Gleason; K. Reed
Patent Applications and Registrations
Patent applications and USPTO patent grants for Gleason; K. Reed.The latest application filed is for "resilient electrical interposers, systems that include the interposers, and methods for using and forming the same".
Company Profile
0.47.33
- Gleason; K. Reed - Portland OR
- Gleason; K. Reed - Washington DC
Patent Activity
| Patent | Date |
|---|---|
| Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same Grant 9,874,585 - Smith , et al. January 23, 2 | 2018-01-23 |
| High frequency interconnect structures, electronic assemblies that utilize high frequency interconnect structures, and methods of operating the same Grant 9,372,214 - Strid , et al. June 21, 2 | 2016-06-21 |
| Resilient Electrical Interposers, Systems That Include The Interposers, And Methods For Using And Forming The Same App 20150301082 - Smith; Kenneth R. ; et al. | 2015-10-22 |
| Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same Grant 9,099,449 - Smith , et al. August 4, 2 | 2015-08-04 |
| Resilient Electrical Interposers, Systems That Include The Interposers, And Methods For Using And Forming The Same App 20150114925 - Smith; Kenneth R. ; et al. | 2015-04-30 |
| Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same Grant 8,970,240 - Smith , et al. March 3, 2 | 2015-03-03 |
| Membrane probing method using improved contact Grant 8,451,017 - Gleason , et al. May 28, 2 | 2013-05-28 |
| Systems, Devices, And Methods For Two-sided Testing Of Electronic Devices App 20130015871 - Cleary; Tim ; et al. | 2013-01-17 |
| High Frequency Interconnect Structures, Electronic Assemblies That Utilize High Frequency Interconnect Structures, And Methods Of Operating The Same App 20120306587 - Strid; Eric W. ; et al. | 2012-12-06 |
| Resilient Electrical Interposers, Systems That Include The Interposers, And Methods For Using And Forming The Same App 20120112779 - Smith; Kenneth R. ; et al. | 2012-05-10 |
| Probe for testing a device under test Grant 7,898,273 - Gleason , et al. March 1, 2 | 2011-03-01 |
| Membrane probing structure with laterally scrubbing contacts Grant 7,893,704 - Gleason , et al. February 22, 2 | 2011-02-22 |
| Active Wafer Probe App 20100253377 - Strid; Eric ; et al. | 2010-10-07 |
| Active wafer probe Grant 7,759,953 - Strid , et al. July 20, 2 | 2010-07-20 |
| Fluid dispensing system Grant 7,618,590 - Gleason , et al. November 17, 2 | 2009-11-17 |
| Probe for testing a device under test App 20090267625 - Gleason; K. Reed ; et al. | 2009-10-29 |
| Membrane probing system with local contact scrub App 20090224783 - Gleason; K. Reed ; et al. | 2009-09-10 |
| Membrane probing system with local contact scrub Grant 7,550,983 - Gleason , et al. June 23, 2 | 2009-06-23 |
| Membrane probing system with local contact scrub Grant 7,541,821 - Gleason , et al. June 2, 2 | 2009-06-02 |
| Shielded probe for testing a device under test Grant 7,518,387 - Gleason , et al. April 14, 2 | 2009-04-14 |
| Shielded probe for testing a device under test Grant 7,501,842 - Gleason , et al. March 10, 2 | 2009-03-10 |
| Shielded probe for testing a device under test Grant 7,498,829 - Gleason , et al. March 3, 2 | 2009-03-03 |
| Shielded probe for testing a device under test Grant 7,489,149 - Gleason , et al. February 10, 2 | 2009-02-10 |
| Shielded probe for testing a device under test Grant 7,482,823 - Gleason , et al. January 27, 2 | 2009-01-27 |
| Active wafer probe App 20080309358 - Strid; Eric ; et al. | 2008-12-18 |
| Shielded probe with low contact resistance for testing a device under test Grant 7,436,194 - Gleason , et al. October 14, 2 | 2008-10-14 |
| Active wafer probe Grant 7,427,868 - Strid , et al. September 23, 2 | 2008-09-23 |
| Probe for testing a device under test Grant 7,394,269 - Gleason , et al. July 1, 2 | 2008-07-01 |
| Probe for testing a device under test App 20080054929 - Gleason; K. Reed ; et al. | 2008-03-06 |
| Probe for testing a device under test App 20080054923 - Gleason; K. Reed ; et al. | 2008-03-06 |
| Probe for testing a device under test App 20080048692 - Gleason; K. Reed ; et al. | 2008-02-28 |
| Probe for testing a device under test App 20080042672 - Gleason; K. Reed ; et al. | 2008-02-21 |
| Probe for testing a device under test App 20080042671 - Gleason; K. Reed ; et al. | 2008-02-21 |
| Probe for testing a device under test App 20080024149 - Gleason; K. Reed ; et al. | 2008-01-31 |
| System for evaluating probing networks Grant 7,321,233 - Strid , et al. January 22, 2 | 2008-01-22 |
