Gill; Jason P.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Gill; Jason P..The latest application filed is for "method and structure for determining thermal cycle reliability".

Company Profile

0.15.16

Gill; Jason P. - Essex VT
Gill; Jason P. - Essex Junction VT US
Gill; Jason P. - Hopewell Junction NY

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and structure for determining thermal cycle reliability Grant 9,443,776 - Filippi , et al. September 13, 2	2016-09-13
Method And Structure For Determining Thermal Cycle Reliability App 20150262899 - FILIPPI; RONALD G. ; et al.	2015-09-17
Micro-electro-mechanical-system temperature sensor Grant 8,480,302 - Gill , et al. July 9, 2	2013-07-09
Micro-electro-mechanical-system Temperature Sensor App 20120076172 - Gill; Jason P. ; et al.	2012-03-29
Low leakage metal-containing cap process using oxidation Grant 7,867,897 - Gambino , et al. January 11, 2	2011-01-11
Via bottom contact and method of manufacturing same Grant 7,830,019 - Chanda , et al. November 9, 2	2010-11-09
Structure for modeling stress-induced degradation of conductive interconnects Grant 7,692,439 - Chanda , et al. April 6, 2	2010-04-06
Low Leakage Metal-containing Cap Process Using Oxidation App 20100021656 - Gambino; Jeffrey P. ; et al.	2010-01-28
Structure for monitoring stress-induced degradation of conductive interconnects Grant 7,639,032 - Chanda , et al. December 29, 2	2009-12-29
Low leakage metal-containing cap process using oxidation Grant 7,598,614 - Gambino , et al. October 6, 2	2009-10-06
VIA bottom contact and method of manufacturing same Grant 7,585,764 - Chanda , et al. September 8, 2	2009-09-08
Via Bottom Contact And Method Of Manufacturing Same App 20090200673 - Chanda; Kaushik ; et al.	2009-08-13
Enhancement of performance of a conductive wire in a multilayered substrate Grant 7,511,378 - Gill , et al. March 31, 2	2009-03-31
Non-destructive evaluation of microstructure and interface roughness of electrically conducting lines in semiconductor integrated circuits in deep sub-micron regime Grant 7,500,208 - Chen , et al. March 3, 2	2009-03-03
Structure for modeling stress-induced degradation of conductive interconnects App 20080231312 - Chanda; Kaushik ; et al.	2008-09-25
Programmable Resistor, Switch Or Vertical Memory Cell App 20080173975 - Chen; Fen ; et al.	2008-07-24
Structure and method for monitoring stress-induced degradation of conductive interconnects Grant 7,397,260 - Chanda , et al. July 8, 2	2008-07-08
Method for monitoring stress-induced degradation of conductive interconnects App 20080107149 - Chanda; Kaushik ; et al.	2008-05-08
Low Leakage Metal-containing Cap Process Using Oxidation App 20070235875 - Gambino; Jeffrey P. ; et al.	2007-10-11
Contact Via Scheme With Staggered Vias App 20070176295 - Chinthakindi; Anil K. ; et al.	2007-08-02
Determination of grain sizes of electrically conductive lines in semiconductor integrated circuits Grant 7,231,617 - Chen , et al. June 12, 2	2007-06-12
Non-destructive Evaluation Of Microstructure And Interface Roughness Of Electrically Conducting Lines In Semiconductor Integrated Circuits In Deep Sub-micron Regime App 20070130551 - Chen; Fen ; et al.	2007-06-07
Structure And Method For Monitoring Stress-induced Degradation Of Conductive Interconnects App 20070115018 - Chanda; Kaushik ; et al.	2007-05-24
Via Bottom Contact And Method Of Manufacturing Same App 20070037403 - Chanda; Kaushik ; et al.	2007-02-15
Structure and method for local resistor element in integrated circuit technology Grant 7,166,904 - Gill , et al. January 23, 2	2007-01-23
Enhancement of performance of a conductive wire in a multilayered substrate App 20060226142 - Gill; Jason P. ; et al.	2006-10-12
Enhancement of performance of a conductive wire in a multilayered substrate Grant 7,096,450 - Gill , et al. August 22, 2	2006-08-22
Non-destructive Evaluation Of Microstructure And Interface Roughness Of Electrically Conducting Lines In Semiconductor Integrated Circuits In Deep Sub-micron Regime App 20060071676 - Chen; Fen ; et al.	2006-04-06
Structure And Method For Local Resistor Element In Integrated Circuit Technology App 20050167786 - Gill, Jason P. ; et al.	2005-08-04
Enhancement Of Performance Of A Conductive Wire In A Multilayered Substrate App 20040262031 - Gill, Jason P. ; et al.	2004-12-30

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