Geshel; Mark

Patent Applications and Registrations

Patent applications and USPTO patent grants for Geshel; Mark.The latest application filed is for "methods and systems for sequence calling".

Company Profile

3.9.11

Geshel; Mark - Kfar Saba IL
Geshel; Mark - Kfar-Sava IL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Methods And Systems For Sequence Calling App 20210366576 - Bartov; Avishai ; et al.	2021-11-25
Method of examining locations in a wafer with adjustable navigation accuracy and system thereof Grant 10,663,407 - Kaizerman , et al.	2020-05-26
Method Of Examining Locations In A Wafer With Adjustable Navigation Accuracy And System Thereof App 20190234887 - KAIZERMAN; Idan ; et al.	2019-08-01
Method of generating an examination recipe and system thereof Grant 10,290,087 - Shkalim , et al.	2019-05-14
Method Of Generating An Examination Recipe And System Thereof App 20190080447 - SHKALIM; Ariel ; et al.	2019-03-14
Method of examining locations in a wafer with adjustable navigation accuracy and system thereof Grant 10,161,882 - Kaizerman , et al. Dec	2018-12-25
Method of design-based defect classification and system thereof Grant 9,401,013 - Geshel , et al. July 26, 2	2016-07-26
Method Of Design-based Defect Classification And System Thereof App 20150356719 - GESHEL; MARK ; et al.	2015-12-10
Method of generating a recipe for a manufacturing tool and system thereof Grant 9,141,730 - Geshel , et al. September 22, 2	2015-09-22
Method Of Design-based Defect Classification And System Thereof App 20140212022 - GESHEL; MARK ; et al.	2014-07-31
Method of generating a recipe for a manufacturing tool and system thereof Grant 8,640,060 - Geshel January 28, 2	2014-01-28
Method Of Generating A Recipe For A Manufacturing Tool And System Thereof App 20130326443 - Geshel; Mark	2013-12-05
Method Of Generating A Recipe For A Manufacturing Tool And System Thereof App 20130066454 - Geshel; Mark ; et al.	2013-03-14
Method for pattern inspection Grant 7,155,052 - Geshel , et al. December 26, 2	2006-12-26
Method for pattern inspection App 20030228050 - Geshel, Mark ; et al.	2003-12-11

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.