Genio; Edgar

Patent Applications and Registrations

Patent applications and USPTO patent grants for Genio; Edgar.The latest application filed is for "normal-incidence broadband spectroscopic polarimeter containing reference beam and optical measurement system".

Company Profile

0.12.12

Genio; Edgar - Beijing N/A CN
Genio; Edgar - Santa Clara CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Normal incidence broadband spectroscopic polarimeter and optical measurement system Grant 9,176,048 - Li , et al. November 3, 2	2015-11-03
Normal-incidence broadband spectroscopic polarimeter containing reference beam and optical measurement system Grant 9,170,156 - Li , et al. October 27, 2	2015-10-27
Normal-incidence Broadband Spectroscopic Polarimeter Containing Reference Beam And Optical Measurement System App 20140354991 - Li; Guoguang ; et al.	2014-12-04
Broadband polarization spectrometer with inclined incidence and optical measurement system Grant 8,767,209 - Li , et al. July 1, 2	2014-07-01
Broadband Polarization Spectrometer With Inclined Incidence And Optical Measurement Sytem App 20130070234 - Li; Guoguang ; et al.	2013-03-21
Normal Incidence Broadband Spectroscopic Polarimeter and Optical Measurement System App 20130050702 - Li; Guoguang ; et al.	2013-02-28
Metrology of thin film devices using an addressable micromirror array Grant 8,130,373 - Genio , et al. March 6, 2	2012-03-06
Metrology Of Thin Film Devices Using An Addressable Micromirror Array App 20110254953 - Genio; Edgar ; et al.	2011-10-20
Spectrometric metrology of workpieces using a permanent window as a spectral reference Grant 8,027,031 - Genio , et al. September 27, 2	2011-09-27
Metrology of thin film devices using an addressable micromirror array Grant 8,018,586 - Genio , et al. September 13, 2	2011-09-13
Spectrographic metrology of patterned wafers Grant 7,969,568 - Holden , et al. June 28, 2	2011-06-28
Spectrometric Metrology Of Workpieces Using A Permanent Window As A Spectral Reference App 20110130995 - Genio; Edgar ; et al.	2011-06-02
Spectrometric metrology of workpieces using a permanent window as a spectral reference Grant 7,911,603 - Genio , et al. March 22, 2	2011-03-22
Metrology Of Thin Film Devices Using An Addressable Micromirror Array App 20100106456 - GENIO; EDGAR ; et al.	2010-04-29
Spectrometric Metrology Of Workpieces Using A Permanent Window As A Spectral Reference App 20100106444 - GENIO; EDGAR ; et al.	2010-04-29
Spectrographic Metrology Of Patterned Wafers App 20100103411 - HOLDEN; JAMES Matthew ; et al.	2010-04-29
Evaluation of openings in a dielectric layer Grant 7,379,185 - Borden , et al. May 27, 2	2008-05-27
Evaluation of openings in a dielectric layer App 20060094136 - Borden; Peter G. ; et al.	2006-05-04

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