Circuit and method for monolithic stacked integrated circuit testing
Grant 9,404,971 - Goel , et al. August 2, 2 | 2016-08-02 |
System for and method of semiconductor fault detection
Grant 9,390,219 - Goel , et al. July 12, 2 | 2016-07-12 |
Wafer on wafer stack method of forming and method of using the same
Grant 9,391,110 - Goel , et al. July 12, 2 | 2016-07-12 |
Method and apparatus for interconnect test
Grant 9,341,672 - Goel , et al. May 17, 2 | 2016-05-17 |
Circuit And Method For Monolithic Stacked Integrated Circuit Testing
App 20160133529 - Goel; Sandeep Kumar | 2016-05-12 |
Wafer On Wafer Stack Method Of Forming And Method Of Using The Same
App 20160049435 - GOEL; Sandeep Kumar ; et al. | 2016-02-18 |
Image Processing Apparatus And Method
App 20160050350 - GOEL; Sandeep Kumar ; et al. | 2016-02-18 |
Circuit And Method For Diagnosing Scan Chain Failures
App 20160041225 - GOEL; Sandeep Kumar | 2016-02-11 |
Interposer Defect Coverage Metric and Method to Maximize the Same
App 20160019332 - Goel; Sandeep Kumar ; et al. | 2016-01-21 |
System For And Method Of Semiconductor Fault Detection
App 20160011257 - GOEL; Sandeep Kumar | 2016-01-14 |
Circuit and method for monolithic stacked integrated circuit testing
Grant 9,222,983 - Goel December 29, 2 | 2015-12-29 |
Circuit And Method For Monolithic Stacked Integrated Circuit Testing
App 20150355277 - Goel; Sandeep Kumar ; et al. | 2015-12-10 |
System For And Method Of Semiconductor Fault Detection
App 20150347664 - GOEL; Sandeep Kumar ; et al. | 2015-12-03 |
Circuit and method for diagnosing scan chain failures
Grant 9,194,913 - Goel November 24, 2 | 2015-11-24 |
Interposer defect coverage metric and method to maximize the same
Grant 9,158,881 - Goel , et al. October 13, 2 | 2015-10-13 |
System And Method For Validating Stacked Dies By Comparing Connections
App 20150234979 - MEHTA; Ashok ; et al. | 2015-08-20 |
Circuit and method for monolithic stacked integrated circuit testing
Grant 9,110,136 - Goel , et al. August 18, 2 | 2015-08-18 |
Multi-Dimensional Integrated Circuit Structures and Methods of Forming the Same
App 20150216030 - Semmelmeyer; Mark ; et al. | 2015-07-30 |
System and Method of Adaptive Voltage Frequency Scaling
App 20150198997 - Ting; Kai-Yuan ; et al. | 2015-07-16 |
Multi-dimensional integrated circuit structures and methods of forming the same
Grant 9,054,101 - Semmelmeyer , et al. June 9, 2 | 2015-06-09 |
System and method for validating stacked dies by comparing connections
Grant 9,047,432 - Mehta , et al. June 2, 2 | 2015-06-02 |
Testing of an integrated circuit that contains secret information
Grant 9,041,411 - Marinissen , et al. May 26, 2 | 2015-05-26 |
SYSTEM AND METHOD FOR FUNCTIONAL VERIFICATION OF MULTI-DIE 3D ICs
App 20150123699 - JOHN; Stanley ; et al. | 2015-05-07 |
Circuit And Method For Monolithic Stacked Integrated Circuit Testing
App 20150095729 - Goel; Sandeep Kumar ; et al. | 2015-04-02 |
Circuit And Method For Monolithic Stacked Integrated Circuit Testing
App 20150077147 - Goel; Sandeep Kumar | 2015-03-19 |
Circuit and Method for Monolithic Stacked Integrated Circuit Testing
App 20150082108 - Goel; Sandeep Kumar | 2015-03-19 |
System and method for functional verification of multi-die 3D ICs
Grant 8,972,918 - John , et al. March 3, 2 | 2015-03-03 |
Interposer Defect Coverage Metric and Method to Maximize the Same
App 20150058819 - Goel; Sandeep Kumar ; et al. | 2015-02-26 |
System and method for testing stacked dies
Grant 8,966,419 - Goel , et al. February 24, 2 | 2015-02-24 |
DRAM test architecture for wide I/O DRAM based 2.5D/3D system chips
Grant 8,914,692 - Goel December 16, 2 | 2014-12-16 |
Probe Card Partition Scheme
App 20140354322 - GOEL; Sandeep Kumar ; et al. | 2014-12-04 |
DRAM repair architecture for wide I/O DRAM based 2.5D/3D system chips
Grant 8,873,320 - Goel , et al. October 28, 2 | 2014-10-28 |
Method And Apparatus For Interconnect Test
App 20140281773 - Goel; Sandeep Kumar ; et al. | 2014-09-18 |
Probe card partition scheme
Grant 8,836,363 - Goel , et al. September 16, 2 | 2014-09-16 |
Reducing design verification time while maximizing system functional coverage
Grant 8,826,202 - Goel , et al. September 2, 2 | 2014-09-02 |
System and method for testing stacked dies
Grant 8,751,994 - Goel June 10, 2 | 2014-06-10 |
Multi-Dimensional Integrated Circuit Structures and Methods of Forming the Same
App 20140147972 - Semmelmeyer; Mark ; et al. | 2014-05-29 |
