Goeden; Christopher A.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Goeden; Christopher A..The latest application filed is for "sample orientation system and method".

Company Profile

0.16.2

Goeden; Christopher A. - Lincoln NE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
System and method for investigating change in optical properties of a porous effective substrate surface as a function of a sequence of solvent partial pressures at atmospheric pressure Grant 9,546,943 - Vanderslice , et al. January 17, 2	2017-01-17
System and method of controlling intensity of an electromagnetic beam Grant 7,796,260 - Johs , et al. September 14, 2	2010-09-14
Flying mobile on-board ellipsometer, polarimeter, reflectometer and the like systems Grant 7,746,471 - Johs , et al. June 29, 2	2010-06-29
Automated ellipsometer and the like systems Grant 7,746,472 - Johs , et al. June 29, 2	2010-06-29
Sample orientation system and method Grant 7,619,752 - Liphardt , et al. November 17, 2	2009-11-17
Beam chromatic shifting and directing means Grant 7,535,566 - Johs , et al. May 19, 2	2009-05-19
System for and method of investigating the exact same point on a sample substrate with multiple wavelengths Grant 7,522,279 - Liphardt , et al. April 21, 2	2009-04-21
System for and method of investigating the exact same point on a sample substrate with multiple wavelengths Grant 7,508,510 - Pfeiffer , et al. March 24, 2	2009-03-24
Automated ellipsometer and the like systems Grant 7,505,134 - Johs , et al. March 17, 2	2009-03-17
Sample orientation system and method App 20080117413 - Liphardt; Martin M. ; et al.	2008-05-22
Control of uncertain angle of incidence of beam from Arc lamp Grant 7,301,631 - Johs , et al. November 27, 2	2007-11-27
Flying mobile on-board ellipsometer, polarimeter, reflectometer and the like systems Grant 7,277,171 - Johs , et al. October 2, 2	2007-10-02
Method of calibrating effects of multi-AOI-system for easy changing angles-of-incidence in ellipsometers and the like Grant 7,265,838 - Johs , et al. September 4, 2	2007-09-04
System for and method of investigating the exact same point on a sample substrate with multiple wavelengths App 20070097373 - Pfeiffer; Galen L. ; et al.	2007-05-03
System and method for setting and compensating errors in AOI and POI of a beam of EM radiation Grant 7,136,172 - Johs , et al. November 14, 2	2006-11-14
Ellipsometer or polarimeter and the like system with beam chromatic shifting and directing means Grant 7,099,006 - Johs , et al. August 29, 2	2006-08-29
System for and method of investigating the exact same point on a sample substrate with at least two wavelengths Grant 7,057,717 - Liphardt , et al. June 6, 2	2006-06-06
Multi-AOI-system for easy changing angles-of-incidence in ellipsometer, polarimeter and reflectometer systems Grant 6,859,278 - Johs , et al. February 22, 2	2005-02-22

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