| Membrane probing system with local contact scrub App 20070296431 - Gleason; K. Reed ; et al. | 2007-12-27 |
| Sample preparation technique App 20070278421 - Gleason; K. Reed | 2007-12-06 |
| Shielded probe for high-frequency testing of a device under test Grant 7,304,488 - Gleason , et al. December 4, 2 | 2007-12-04 |
| Probe for testing a device under test App 20070273399 - Gleason; K. Reed ; et al. | 2007-11-29 |
| Shielded probe for testing a device under test Grant 7,271,603 - Gleason , et al. September 18, 2 | 2007-09-18 |
| System for evaluating probing networks App 20070109001 - Strid; Eric W. ; et al. | 2007-05-17 |
| Probe for testing a device under test App 20070075716 - Gleason; K. Reed ; et al. | 2007-04-05 |
| System for evaluating probing networks Grant 7,164,279 - Strid , et al. January 16, 2 | 2007-01-16 |
| Probe for testing a device under test Grant 7,161,363 - Gleason , et al. January 9, 2 | 2007-01-09 |
| Fluid dispensing system App 20070003447 - Gleason; K. Reed ; et al. | 2007-01-04 |
| Membrane probing system with local contact scrub App 20060214676 - Gleason; K. Reed ; et al. | 2006-09-28 |
| Membrane probing system with local contact scrub Grant 7,109,731 - Gleason , et al. September 19, 2 | 2006-09-19 |
| Probe for testing a device under test App 20060170439 - Gleason; K. Reed ; et al. | 2006-08-03 |
| Shielded probe for testing a device under test Grant 7,057,404 - Gleason , et al. June 6, 2 | 2006-06-06 |
| System for evaluating probing networks App 20060103403 - Strid; Eric W. ; et al. | 2006-05-18 |
| System for evaluating probing networks Grant 6,987,398 - Strid , et al. January 17, 2 | 2006-01-17 |
| Membrane probing system with local contact scrub App 20050231223 - Gleason, K. Reed ; et al. | 2005-10-20 |
| Membrane probing system with local contact scrub Grant 6,927,585 - Gleason , et al. August 9, 2 | 2005-08-09 |
| Active wafer probe App 20050140386 - Strid, Eric ; et al. | 2005-06-30 |
| Probe for testing a device under test App 20050099191 - Gleason, K. Reed ; et al. | 2005-05-12 |
| System for evaluating probing networks App 20050040837 - Strid, Eric W. ; et al. | 2005-02-24 |
| Probe for testing a device under test App 20040232927 - Gleason, K. Reed ; et al. | 2004-11-25 |
| Probe for testing a device under test Grant 6,815,963 - Gleason , et al. November 9, 2 | 2004-11-09 |
| Interconnect assembly for use in evaluating probing networks Grant 6,803,779 - Strid , et al. October 12, 2 | 2004-10-12 |
| Probe for testing a device under test App 20040004491 - Gleason, K. Reed ; et al. | 2004-01-08 |
| System for evaluating probing networks App 20030210033 - Strid, Eric W. ; et al. | 2003-11-13 |
| Reference transmission line junction for probing device Grant 6,608,496 - Strid , et al. August 19, 2 | 2003-08-19 |
| Membrane probing system with local contact scrub App 20020135388 - Gleason, K. Reed ; et al. | 2002-09-26 |
| Membrane probing system with local contact scrub Grant 6,437,584 - Gleason , et al. August 20, 2 | 2002-08-20 |
| Membrane probing system with local contact scrub Grant 6,307,387 - Gleason , et al. October 23, 2 | 2001-10-23 |
| System for evaluating probing networks Grant 6,130,544 - Strid , et al. October 10, 2 | 2000-10-10 |
| System for evaluating probing networks Grant 5,973,505 - Strid , et al. October 26, 1 | 1999-10-26 |
| Membrane probing system with local contact scrub Grant 5,914,613 - Gleason , et al. June 22, 1 | 1999-06-22 |
| System for evaluating probing networks that have multiple probing ends Grant 5,869,975 - Strid , et al. February 9, 1 | 1999-02-09 |
| Method of evaluating signal conditions in a probe measurement network having a plurality of separate measurement channels Grant 5,659,255 - Strid , et al. August 19, 1 | 1997-08-19 |
| System for evaluating probing networks Grant 5,561,377 - Strid , et al. October 1, 1 | 1996-10-01 |
| Adjustable strap implemented return line for a probe station Grant 5,264,788 - Smith , et al. November 23, 1 | 1993-11-23 |
| High-frequency active probe having replaceable contact needles Grant 5,045,781 - Gleason , et al. September 3, 1 | 1991-09-03 |
| Electrical probe with contact force protection Grant 5,012,186 - Gleason April 30, 1 | 1991-04-30 |
| Microwave wafer probe having replaceable probe tip Grant 4,849,689 - Gleason , et al. July 18, 1 | 1989-07-18 |
| Method of forming high reliability mesa diode Grant 3,878,008 - Gleason , et al. April 15, 1 | 1975-04-15 |
Company Registrations
| SEC | 0001311555 | Gleason K Reed |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 