Method to determine optimal micro-bump-probe pad pairing for efficient PGD testing in interposer designs
Grant 8,707,238 - Chuang , et al. April 22, 2 | 2014-04-22 |
Multi-dimensional integrated circuit structures and methods of forming the same
Grant 8,686,570 - Semmelmeyer , et al. April 1, 2 | 2014-04-01 |
Circuit And Method For Diagnosing Scan Chain Failures
App 20140068362 - GOEL; Sandeep Kumar | 2014-03-06 |
System And Method For Testing Stacked Dies
App 20140015584 - GOEL; Sandeep Kumar | 2014-01-16 |
System And Method For Testing Stacked Dies
App 20140015583 - GOEL; Sandeep Kumar ; et al. | 2014-01-16 |
System and device for reducing instantaneous voltage droop during a scan shift operation
Grant 8,627,160 - Devta-Prasanna , et al. January 7, 2 | 2014-01-07 |
Method to Determine Optimal Micro-Bump-Probe Pad Pairing for Efficient PGD Testing in Interposer Designs
App 20130326463 - Chuang; Yi-Lin ; et al. | 2013-12-05 |
Format conversion from value change dump (VCD) to universal verification methodology (UVM)
Grant 8,578,309 - Mehta , et al. November 5, 2 | 2013-11-05 |
Method for detecting small delay defects
Grant 8,566,766 - Goel , et al. October 22, 2 | 2013-10-22 |
Circuit and method for diagnosing scan chain failures
Grant 8,566,657 - Goel October 22, 2 | 2013-10-22 |
System and method for testing stacked dies
Grant 8,561,001 - Goel October 15, 2 | 2013-10-15 |
Test prepared integrated circuit with an internal power supply domain
Grant 8,552,734 - Meijer , et al. October 8, 2 | 2013-10-08 |
Dynamic Frequency Scaling
App 20130238309 - TING; Kai-Yuan ; et al. | 2013-09-12 |
Method and an apparatus for evaluating small delay defect coverage of a test pattern set on an IC
Grant 8,515,695 - Devta-Prasanna , et al. August 20, 2 | 2013-08-20 |
Format Conversion From Value Change Dump (vcd) To Universal Verification Methodology (uvm)
App 20130198706 - Mehta; Ashok ; et al. | 2013-08-01 |
SYSTEM AND METHOD FOR FUNCTIONAL VERIFICATION OF MULTI-DIE 3D ICs
App 20130193980 - JOHN; Stanley ; et al. | 2013-08-01 |
Multi-Dimensional Integrated Circuit Structures and Methods of Forming the Same
App 20130187292 - Semmelmeyer; Mark ; et al. | 2013-07-25 |
Stacked Die Interconnect Validation
App 20130167095 - MEHTA; Ashok ; et al. | 2013-06-27 |
Test Probing Structure
App 20130147505 - WANG; Mill-Jer ; et al. | 2013-06-13 |
Circuits and methods for testing through-silicon vias
Grant 8,436,639 - Goel May 7, 2 | 2013-05-07 |
Probe Card Partition Scheme
App 20130093452 - GOEL; Sandeep Kumar ; et al. | 2013-04-18 |
Stacked die interconnect validation
Grant 8,402,404 - Mehta , et al. March 19, 2 | 2013-03-19 |
Dram Repair Architecture For Wide I/o Dram Based 2.5d/3d System Chips
App 20130044554 - GOEL; Sandeep Kumar ; et al. | 2013-02-21 |
Dram Test Architecture For Wide I/o Dram Based 2.5d/3d System Chips
App 20130047046 - GOEL; Sandeep Kumar | 2013-02-21 |
Method for generating test patterns for small delay defects
Grant 8,352,818 - Goel , et al. January 8, 2 | 2013-01-08 |
Circuit And Method For Diagnosing Scan Chain Failures
App 20120278671 - GOEL; Sandeep Kumar | 2012-11-01 |
Interposers Of 3-dimensional Integrated Circuit Package Systems And Methods Of Designing The Same
App 20120273782 - GOEL; Sandeep Kumar ; et al. | 2012-11-01 |
Circuits And Methods For Testing Through-silicon Vias
App 20120242367 - Goel; Sandeep Kumar | 2012-09-27 |
Method for Detecting Small Delay Defects
App 20120112763 - Goel; Sandeep Kumar ; et al. | 2012-05-10 |
Test circuit and method for testing of infant mortality related defects
Grant 8,140,923 - Goel , et al. March 20, 2 | 2012-03-20 |
System And Device For Reducing Instantaneous Voltage Droop During A Scan Shift Operation
App 20110260767 - Devta-Prasanna; Narendra ; et al. | 2011-10-27 |
Method And An Apparatus For Evaluating Small Delay Defect Coverage Of A Test Pattern Set On An Ic
App 20100262394 - Devta-Prasanna; Narendra B. ; et al. | 2010-10-14 |
Test Circuit And Method For Testing Of Infant Mortality Related Defects
App 20100262876 - Goel; Sandeep Kumar ; et al. | 2010-10-14 |
Method For Generating Test Patterns For Small Delay Defects
App 20100153795 - Goel; Sandeep Kumar ; et al. | 2010-06-17 |
Testing of circuit with plural clock domains
Grant 7,076,709 - Vermeulen , et al. July 11, 2 | 2006-07-11 |
Testing of circuit with plural clock domains
App 20050076278 - Vermeulen, Hubertus Gerardus Hendrikus ; et al. | 2005-04-07 |
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