Gerlach; Robert L.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Gerlach; Robert L..The latest application filed is for "particle detector suitable for detecting ions and electrons".
- Gerlach; Robert L. - Portland OR
- Gerlach; Robert L. - Washington County OR
- Gerlach; Robert L. - Minnetonka MN
- Gerlach; Robert L. - Los Altos CA
| Patent | Date |
|---|---|
| Particle detector suitable for detecting ions and electrons Grant 7,009,187 - Gerlach , et al. March 7, 2 | 2006-03-07 |
| Angular aperture shaped beam system and method Grant 6,977,386 - Gerlach , et al. December 20, 2 | 2005-12-20 |
| Shaped and low density focused ion beams Grant 6,949,756 - Gerlach , et al. September 27, 2 | 2005-09-27 |
| Collection of secondary electrons through the objective lens of a scanning electron microscope Grant 6,946,654 - Gerlach , et al. September 20, 2 | 2005-09-20 |
| Focused ion beam system with coaxial scanning electron microscope Grant 6,900,447 - Gerlach , et al. May 31, 2 | 2005-05-31 |
| Particle detector suitable for detecting ions and electrons App 20040262531 - Gerlach, Robert L. ; et al. | 2004-12-30 |
| Electron beam system using multiple electron beams Grant 6,797,953 - Gerlach , et al. September 28, 2 | 2004-09-28 |
| Multi-column FIB for nanofabrication applications Grant 6,797,969 - Gerlach , et al. September 28, 2 | 2004-09-28 |
| Angular aperture shaped beam system and method App 20040140438 - Gerlach, Robert L. ; et al. | 2004-07-22 |
| Focused ion beam system with coaxial scanning electron microscope App 20040108458 - Gerlach, Robert L. ; et al. | 2004-06-10 |
| Focused ion beam system Grant 6,710,338 - Gerlach , et al. March 23, 2 | 2004-03-23 |
| Through-the-lens neutralization for charged particle beam system Grant 6,683,320 - Gerlach , et al. January 27, 2 | 2004-01-27 |
| Through-the-lens neutralization for charged particle beam system App 20020134949 - Gerlach, Robert L. ; et al. | 2002-09-26 |
| Electron beam system using multiple electron beams App 20020117967 - Gerlach, Robert L. ; et al. | 2002-08-29 |
| Focused ion beam system App 20020084426 - Gerlach, Robert L. ; et al. | 2002-07-04 |
| Method and apparatus for enhancing yield of secondary ions Grant 6,414,307 - Gerlach , et al. July 2, 2 | 2002-07-02 |
| Collection of secondary electrons through the objective lens of a scanning electron microscope App 20020024013 - Gerlach, Robert L. ; et al. | 2002-02-28 |
| Shaped and low density focused ion beams App 20010045525 - Gerlach, Robert L. ; et al. | 2001-11-29 |
| Through-the-lens-collection of secondary particles for a focused ion beam system App 20010032938 - Gerlach, Robert L. ; et al. | 2001-10-25 |
| Multi-column FIB for nanofabrication applications App 20010032939 - Gerlach, Robert L. ; et al. | 2001-10-25 |
| Precision electrostatic lens system and method of manufacture Grant 5,241,182 - Martin , et al. August 31, 1 | 1993-08-31 |
| Direct imaging monochromatic electron microscope Grant 4,810,880 - Gerlach March 7, 1 | 1989-03-07 |
| Vacuum-compatible air-cooled plasma device Grant 4,659,899 - Welkie , et al. April 21, 1 | 1987-04-21 |
| Sample transport system Grant 4,412,771 - Gerlach , et al. November 1, 1 | 1983-11-01 |
| Magnetic lens Grant 4,345,152 - Gerlach August 17, 1 | 1982-08-17 |
| Secondary emission mass spectrometer mechanism to be used with other instrumentation Grant 4,296,323 - Gerlach October 20, 1 | 1981-10-20 |
| Scanning auger microprobe with variable axial aperture Grant 4,048,498 - Gerlach , et al. September 13, 1 | 1977-09-13 |
| Interchangeable specimen trays and apparatus for a vacuum type testing system Grant 4,033,904 - Gerlach , et al. July 5, 1 | 1977-07-05 |
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